Abstract: A projection system comprises an image input element and an optical imaging element. The image input element is configured to input an original image or a processed image. The optical imaging element, an optical system with axisymmetrical structure and specific spherical aberration, is configured to generate an image with extended depth of field on an image projection surface in accordance with the original image or the processed image.

Abstract: The present invention relates to a monochromatic measurement system. The system mainly includes a monochromator, a light-detecting device and a filter device. The monochromator functions to split light under test into respective light beams with different wavelengths. The filter device modulates the transmission efficiency of the respective light beams, so that the wavelengths of the light beams to which the light-detecting device displays a better response have a lower transmission efficiency while the wavelengths of the light beams to which the light-detecting device displays a lower response have a higher transmission efficiency. The response values measured by the light-detecting device with respect to different wavelength intervals are normalized accordingly. The measurement errors attributed to the measurement precision of the instrument and the environmental noise are independent from the variation of wavelength. The reliability of the measurement instrument is elevated.

Abstract: An optical imaging system with extended depth of focus is provided. The optical imaging system includes an optical imaging module, an array type detector and an image restoration module. The optical imaging module has a specific longitudinal spherical aberration corresponding to the depth of focus. The array type detector is coupled to the optical imaging module to obtain a image via the specific longitudinal spherical aberration provided by the optical imaging module. The image restoration module is coupled to the array type detector, wherein the array type detector converts the obtained image to a digitalized image and the image restoration module receives the digitalized image and performs an image restoration operation to the digitalized image to form an image with extended depth of focus.

Abstract: A method for designing computational optical imaging system, including a step for setting a target; a step for designing an optical module; and a step for designing an image restoration module; wherein by using the similarity and blur minimization of the optical module and the image restoration module to gather the optimization judgment standard, the step for designing an optical module and the step for designing an image restoration module operate individually synchronously or in sequence, and by a software product to design an optical imaging system so as to reduce the quantity and time of calculation and save repairing costs.

Abstract: A high-speed optical sensing device is provided in the present invention. The high-speed optical sensing device has an optical detector, a lens set, and a beam splitter. The optical detector is utilized for detecting luminous intensity. The lens set is utilized for concentrating light beams toward a color analyzer. The beam splitter is aligned to the illuminating device to be detected and is utilized to separate the light beam generated by the illuminating device to the optical detector and the lens set simultaneously.

Abstract: A high-speed optical sensing device is provided in the present invention. The high-speed optical sensing device has an optical detector, a lens set, and a beam splitter. The optical detector is utilized for detecting luminous intensity. The lens set is utilized for concentrating light beams toward a color analyzer. The beam splitter is aligned to the illuminating device to be detected and is utilized to separate the light beam generated by the illuminating device to the optical detector and the lens set simultaneously.

Abstract: An apparatus for feature detection of a test object includes at least one light source module and at least one image capturing unit. The light source module provides light to illuminate a test region of the test object, and includes a substrate, a set of light-emitting components, and a light-focusing unit. The light-emitting components are mounted on the substrate for emitting light in parallel directions that are generally transverse to the substrate. The light-focusing unit is to be disposed between the light-emitting components and the test object, receives the light emitted by the light-emitting components, and focuses the light on the test region of the test object. The image capturing unit captures an image of the test object at the test region.

Abstract: An apparatus for feature detection of a test object includes at least one light source module and at least one image capturing unit. The light source module provides light to illuminate a test region of the test object, and includes a substrate, a set of light-emitting components, and a light-focusing unit. The light-emitting components are mounted on the substrate for emitting light in parallel directions that are generally transverse to the substrate. The light-focusing unit is to be disposed between the light-emitting components and the test object, receives the light emitted by the light-emitting components, and focuses the light on the test region of the test object. The image capturing unit captures an image of the test object at the test region.

Abstract: A apparatus for generating a structured line having a sinusoidal intensity distribution is disclosed. The apparatus comprises a coherent light source and a diffractive optical element. The coherent light source provides an incident light beam to the diffractive optical element, the incident light beam being modulated by means of the diffractive optical element to form a fringe pattern of sinusoidal intensity distribution. The diffractive optical element design is optimized in accordance with the optical field distribution of an incident-light-beam plane and the optical field distribution of an output-light-beam plane.

Abstract: A method and system for determining a three-dimensional surface profile of an object comprising a plurality of object points. First, a grating projector is provided to direct an incident beam of light having a pattern at the object. Then, a resultantly formed grating image of a line profile of the object is received and stored in a multi-line photoelectric image device. Next, the outputs of the grating projector and the multi-line photoelectric image device are taken together to form the phase shifter and the object is shifted opposite to a phase shifter. The above steps are repeated until all object points are imaged on the multi-line photoelectric image device. Finally, a phase of each object point is determined, each phase transformed and rectified to a height by an appropriate trigonometric algorithm for viewing on a display device.