Patents by Inventor Horst KRAUTHÄUSER

Horst KRAUTHÄUSER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11898971
    Abstract: A method and a device for determining the material properties of a polycrystalline, in particular metallic, product during production or quality control of the polycrystalline, in particular metallic, product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector. In this case, an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product and the resulting diffraction image of the X-ray is recorded by the X-ray detector. After exiting the X-ray source, the X-ray is passed through an X-ray mirror, wherein the X-ray is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector, and then reaches a surface of the metallic product.
    Type: Grant
    Filed: June 24, 2020
    Date of Patent: February 13, 2024
    Assignees: SMS group GmbH, IMS Messsysteme GmbH
    Inventors: Christian Klinkenberg, Ulrich Sommers, Helmut Klein, Alexandre Lhoest, Olivier Pensis, Horst Krauthäuser
  • Publication number: 20220357290
    Abstract: A method and a device for determining the material properties of a polycrystalline, in particular metallic, product during production or quality control of the polycrystalline, in particular metallic, product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector. In this case, an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product and the resulting diffraction image of the X-ray is recorded by the X-ray detector. After exiting the X-ray source, the X-ray is passed through an X-ray mirror, wherein the X-ray is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector, and then reaches a surface of the metallic product.
    Type: Application
    Filed: June 24, 2020
    Publication date: November 10, 2022
    Applicants: SMS group GmbH, IMS Messsysteme GmbH
    Inventors: Christian KLINKENBERG, Ulrich SOMMERS, Helmut KLEIN, Alexandre LHOEST, Olivier PENSIS, Horst KRAUTHÄUSER
  • Patent number: 11249037
    Abstract: A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.
    Type: Grant
    Filed: May 24, 2017
    Date of Patent: February 15, 2022
    Assignee: SMS GROUP GMBH
    Inventors: Mostafa Biglari, Ulrich Sommers, Christian Klinkenberg, Michel Renard, Guy Raymond, Oliver Pensis, Tobias Terlau, Horst Krauthäuser
  • Patent number: 11243174
    Abstract: The invention relates to an arrangement for contactless determination of at least one dimension of a moving material web, in particular a material web of opaque material, with a background illumination, with optical detection means for detecting at least one current contrast image and with evaluation means, wherein the background illumination is arranged opposite the optical detection means, wherein the material web moves in a plane between the at least one optical detection means and the background illumination, and wherein the current contrast image has at least one piece of information about at least one light intensity laterally adjacent to the material web. Furthermore, the present invention concerns a corresponding process.
    Type: Grant
    Filed: April 10, 2019
    Date of Patent: February 8, 2022
    Assignee: IMS Messsysteme GmbH
    Inventor: Horst Krauthäuser
  • Publication number: 20210164913
    Abstract: The invention relates to an arrangement for contactless determination of at least one dimension of a moving material web, in particular a material web of opaque material, with a background illumination, with optical detection means for detecting at least one current contrast image and with evaluation means, wherein the background illumination is arranged opposite the optical detection means, wherein the material web moves in a plane between the at least one optical detection means and the background illumination, and wherein the current contrast image has at least one piece of information about at least one light intensity laterally adjacent to the material web. Furthermore, the present invention concerns a corresponding process.
    Type: Application
    Filed: April 10, 2019
    Publication date: June 3, 2021
    Inventor: Horst Krauthäuser
  • Publication number: 20190292624
    Abstract: A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.
    Type: Application
    Filed: May 24, 2017
    Publication date: September 26, 2019
    Inventors: Mostafa BIGLARI, Ulrich SOMMERS, Christian KLINKENBERG, Michel RENARD, Guy RAYMOND, Oliver PENSIS, Tobias TERLAU, Horst KRAUTHÄUSER