Abstract: A device (70) is disclosed for adjusting a light beam (1) in an optical system (100), whereby the optical system (100) defines an optical axis (60). The device (70) for adjusting comprises means for coupling-in (3) of the light beam into a housing part (80) of the device (70). The means for coupling-in (3) determines a coupling-in point (3a) and a coupled in light beam (9). At least a first and a second photo detector (10, 22) are arranged in different in distances to the coupling-in point. (3a). In the coupled in light beam (9) at least one beam splitter (36) is provided, which directs the coupled in light beam (9) on at least one of the photo detectors (10, 22).

Abstract: Disclosed is a device for adjusting an optical fiber (1) or an optical fiber bundle relative to a coupling point. Said device comprises a holding apparatus (2) for the fiber/s (1) and a mechanism (3) for positioning the fiber/s (1) in said holding apparatus (2). The positioning mechanism (3) is provided with at least two positioning members (4) which act upon the fiber/s (1) at different angles, the position of the fiber/s (1) relative to the holding apparatus (2) being modifiable by actuating said at least two positioning members (4). The inventive device is characterized in that the positioning members (4) which are effective at different angles are disposed next to each other in the holding apparatus (2) in order to be actuated from one side while at least one of the positioning members (4) acts upon the fiber/s (1) via a lever assembly (5).

Abstract: A method for separating detection channels is disclosed, a sample (15) being equipped with at least two different fluorescent dyes. Firstly the emission spectrum of at least two fluorescent dyes is ascertained. From the emission spectra, the separation points of the wavelength and of the individual detection channels are determined. Lastly, adjustment of the separation of the at least two channels is accomplished on that basis.

Abstract: The arrangement for examining microscope preparations with a scanning microscope comprises a laser (1) and an optical means (12) which images the light generated by the laser (1) onto a specimen (13) that is to be examined. Provided between the laser (1) and the optical means (12) is an optical component (3, 20) that spectrally spreads, with a single pass, the light generated by the laser (1). The optical component (3, 20) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber (20).

Abstract: An apparatus and a method for detection with a scanning microscope (1) are disclosed. The scanning microscope (1) encompasses a scanning device (7) that guides an illuminating light beam (3) through a scanning optical system (12) and a microscope optical system (13) and over or through a specimen (15). A digital circuit (30), which periodically interrogates the detected signals within a pixel (Px,y) and calculates an average therefrom, is placed after the detector unit (19).

Abstract: Disclosed is a device for adjusting an optical fiber (1) or an optical fiber bundle relative to a coupling point. Said device comprises a holding apparatus (2) for the fiber/s (1) and a mechanism (3) for positioning the fiber/s (1) in said holding apparatus (2). The positioning mechanism (3) is provided with at least two positioning members (4) which act upon the fiber/s (1) at different angles, the position of the fiber/s (1) relative to the holding apparatus (2) being modifiable by actuating said at least two positioning members (4). The inventive device is characterized in that the positioning members (4) which are effective at different angles are disposed next to each other in the holding apparatus (2) in order to be actuated from one side while at least one of the positioning members (4) acts upon the fiber/s (1) via a lever assembly (5).

Abstract: A scanning microscope for imaging an object includes a light source and a spectrally selective detection device. An illumination beam path extends from the light source to the object. A detection beam path extends from the object to the detection device. A spectrally selective element useable to select light from the light source is provided. The spectrally selective element is useable to mask out of the detection beam path the selected light from the light source reflected or scattered on the object. An illumination slit diaphragm is disposed in the illumination beam path and configured to generate a linear illumination pattern in a region of the object. A detection slit diaphragm is disposed in the detection beam path and configured to detect the light coming from the linear illumination region from a focal plane so as to provide a confocal slit scanner.

Abstract: A device for beam adjustment in an optical beam path, having at least two mutually independent light sources (1, 2), in particular in a beam path (8, 9) of a preferably high or extremely high resolution microscope, the beams of the light sources (1, 2) requiring to be superposed in a common illumination beam path (10), is characterized in that a calibration sample (22) with the aid of which the pupil position and/or focal position of the beams can be checked can be brought into and taken out of the illumination beam path (10).

