Abstract: A method and apparatus for ringing artifacts reduction for compressed video signals. The method includes receiving luma data to the digital signal processor, calculating sum of gradient of the luma data; calculating SAD of the luma data; performing pixel classification based of the calculated SAD and sum of gradient, performing erosion on a detected edge pixel indicator on a detected flat pixel indicators, determining at least one of the strength or weakness of the an edge based on the determined edge erosion, performing horizontal dilation on the detected edge pixel indicators and edge strength; and performing at least one of sigma or bilateral filtering to the luma data according to the detected edge pixel indicator, flat pixel indicator, edge strength, the number of very flat pixel in the block.

Abstract: A method and apparatus for ringing artifacts reduction for compressed video signals. The method includes receiving luma data to the digital signal processor, calculating sum of gradient of the luma data; calculating SAD of the luma data; performing pixel classification based of the calculated SAD and sum of gradient, performing erosion on a detected edge pixel indicator on a detected flat pixel indicators, determining at least one of the strength or weakness of the an edge based on the determined edge erosion, performing horizontal dilation on the detected edge pixel indicators and edge strength; and performing at least one of sigma or bilateral filtering to the luma data according to the detected edge pixel indicator, flat pixel indicator, edge strength, the number of very flat pixel in the block.

Abstract: An on-chip transient event detector (FIG., 1) is fabricated onto an integrated circuit chip to provide rapid response to a detected event, such as a transient radiation dose or other condition that can cause transient current pulses. The transient event detector includes a detector circuit 10 that includes a narrow p-channel FET (12), and a wide n-channel FET (14). These detector transistors are coupled together and biased so that the narrow-channel transistor is normally on and the wide-channel transistor is normally off. A transient event, such as a photocurrent induced by radiation, causes a current pulse in the normally off wide-channel transistor that is sufficiently greater than the current in the narrow-channel transistor to cause a change in logic output, providing an event signal. The event signal can be used to disable memory WRITE operations during the transient event. The detector circuit can be integrated with an on-chip time-delay circuit (30) to provide a time-delayed system reset signal.