Patents by Inventor Hong Paik

Hong Paik has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060011390
    Abstract: The present invention relates to a mass measurement system and method using inertial force and standard mass in a gravity-free environment. The mass measurement system includes a linear acceleration motion unit that is a linear motion driving source, a first load cell fastened to the linear acceleration motion unit to measure an inertial force of a sample caused by linearly accelerated motion of the linear acceleration motion unit, a second load cell fastened to the linear acceleration motion unit while being spaced apart from the first load cell by a predetermined distance, the second load cell measuring an inertial force of a standard sample having a known standard mass caused by the linearly accelerated motion of the linear acceleration motion unit, and a main control unit for calculating and outputting mass of the sample through an arithmetic operation based on the inertial forces, measured by the first and second load cells, and the standard mass, and controlling an entire operation of the system.
    Type: Application
    Filed: July 12, 2005
    Publication date: January 19, 2006
    Applicant: Korea Aerospace Research Institute
    Inventors: Hong Paik, Hae Choi, Gi Choi, Jong Kim, Youn Kim
  • Publication number: 20060015268
    Abstract: The present invention relates to a mass measurement system and method capable of precisely measuring the mass of a sample in a gravity-free environment.
    Type: Application
    Filed: July 13, 2005
    Publication date: January 19, 2006
    Applicant: Korea Aerospace Research Institute
    Inventors: Hong Paik, Hae Choi, Gi Choi, Jong Kim, Youn Kim