Patents by Inventor Hisafumi Otsuka

Hisafumi Otsuka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Transmission electron microscope and image observation method using it
    Patent number: 7235784
    Abstract: Drift generated at the time of photographing a TEM image is corrected simultaneously with photographing, so that a TEM image free form influence of drift is photographed. While the TEM image is recorded, drift in the place out of the view field subjected to recording is measured from moment to moment by another TV camera or a position sensitive detector. Drift is corrected by the movement of the specimen due to a specimen holder or by the movement of the image due to an image shift coil.
    Type: Grant
    Filed: October 7, 2005
    Date of Patent: June 26, 2007
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yoshifumi Taniguchi, Hisafumi Otsuka
  • Transmission electron microscope and image observation method using it
    Publication number: 20060076492
    Abstract: Drift generated at the time of photographing a TEM image is corrected simultaneously with photographing, so that a TEM image free form influence of drift is photographed. While the TEM image is recorded, drift in the place out of the view field subjected to recording is measured from moment to moment by another TV camera or a position sensitive detector. Drift is corrected by the movement of the specimen due to a specimen holder or by the movement of the image due to an image shift coil.
    Type: Application
    Filed: October 7, 2005
    Publication date: April 13, 2006
    Inventors: Yoshifumi Taniguchi, Hisafumi Otsuka