Abstract: A load lock system for charged particle beam imaging with a particle shielding plate, a bottom seal plate and a plurality of sensor units is provided. The sensor units are located above the wafer, the shield plate is designed to have a few number of screws, and the bottom seal plate contains no cable, no contact sensors and fewer screws used. In the invention, the system is designed to improve the contamination particles from components in the load lock system of charged particle beam inspection tool and also to simplify its assembly.

Abstract: A load lock system for charged particle beam imaging with a particle shielding plate, a bottom seal plate and a plurality of sensor units is provided. The sensor units are located above the wafer, the shield plate is designed to have a few number of screws, and the bottom seal plate contains no cable, no contact sensors and fewer screws used. In the invention, the system is designed to improve the contamination particles from components in the load lock system of charged particle beam inspection tool and also to simplify its assembly.

Abstract: In a ball movement state measuring system with a ball, a sensing module, a wireless communication module, a power supply and an induction coil, the speed, rotation speed, rotation axis and trace of the ball at first movement state are calculated based on first accelerated speed and first angular velocity of the ball at first movement state and first movement result is obtained by the processor. The speed, rotation speed, rotation axis and trace of the ball at second movement state are calculated based on speed and rotation axis of the ball at first movement state, second accelerated speed and environment parameter of the ball at second movement state and second movement result is obtained by the processor. The ball is forced by gravity, applied force and air resistance at first movement state, and the ball is forced by gravity, air resistance and centripetal force at second movement state.

Abstract: In a ball movement state measuring system with a ball, a sensing module, a wireless communication module, a power supply and an induction coil, the speed, rotation speed, rotation axis and trace of the ball at first movement state are calculated based on first accelerated speed and first angular velocity of the ball at first movement state and first movement result is obtained by the processor. The speed, rotation speed, rotation axis and trace of the ball at second movement state are calculated based on speed and rotation axis of the ball at first movement state, second accelerated speed and environment parameter of the ball at second movement state and second movement result is obtained by the processor. The ball is forced by gravity, applied force and air resistance at first movement state, and the ball is forced by gravity, air resistance and centripetal force at second movement state.

Abstract: A load lock system for charged particle beam imaging with a particle shielding plate, a bottom seal plate and a plurality of sensor units is provided. The sensor units are located above the wafer, the shield plate is designed to have a few number of screws, and the bottom seal plate contains no cable, no contact sensors and fewer screws used. In the invention, the system is designed to improve the contamination particles from components in the load lock system of charged particle beam inspection tool and also to simplify its assembly.

Abstract: A load lock system for charged particle beam imaging with a particle shielding plate, a bottom seal plate and a plurality of sensor units is provided. The sensor units are located above the wafer, the shield plate is designed to have a few number of screws, and the bottom seal plate contains no cable, no contact sensors and fewer screws used. In the invention, the system is designed to improve the contamination particles from components in the load lock system of charged particle beam inspection tool and also to simplify its assembly.

Abstract: In a ball movement state measuring system with a ball, a sensing module, a wireless communication module, a power supply and an induction coil, the speed, rotation speed, rotation axis and trace of the ball at first movement state are calculated based on first accelerated speed and first angular velocity of the ball at first movement state and first movement result is obtained by the processor. The speed, rotation speed, rotation axis and trace of the ball at second movement state are calculated based on speed and rotation axis of the ball at first movement state, second accelerated speed and environment parameter of the ball at second movement state and second movement result is obtained by the processor. The ball is forced by gravity, applied force and air resistance at first movement state, and the ball is forced by gravity, air resistance and centripetal force at second movement state.

Abstract: A patterning device handling apparatus for use in charged particle beam imaging is disclosed. The disclosed patterning device handling apparatus comprises a first gripping member and a second gripping member. The first gripping member is equipped with a plurality of first positioning projections, and the second gripping member is equipped with a plurality of second positioning projections. When the patterning device is held at one angle, the first positioning projections abut against one edge of the patterning device and the second positioning projections abut against the opposite edge of the patterning device. When the patterning device is held at another angle, the first positioning projections abut against two neighboring edges of the patterning device, and the second positioning projections abut against the other two neighboring edges of the patterning device. Therefore, the disclosed patterning device handling apparatus can hold the pattering device at different angles.

Abstract: A patterning device holding apparatus includes a support platform unit with a plurality of first positioning projections and a gripper unit. The gripper unit includes a head portion and a plurality of second positioning projections disposed on the head portion, and a rolling member set at a base portion. The grapping and releasing of the patterning device is achieved by the rotation of the gripper unit about a pivot substantially parallel with the center axis of the rolling member. The first and second positioning projections corporately abut against the edges of a patterning device to fix the patterning device in place.

Abstract: A patterning device holding apparatus includes a support platform unit with a plurality of first positioning projections and a gripper unit. The gripper unit includes a head portion and a plurality of second positioning projections disposed on the head portion, and a rolling member set at a base portion. The grapping and releasing of the patterning device is achieved by the rotation of the gripper unit about a pivot substantially parallel with the center axis of the rolling member. The first and second positioning projections corporately abut against the edges of a patterning device to fix the patterning device in place.

Abstract: A patterning device handling apparatus for use in charged particle beam imaging is disclosed. The disclosed patterning device handling apparatus comprises a first gripping member and a second gripping member. The first gripping member is equipped with a plurality of first positioning projections, and the second gripping member is equipped with a plurality of second positioning projections. When the patterning device is held at one angle, the first positioning projections abut against one edge of the patterning device and the second positioning projections abut against the opposite edge of the patterning device. When the patterning device is held at another angle, the first positioning projections abut against two neighboring edges of the patterning device, and the second positioning projections abut against the other two neighboring edges of the patterning device. Therefore, the disclosed patterning device handling apparatus can hold the pattering device at different angles.