Patents by Inventor Hisashi Ohtsuka

Hisashi Ohtsuka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20090283700
    Abstract: A fluorescence detecting method utilizes surface plasmon enhancement. An electric field enhancing field is caused to be generated at a detecting portion that includes a metal film provided on a surface of a dielectric prism. Fluorescence emitted by fluorescent labels, which are attached to a detection target substance, due to the excitation effect of the electric field enhancing field is detected by a photodetector. During the detection, a plurality of fine metal particles are dispersed on the detecting portion.
    Type: Application
    Filed: May 13, 2009
    Publication date: November 19, 2009
    Applicant: FUJIFILM Corporation
    Inventor: Hisashi OHTSUKA
  • Publication number: 20090258439
    Abstract: An immunochromatoassay method that allows high detection sensitivity measurement. The method including the steps of: permeating an analyte solution that includes a visibly labeled second binding substance that specifically binds to a detection target substance into a test area of a chromatography medium provided with a first binding substance that specifically binds to the detection target substance, simultaneously with or after the permeation of the analyte solution into the test area, permeating a visual recognition aid solution into the chromatograph medium, the solution having a refractive index whose refractive index difference ?n from that of the chromatograph medium is ?0.1=?n=0.1, and visually observing the test area while the visual recognition aid solution is permeated in the test area.
    Type: Application
    Filed: April 13, 2009
    Publication date: October 15, 2009
    Applicant: FUJIFILM CORPORATION
    Inventor: Hisashi OHTSUKA
  • Patent number: 7579588
    Abstract: A base plate for mass spectrometry analysis is disclosed, which is used in a method in which a substance immobilized on a surface of the base plate is desorbed from the surface by application of laser light thereto and the ion of the desorbed substance is captured for mass spectrometry analysis. The base plate includes, on at least a portion of the surface thereof, a roughened metal surface capable of exciting local plasmon when exposed to laser light. The roughened metal surface is formed, for example, by forming numerous micropores in a surface of an alumina layer and filling gold particles in the micropores. Each gold particle has a head portion having a size larger than a diameter of the micropore and projecting from the surface of the alumina layer. Use of this base plate allows use of lower-power laser light.
    Type: Grant
    Filed: December 21, 2006
    Date of Patent: August 25, 2009
    Assignee: FUJIFILM Corporation
    Inventors: Masayuki Naya, Hisashi Ohtsuka
  • Publication number: 20090195784
    Abstract: A sensor unit of a surface plasmon resonance (SPR) assay system includes a transparent dielectric medium. A thin film has a first surface and a sensing surface. The first surface is connected with the dielectric medium to constitute an interface. The sensing surface is back to the first surface, for detecting (bio) chemical reaction. A flow cell block has a flow channel for flowing of the sample to the sensing surface. Attenuated total reflection of illuminating light is checked at the interface, to analyze interaction between ligand and analyte as samples. The flow channel includes a first inner surface, disposed opposite to the sensing surface to extend along, for passing the sample to flow between. The first inner surface has a height, defined with reference to the sensing surface, and in a range of 200-500 microns.
    Type: Application
    Filed: February 27, 2009
    Publication date: August 6, 2009
    Applicant: FUJIFILM Corporation
    Inventors: Nobuhiko Ogura, Hitoshi Shimizu, Koji Kuruma, Hisashi Ohtsuka, Tatsuo Fujikura, Shu Sato
  • Publication number: 20090101836
    Abstract: An excitation light beam is emitted from a light source. The excitation light beam propagates through a substrate and enters an interface between the substrate and a thin metal film having fine apertures with diameters less than or equal to the wavelength of the excitation light beam, provided on the surface of the substrate opposite that on which the excitation light beam is incident. Near field light is generated at the fine apertures. Fluorescent labels, included in a sample which is supplied to contact the thin metal film, are excited by the near field light and/or surface plasmon on the thin metal film induced by the near field light. The fluorescence emitted from the fluorescent labels is detected by a photodetector.
    Type: Application
    Filed: October 16, 2008
    Publication date: April 23, 2009
    Applicant: FUJIFILM CORPORATION
    Inventors: Hisashi OHTSUKA, Kiyoshi Fujimoto
  • Publication number: 20090101815
    Abstract: A cantilever for near field optical microscopes is equipped with a probe in the vicinity of a free end thereof. The probe includes a thin film portion constituted by at least one layer of thin film that serves as the surface of the probe, and an inner bulk portion which is covered by the thin film portion. The outermost layer of the thin film portion is a thin dielectric film, and a metal portion is provided toward the interior of the probe from the thin dielectric film.