Abstract: A scanning microscope, in particular a confocal scanning microscope, having: a scanning device (1), a detection device (2), an electronic system (3) for operating the scanning microscope, and a cooling device (4) for at least one component of the scanning microscope, is configured and refined, in the interest of efficient cooling, in such a way that the cooling device (4) is operable with a liquid cooling medium.

Abstract: An apparatus for detecting photons of a light beam emanating from a spatially limited source includes a detection device having a plurality of detectors forming a three-dimensional array with semitranslucent EMCCDs disposed one behind another. A light splitting device is disposed in a path of rays of the light beam for splitting the light beam so as to distribute the photons over the detectors for detection.

Abstract: A scanning microscope comprises a beam deflector with at least one movable deflector to adjust the deflection of a light beam. The scanning microscope is characterized in that the movable deflector is positioned in a largely soundproof housing with one entrance window and/or one exit window.

Abstract: A device for selectively detecting specific wavelength components of a light beam includes a spectral spreading element for spectrally spreading the light beam, and a detector array arranged downstream of the element. The detector array includes light-insensitive regions and light-sensitive regions. The element and the detector array are matched to each other so that selectable wavelength components of the light beam hit the light-insensitive regions and remaining wavelength components of the light beam hit the light-sensitive regions.

Abstract: An apparatus and a method for detection with a scanning microscope (1) are disclosed. The scanning microscope (1) encompasses a scanning device (7) that guides an illuminating light beam (3) through a scanning optical system (12) and a microscope optical system (13) and over or through a specimen (15). A digital circuit (30), which periodically interrogates the detected signals within a pixel (Px,y) and calculates an average therefrom, is placed after the detector unit (19).

Abstract: The arrangement for examining microscope preparations with a scanning microscope comprises a laser (1) and an optical means (12) which images the light generated by the laser (1) onto a specimen (13) that is to be examined. Provided between the laser (1) and the optical means (12) is an optical component (3, 20) that spectrally spreads, with a single pass, the light generated by the laser (1). The optical component (3, 20) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber (20).

Abstract: A method for classifying a plurality of object image regions of an object to be detected using a scanning microscope includes labeling each of the image areas of the object with a different marker so that light of a respective characteristic emanates from each marker. The intensity of the light from each marker is detected using at least two channels so as to generate detection signals, each detection signal being a function of the intensity of the detected light. The object regions are classified using ratios of the detection signals.

Abstract: The arrangement for examining microscope preparations with a scanning microscope comprises a laser (1) and an optical means (12) which images the light generated by the laser (1) onto a specimen (13) that is to be examined. Provided between the laser (1) and the optical means (12) is an optical component (3, 20) that spectrally spreads, with a single pass, the light generated by the laser (1). The optical component (3, 20) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber (20).

Abstract: A microscope includes a scanning head including a scanning device for a light beam. A scanning tube lens is coupled to the scanning head. The scanning head may be a scanning head of a scanning microscope. The scanning tube lens may be disposed inside the scanning head. The scanning tube lens may be adapted to an optical requirement of the scanning head.

Abstract: An apparatus for detecting photons of a light beam emanating from a spatially limited source includes a detection device having a plurality of detectors forming a three-dimensional array with semitranslucent EMCCDs disposed one behind another. A light splitting device is disposed in a path of rays of the light beam for splitting the light beam so as to distribute the photons over the detectors for detection.

Abstract: A microscope includes a light source that emits an illuminating light beam for illumination of a specimen, a beam splitter separating measuring light out of the illuminating light beam, and an apparatus for determining the light power level of the illuminating light beam. The apparatus for determining the light power level of the illuminating light beam receives the measuring light and includes an apparatus for simultaneous color-selective detection of the measuring light.

Abstract: A scanning microscope for imaging an object includes a light source and a spectrally selective detection device. An illumination beam path extends from the light source to the object. A detection beam path extends from the object to the detection device. A spectrally selective element useable to select light from the light source is provided. The spectrally selective element is useable to mask out of the detection beam path the selected light from the light source reflected or scattered on the object. An illumination slit diaphragm is disposed in the illumination beam path and configured to generate a linear illumination pattern in a region of the object. A detection slit diaphragm is disposed in the detection beam path and configured to detect the light coming from the linear illumination region from a focal plane so as to provide a confocal slit scanner.