Abstract: A tray transportation device is disclosed in this invention. The tray transportation device includes a transfer stage, a loading handler, an operation handler and an unload stage. The transfer stage has a buffer area and an operation area. The loading handler is disposed on the buffer area to handle a tray in the buffer area. The operation handler is disposed on the operation area to handle a tray in the operation area. The unload stage is used to carry the tray transferred from the transfer stage. The loading handler and the operation handler move together, when the operation handler transfers the tray from the operation area to the unload stage; the loading handler transfers the tray from the buffer area to the operation area.

Abstract: A tray transportation device is disclosed in this invention. The tray transportation device includes a transfer stage, a loading handler, an operation handler and an unload stage. The transfer stage has a buffer area and an operation area. The loading handler is disposed on the buffer area to handle a tray in the buffer area. The operation handler is disposed on the operation area to handle a tray in the operation area. The unload stage is used to carry the tray transferred from the transfer stage. The loading handler and the operation handler move together, when the operation handler transfers the tray from the operation area to the unload stage; the loading handler transfers the tray from the buffer area to the operation area.

Abstract: An automatic optical inspection device for inspecting the surface defects of integrated circuits is disclosed in this invention. The automatic optical inspection device includes a tray transporting device which transports a tray carrying at least one integrated circuit and having at least one clip area, a press mechanism for fixing the tray to the tray transporting device by clamping the clip area of the tray, and an image capture device for capturing an image of one surface of the integrated circuit. The surface defects of the integrated circuit can be found by analyzing the image. Chip sorting apparatus and method are also disclosed in this invention. The chip sorting apparatus includes a pick-and-place head which picks a chip on a wafer and places the chip on a tray; and an image capture device which is disposed for examining the chip surface of the chip so as to find the surface defects of the chip.