Abstract: An object of the present invention is to provide an electron microscope that employs a hologram of a diffraction pattern to reconstruct a microscopic image involving no imaging aberration due to image forming lenses, as well as a combined illumination lens used for such an electron microscope.

Abstract: [Object] To provide a Fresnel zone plate having a complex irradiation function capable of improving resolution even when the outermost opaque band width cannot be reduced and an X-ray microscope using the Fresnel zone plate. [Solution] A Fresnel zone plate 1 having a complex irradiation function according to the present invention has opaque bands 3 and transparent bands 4 arranged alternately in the radial direction from the center on a flat transparent substrate 2, and a transmission window 7 formed such that a portion of a plane wave vertically applied onto the upper surface vertically enters directly a sample 6 disposed below the Fresnel zone plate 1.

Abstract: An object of the present invention is to provide an electron microscope that employs a hologram of a diffraction pattern to reconstruct a microscopic image involving no imaging aberration due to image forming lenses, as well as a combined illumination lens used for such an electron microscope.

Abstract: [Object] To provide a Fresnel's zone plate having a complex illumination function capable of improving resolution even when the outermost opaque band width cannot be reduced and an X-ray microscope using the Fresnel's zone plate. [Solution] A Fresnel's zone plate 1 having a complex illumination function according to the invention has opaque bands 3 and transparent bands 4 arranged alternately in the radial direction from the center concentrically on a flat transparent substrate 2, and a transmission window 7 formed such that a portion of a plane wave vertically applied onto the upper surface vertically enters directly a sample 6 disposed below the Fresnel's zone plate 1 without dispersion.