Abstract: The present disclosure provides a switching matrix system and an operating method thereof for semiconductor characteristic measurement. The switching matrix system is configured to: detect an assembly of at least one switching matrix module inserted into a plurality of slots of the switching matrix system; determine a user interface according to the assembly of the at least one switching matrix module inserted into the slots, wherein the user interface includes an operable object corresponding to the assembly; and provide the user interface.

Abstract: An image outputting method and an electronic device are provided. The method includes: shooting a scene by using a plurality of different exposure durations to obtain a plurality of images respectively; performing a summation operation according to the images to obtain a first image; adjusting a first brightness of the first image to an output brightness to generate a second image; respectively converting pixel values of a plurality of first pixels in the second image into other corresponding pixel values in another value domain to generate an output image; and outputting the output image.

Abstract: An image outputting method and an electronic device are provided. The method includes: shooting a scene by using a plurality of different exposure durations to obtain a plurality of images respectively; performing a summation operation according to the images to obtain a first image; adjusting a first brightness of the first image to an output brightness to generate a second image; respectively converting pixel values of a plurality of first pixels in the second image into other corresponding pixel values in another value domain to generate an output image; and outputting the output image.