Abstract: An apparatus for materials testing of test objects using X-rays, the apparatus comprising an X-ray device, comprising: an X-ray source for irradiating a test object held in a test position; an X-ray linear diode array detector comprising at least two detection sections and configured to acquire a complete radial cross-section of the test object; and an electronic control device configured to control the X-ray device, wherein during X-ray testing the test object and the X-ray device are rotatable relative to each other only around an essentially vertical axis of rotation.

Abstract: Non-destructive testing and examination systems and methods generate models and other representations of a part. These models can be used to perform analysis such as defect detection and categorization. The present disclosure identifies, in one embodiment, a method and system that identifies particular locations on the part for analysis. These locations correspond to regions of a reference model, which may comprise a representation of the part that a computer aided design (CAD) package can generate. The method provides for test parameters to be assigned or associated with the region so as to direct and instruct the execution of the relevant part analysis protocols. In one example, the test parameters identify criteria for one or more types of defects that may be found on the part.

Abstract: An apparatus for materials testing of test objects using X-rays, the apparatus comprising an X-ray device, comprising: an X-ray source for irradiating a test object held in a test position; an X-ray linear diode array detector comprising at least two detection sections and configured to acquire a complete radial cross-section of the test object; and an electronic control device configured to control the X-ray device, wherein during X-ray testing the test object and the X-ray device are rotatable relative to each other only around an essentially vertical axis of rotation.