Abstract: The present application discloses a method, a system, a device, and a storage medium for fabricating a GaN chip. The method includes: growing a Nb2N sacrificial layer on an original substrate, and growing a GaN insertion layer on the Nb2N sacrificial layer; growing a Ta2N sacrificial layer on the GaN insertion layer, and growing a semiconductor layer on the Ta2N sacrificial layer to form a GaN wafer; bonding the GaN wafer with a first surface of a temporary carrier, and removing the Nb2N sacrificial layer and the Ta2N sacrificial layer; and transferring remaining material after removal of the Nb2N sacrificial layer and the Ta2N sacrificial layer to a target substrate, and removing the temporary carrier from the remaining material to form the GaN chip.

Abstract: The present application discloses a method, a system, a device, and a storage medium for fabricating a GaN chip. The method includes: growing a Nb2N sacrificial layer on an original substrate, and growing a GaN insertion layer on the Nb2N sacrificial layer; growing a Ta2N sacrificial layer on the GaN insertion layer, and growing a semiconductor layer on the Ta2N sacrificial layer to form a GaN wafer; bonding the GaN wafer with a first surface of a temporary carrier, and removing the Nb2N sacrificial layer and the Ta2N sacrificial layer; and transferring remaining material after removal of the Nb2N sacrificial layer and the Ta2N sacrificial layer to a target substrate, and removing the temporary carrier from the remaining material to form the GaN chip.

Abstract: A parallel bus phase correction method and a device are provided. The method comprises: correcting a data bus, respectively performing phase correction tests on a clock line; determining a first optimal window of the clock line according to the clock test results; correcting the clock line by using a median value of the first optimal window, respectively performing phase correction tests on the data bus according to the multiple second phase adjustment values, and recording corresponding data test results; determining a second optimal window of the data bus according to the data test results; and performing phase correction on normal data transmission on the basis of the median value of the first optimal window and the median value of the second optimal window. The method achieves phase correction and ensures the correctness and accuracy of data transmission, even if a small clock offset is present.

Abstract: A parallel bus phase correction method and a device are provided. The method comprises: correcting a data bus, respectively performing phase correction tests on a clock line; determining a first optimal window of the clock line according to the clock test results; correcting the clock line by using a median value of the first optimal window, respectively performing phase correction tests on the data bus according to the multiple second phase adjustment values, and recording corresponding data test results; determining a second optimal window of the data bus according to the data test results; and performing phase correction on normal data transmission on the basis of the median value of the first optimal window and the median value of the second optimal window. The method achieves phase correction and ensures the correctness and accuracy of data transmission, even if a small clock offset is present.