    Type: Application
    Filed: October 16, 2008
    Publication date: April 23, 2009
    Applicant: FUJIFILM Corporation
    Inventor: Hisashi OHTSUKA
  • Patent number: 7515270
    Abstract: A sensor unit of a surface plasmon resonance (SPR) assay system includes a transparent dielectric medium. A thin film has a first surface and a sensing surface. The first surface is connected with the dielectric medium to constitute an interface. The sensing surface is back to the first surface, for detecting (bio)chemical reaction. A flow cell block has a flow channel for flowing of the sample to the sensing surface. Attenuated total reflection of illuminating light is checked at the interface, to analyze interaction between ligand and analyte as samples. The flow channel includes a first inner surface, disposed opposite to the sensing surface to extend along, for passing the sample to flow between. The first inner surface has a height, defined with reference to the sensing surface, and in a range of 200-500 microns.
    Type: Grant
    Filed: March 6, 2006
    Date of Patent: April 7, 2009
    Assignee: FUJIFILM Corporation
    Inventors: Nobuhiko Ogura, Hitoshi Shimizu, Koji Kuruma, Hisashi Ohtsuka, Tatsuo Fujikura, Shu Sato
  • Patent number: 7439078
    Abstract: An object of the present invention is to provide a method for measuring the dissociation rate coefficient (Kd) by surface plasmon resonance analysis without measuring the theoretical maximum amount of binding (Rmax). The present invention provides a method for measuring the dissociation rate coefficient (Kd) of the reaction between an analyte molecule immobilized on a metal surface and a molecule that interacts with the analyte molecule by assaying changes in surface plasmon resonance signals using a surface plasmon resonance measurement device, wherein the signal and the slope of the dissociation curve of the surface plasmon resonance signal curves, or the signal ratio are used to calculate the dissociation rate coefficient (Kd).
    Type: Grant
    Filed: August 16, 2005
    Date of Patent: October 21, 2008
    Assignee: FUJIFILM Corporation
    Inventors: Hisashi Ohtsuka, Nobuhiko Ogura
  • Publication number: 20080219893
    Abstract: A first substance capable of undergoing binding with a substance to be detected in a sample is fixed to a detecting section. A plurality of pieces of a second substance capable of undergoing the binding with the substance to be detected are mixed in the sample. Each of fine metal particles has been bound with one of the pieces of the second substance. A fluorescent substance has been combined with each pair of the fine metal particle and the piece of the second substance into an integral body. Exciting light capable of exciting the fluorescent substance is irradiated to the detecting section, and fluorescence produced by the fluorescent substance is detected.
    Type: Application
    Filed: March 5, 2008
    Publication date: September 11, 2008
    Applicant: FUJIFILM CORPORATION
    Inventor: Hisashi Ohtsuka
  • Publication number: 20080204753
    Abstract: A fluorescence sensor comprises a sensor section for collecting a fluorescent substance, which acts to represent presence of a substance to be detected in a sample, and an exciting light source, which produces exciting light for exciting the fluorescent substance to produce fluorescence. Besides the exciting light source, at least one different non-exciting light source is located for irradiating different non-exciting light, which varies in wavelength from the exciting light and which is substantially free from capability of exciting the fluorescent substance, to the sensor section.
    Type: Application
    Filed: February 28, 2008
    Publication date: August 28, 2008
    Applicant: FUJIFILM Corporation
    Inventor: Hisashi OHTSUKA
  • Patent number: 7418023
    Abstract: A solid-state laser crystal constituting a laser-diode-excited solid-state laser apparatus or an optical fiber constituting a fiber laser apparatus or fiber laser amplifier is doped with one of Ho3+, Sm3+, Eu3+, Dy3+, Er3+, and Tb3+ so that a laser beam is emitted from the solid-state laser crystal or the optical fiber, or incident light of the fiber laser amplifier is amplified, by one of the transitions from 5S2 to 5I7, from 5S2 to 5I8, from 4G5/2 to 6H5/2, from 4G5/2 to 6H7/2, from 4F3/2 to 6H11/2, from 5D0 to 7F2, from 4F9/2 to 6H13/2, from 4F9/2 to 6H11/2, from 4S3/2 to 4I15/2, from 2H9/2 to 4I13/2, and from 5D4 to 7F5. The above solid-state laser crystal or optical fiber is excited with a GaN-based compound laser diode.
