Abstract: Provided are a multiple-level interconnect structure having a scatterometry test layer and a manufacturing method thereof. The multiple level interconnect structure includes a patterned reflective layer, a bulk reflective layer and a patterned test layer. The patterned reflective layer is disposed on a substrate and includes a first reflective pattern and a second reflective pattern separated from each other. The bulk reflective layer is disposed on the patterned reflective layer. The patterned test layer is disposed on the bulk reflective layer.

Abstract: The present invention discloses a process for managing method manages a first process and a second process executed on a set-top box (STB), wherein the first process is utilized for performing playback of a multimedia content, the second process is utilized for a specific function, the method includes: when switching from the first process to the second process, resuming the second process; and when switching from the second process to the first process, pausing the second process.

Abstract: A gas burner includes a base member to which a plurality of nozzles is disposed and a disk is mounted to the base member with a plurality of gas supplying tubes connected between the disk and the base member. A central head member and a plurality of chambers are respectively mounted to the disk and communicate with the gas supplying tubes respectively. Each of the chambers and the central head member has a plurality of openings defined therethrough.