Patents by Inventor Hisanobu Shimodouzono

Hisanobu Shimodouzono has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6890783
    Abstract: An active matrix substrate plate having superior properties is manufactured at high yield using four photolithographic fabrication steps. In step 1, the scanning line and the gate electrode extending from the scanning line are formed in the glass plate. In step 2, the gate insulation layer and the semiconductor layer comprised by amorphous silicon layer and n+ amorphous silicon layer is laminated to provide the semiconductor layer for the TFT section. In step 3, the transparent conductive layer and the metallic layer are laminated, and the signal line, the drain electrode extending from the signal line, the pixel electrode and the source electrode extending from the pixel electrode are formed, and the n+ amorphous silicon layer of the channel gap is removed by etching. In step 4, the protective insulation layer is formed, and the protective insulation layer and the metal layer above the pixel electrode are removed by etching.
    Type: Grant
    Filed: September 12, 2002
    Date of Patent: May 10, 2005
    Assignee: NEC LCD Technologies, LTD.
    Inventors: Shigeru Kimura, Takahiko Watanabe, Tae Yoshikawa, Hiroyuki Uchida, Shusaku Kido, Shinichi Nakata, Tsutomu Hamada, Hisanobu Shimodouzono, Satoshi Doi, Toshihiko Harano, Akitoshi Maeda, Satoshi Ihida, Hiroaki Tanaka, Takasuke Hayase, Shouichi Kuroha, Hirofumi Ihara, Kazushige Takechi
  • Patent number: 6632696
    Abstract: An active matrix substrate plate having superior properties is manufactured at high yield using four photolithographic fabrication steps. In step 1, the scanning line and the gate electrode extending from the scanning line are formed in the glass plate. In step 2, the gate insulation layer and the semiconductor layer comprised by amorphous silicon layer and n+ amorphous silicon layer is laminated to provide the semiconductor layer for the TFT section. In step 3, the transparent conductive layer and the metallic layer are laminated, and the signal line, the drain electrode extending from the signal line, the pixel electrode and the source electrode extending from the pixel electrode are formed, and the n+ amorphous silicon layer of the channel gap is removed by etching. In step 4, the protective insulation layer is formed, and the protective insulation layer and the metal layer above the pixel electrode are removed by etching.
    Type: Grant
    Filed: December 20, 2000
    Date of Patent: October 14, 2003
    Assignee: NEC Corporation
    Inventors: Shigeru Kimura, Takahiko Watanabe, Tae Yoshikawa, Hiroyuki Uchida, Shusaku Kido, Shinichi Nakata, Tsutomu Hamada, Hisanobu Shimodouzono, Satoshi Doi, Toshihiko Harano, Akitoshi Maeda, Satoshi Ihida, Hiroaki Tanaka, Takasuke Hayase, Shouichi Kuroha, Hirofumi Ihara, Kazushige Takechi
  • Publication number: 20030013221
    Abstract: An active matrix substrate plate having superior properties is manufactured at high yield using four photolithographic fabrication steps. In step 1, the scanning line and the gate electrode extending from the scanning line are formed in the glass plate. In step 2, the gate insulation layer and the semiconductor layer comprised by amorphous silicon layer and n+ amorphous silicon layer is laminated to provide the semiconductor layer for the TFT section. In step 3, the transparent conductive layer and the metallic layer are laminated, and the signal line, the drain electrode extending from the signal line, the pixel electrode and the source electrode extending from the pixel electrode are formed, and the n+ amorphous silicon layer of the channel gap is removed by etching. In step 4, the protective insulation layer is formed, and the protective insulation layer and the metal layer above the pixel electrode are removed by etching.
    Type: Application
    Filed: September 12, 2002
    Publication date: January 16, 2003
    Inventors: Shigeru Kimura, Takahiko Watanabe, Tae Yoshikawa, Hiroyuki Uchida, Shusaku Kido, Shinichi Nakata, Tsutomu Hamada, Hisanobu Shimodouzono, Satoshi Doi, Toshihiko Harano, Akitoshi Maeda, Satoshi Ihida, Hiroaki Tanaka, Takasuke Hayase, Shouichi Kuroha, Hirofumi Ihara, Kazushige Takechi
  • Publication number: 20010010370
    Abstract: An active matrix substrate plate having superior properties is manufactured at high yield using four photolithographic fabrication steps. In step 1, the scanning line and the gate electrode extending from the scanning line are formed in the glass plate. In step 2, the gate insulation layer and the semiconductor layer comprised by amorphous silicon layer and n+ amorphous silicon layer is laminated to provide the semiconductor layer for the TFT section. In step 3, the transparent conductive layer and the metallic layer are laminated, and the signal line, the drain electrode extending from the signal line, the pixel electrode and the source electrode extending from the pixel electrode are formed, and the n+ amorphous silicon layer of the channel gap is removed by etching. In step 4, the protective insulation layer is formed, and the protective insulation layer and the metal layer above the pixel electrode are removed by etching.
    Type: Application
    Filed: December 20, 2000
    Publication date: August 2, 2001
    Applicant: NEC Corporation
    Inventors: Shigeru Kimura, Takahiko Watanabe, Tae Yoshikawa, Hiroyuki Uchida, Shusaku Kido, Shinichi Nakata, Tsutomu Hamada, Hisanobu Shimodouzono, Satoshi Doi, Toshihiko Harano, Akitoshi Maeda, Satoshi Ihida, Hiroaki Tanaka, Takasuke Hayase, Shouichi Kuroha, Hirofumi Ihara, Kazushige Takechi