    Type: Grant
    Filed: September 30, 2004
    Date of Patent: August 26, 2008
    Assignee: FUJIFILM Corporation
    Inventors: Hisashi Ohtsuka, Yoji Okazaki, Takayuki Katoh
  • Patent number: 7413911
    Abstract: An object of the present invention is to provide a method for measuring a rate coefficient by surface plasmon resonance analysis with excellent accuracy, reliability, and cost performance that can improve the assay accuracy and simplify the apparatus.
    Type: Grant
    Filed: August 16, 2005
    Date of Patent: August 19, 2008
    Assignee: FUJIFILM Corporation
    Inventor: Hisashi Ohtsuka
  • Patent number: 7411990
    Abstract: A solid-state laser crystal constituting a laser-diode-excited solid-state laser apparatus or an optical fiber constituting a fiber laser apparatus or fiber laser amplifier is doped with one of Ho3+, Sm3+, Eu3+, Dy3+, Er3+, and Tb3+ so that a laser beam is emitted from the solid-state laser crystal or the optical fiber, or incident light of the fiber laser amplifier is amplified, by one of the transitions from 5S2 to 5I7, from 5S2 to 5I8, from 4G5/2 to 6H5/2, from 4G5/2 to 6H7/2, from 4F3/2 to 6H11/2, from 5D0 to 7F2, from 4F9/2 to 6H13/2, from 4F9/2 to 6H11/2, from 4S3/2 to 4I15/2, from 2H9/2 to 4I13/2, and from 5D4 to 7F5. The above solid-state laser crystal or optical fiber is excited with a GaN-based compound laser diode.
    Type: Grant
    Filed: September 30, 2004
    Date of Patent: August 12, 2008
    Assignee: FUJIFILM Corporation
    Inventors: Hisashi Ohtsuka, Yoji Okazaki, Takayuki Katoh
  • Publication number: 20080179540
    Abstract: Exciting light is irradiated through a dielectric material block toward an interface between the dielectric material block and a metal film formed on one surface of the dielectric material block, such that total reflection conditions may be satisfied. A fluorescence detector detects fluorescence produced by a fluorescent substance, which is contained in a sample and produces the fluorescence by being excited by an evanescent wave oozing out from the interface when the exciting light impinges upon the interface. The exciting light has a wavelength causing the fluorescent substance, which is contained in the sample, to undergo multiphoton absorption. The fluorescence detector has sensitivity to a wavelength region of the fluorescence produced by the fluorescent substance through the multiphoton absorption.
    Type: Application
    Filed: December 12, 2007
    Publication date: July 31, 2008
    Applicant: FUJIFILM CORPORATION
    Inventor: Hisashi OHTSUKA
  • Patent number: 7403554
    Abstract: A solid-state laser crystal constituting a laser-diode-excited solid-state laser apparatus or an optical fiber constituting a fiber laser apparatus or fiber laser amplifier is doped with one of Ho3+, Sm3+, Eu3+, Dy3+, Er3+, and Tb3+ so that a laser beam is emitted from the solid-state laser crystal or the optical fiber, or incident light of the fiber laser amplifier is amplified, by one of the transitions from 5S2 to 5I7, from 5S2 to 5I8, from 4G5/2 to 6H5/2, from 4G5/2 to 6H7/2, from 4F3/2 to 6H11/2, from 5D0 to 7F2, from 4F9/2 to 6H13/2, from 4F9/2 to 6H11/2, from 4S3/2 to 4I15/2, from 2H9/2 to 4I13/2, and from 5D4 to 7F5. The above solid-state laser-crystal or optical fiber is excited with a GaN-based compound laser diode.
    Type: Grant
    Filed: September 30, 2004
    Date of Patent: July 22, 2008
    Assignee: FUJIFILM Corporation
    Inventors: Hisashi Ohtsuka, Yoji Okazaki, Takayuki Katoh
  • Patent number: 7365853
    Abstract: A measurement path is filled with air prior to performing actual measurement. A p-polarized light beam is caused to enter an interface, and the intensity distribution of the light beam reflected at the interface is detected by a photodiode array to obtain a reference intensity distribution of the light beam itself. Thereafter, the measurement path is filled with a target for measurement, and the intensity distribution of a light beam reflected at the interface is measured. Each of the measured distribution values are divided by the reference intensity distribution, to cancel out influences due to fluctuations in the intensity distribution of the light beam. Thereby, the position of an attenuated total reflection angle is detected with high accuracy. Because a light beam constituted by p-polarized light waves is utilized, separating means for separating the light beam reflected at the interface into p-polarized and s-polarized light waves becomes unnecessary.
    Type: Grant
    Filed: September 30, 2005
    Date of Patent: April 29, 2008
    Assignee: Fujifilm Corporation
    Inventors: Shu Sato, Toshihito Kimura, Hisashi Ohtsuka
  • Patent number: 7362789
    Abstract: A solid-state laser crystal constituting a laser-diode-excited solid-state laser apparatus or an optical fiber constituting a fiber laser apparatus or fiber laser amplifier is doped with one of Ho3+, Sm3+, Eu3+, Dy3+, Er3+, and Tb3+ so that a laser beam is emitted from the solid-state laser crystal or the optical fiber, or incident light of the fiber laser amplifier is amplified, by one of the transitions from 5S2 to 5I7, from 5S2 to 5I8, from 4G5/2 to 6H5/2, from 4G5/2 to 6H7/2, from 4F3/2 to 6H11/2, from 5D0 to 7F2, from 4F9/2 to 6H13/2, from 4F9/2 to 6H11/2, from 4S3/2 to 4I15/2, from 2H9/2 to 4I13/2, and from 5D4 to 7F5. The above solid-state laser crystal or optical fiber is excited with a GaN-based compound laser diode.
    Type: Grant
    Filed: September 30, 2004
    Date of Patent: April 22, 2008
    Assignee: FUJIFILM Corporation
    Inventors: Hisashi Ohtsuka, Yoji Okazaki, Takayuki Katoh
  • Patent number: 7356065
    Abstract: A solid-state laser crystal constituting a laser-diode-excited solid-state laser apparatus or an optical fiber constituting a fiber laser apparatus or fiber laser amplifier is doped with one of Ho3+, Sm3+, Eu3+, Dy3+, Er3+, and Tb3+ so that a laser beam is emitted from the solid-state laser crystal or the optical fiber, or incident light of the fiber laser amplifier is amplified, by one of the transitions from 5S2 to 5I7, from 5S2 to 5I8, from 4G5/2 to 6H5/2, from 4G5/2 to 6H7/2, from 4F3/2 to 6H11/2, from 5D0 to 7F2, from 4F9/2 to 6H13/2, from 4F9/2 to 6H11/2, from 4S3/2 to 4I15/2, from 2H9/2 to 4I13/2, and from 5D4 to 7F5. The above solid-state laser crystal or optical fiber is excited with a GaN-based compound laser diode.
    Type: Grant
    Filed: September 30, 2004
    Date of Patent: April 8, 2008
    Assignee: FUJIFILM Corporation
    Inventors: Hisashi Ohtsuka, Yoji Okazaki, Takayuki Katoh
  • Publication number: 20080074671
    Abstract: A fluorescence sensor is constituted by: a light source, for emitting excitation light of a predetermined wavelength; a dielectric block, formed of a material that transmits the excitation light; a metal film, formed on a surface of the dielectric block; a non flexible film of a hydrophobic material, formed on the metal film at a film thickness within a range of 10 to 100 nm; a sample holding portion, for holding a sample such that the sample contacts the non flexible film; an incident optical system, for causing the excitation light to enter the interface between the dielectric block and the metal film through the dielectric block such that conditions for total internal reflection are satisfied; and fluorescence detecting means, for detecting fluorescence emitted by a substance within the sample, which is excited by evanescent waves that leak from the interface when the excitation light enters the interface.
    Type: Application
    Filed: September 21, 2007
    Publication date: March 27, 2008
    Applicant: FUJIFILM CORPORATION
    Inventors: Hisashi OHTSUKA, Morihito IKEDA
  • Patent number: 7330263
    Abstract: A measurement apparatus includes a dielectric block, a laser light source for generating a light beam, an optical system for causing the light beam to enter the interface between the dielectric block and a metal film at various incident angles, and a light detection unit for detecting a parallelized light beam totally reflected at the interface. Properties are measured while causing a reference molecule, of substantially the same size and the same refractive index as an analysis object molecule, to adhere onto the metal film. The reference molecule is removed from the metal film, and the position of a dark line is measured while the measurement chip retains a sample. The position of a dark line of the analysis object molecule is detected by calibrating sensitivity based on the detection result of the position of the dark line while causing the reference molecule to adhere onto the metal film.
    Type: Grant
    Filed: February 4, 2005
    Date of Patent: February 12, 2008
    Assignee: Fujifilm Corporation
    Inventor: Hisashi Ohtsuka