Patents by Inventor Huabin CHENG

Huabin CHENG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220128719
    Abstract: Disclosed herein is an amplifier, comprising: an op-amp configured to receive at an input thereof a first electric current; a first MOS capacitor connected to the input and an output of the op-amp.
    Type: Application
    Filed: January 11, 2022
    Publication date: April 28, 2022
    Inventors: Huabin CHENG, Zhigang WANG, Xin LI
  • Patent number: 11122221
    Abstract: Disclosed herein is an apparatus suitable for detecting an image, comprising: a plurality of pixels configured to generate an electric signal upon exposure to a radiation; an electronics system associated with each of the pixels, wherein the electronics system comprises a first memory on a first signal path and a second memory on a second signal path, both signal paths being between an input terminal and an output terminal of the electronics system; wherein each of the first memory and the second memory is configured to store the electric signal generated by the pixel the electronics system is associated with, configured to store the electric signal generated in another pixel, and configured to transmit the electric signal stored in the electronics system to another pixel; wherein the electronics system comprises a switch configured to select one of the signal paths.
    Type: Grant
    Filed: February 26, 2016
    Date of Patent: September 14, 2021
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Huabin Cheng, Yurun Liu
  • Publication number: 20200280686
    Abstract: Disclosed herein is an apparatus suitable for detecting an image, comprising: a plurality of pixels configured to generate an electric signal upon exposure to a radiation; an electronics system associated with each of the pixels, wherein the electronics system comprises a first memory on a first signal path and a second memory on a second signal path, both signal paths being between an input terminal and an output terminal of the electronics system; wherein each of the first memory and the second memory is configured to store the electric signal generated by the pixel the electronics system is associated with, configured to store the electric signal generated in another pixel, and configured to transmit the electric signal stored in the electronics system to another pixel; wherein the electronics system comprises a switch configured to select one of the signal paths.
    Type: Application
    Filed: February 26, 2016
    Publication date: September 3, 2020
    Inventors: Peiyan CAO, Huabin CHENG, Yurun LIU
  • Patent number: 10353086
    Abstract: Disclosed herein is a method to measure an intensity distribution of X-ray using an X-ray detector, the method comprising: determining values of dark current at at least three locations on the X-ray detector, wherein the three locations are not on a straight line; determining a spatial variation of absorptance of the X-ray using the values of the dark current; measuring an apparent intensity distribution of the X-ray; determining the intensity distribution by removing a contribution of the spatial variation the absorptance from the apparent intensity distribution.
    Type: Grant
    Filed: October 19, 2018
    Date of Patent: July 16, 2019
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Huabin Cheng
  • Publication number: 20190056516
    Abstract: Disclosed herein is a method to measure an intensity distribution of X-ray using an X-ray detector, the method comprising: determining values of dark current at at least three locations on the X-ray detector, wherein the three locations are not on a straight line; determining a spatial variation of absorptance of the X-ray using the values of the dark current; measuring an apparent intensity distribution of the X-ray; determining the intensity distribution by removing a contribution of the spatial variation the absorptance from the apparent intensity distribution.
    Type: Application
    Filed: October 19, 2018
    Publication date: February 21, 2019
    Inventors: Peiyan CAO, Huabin CHENG
  • Patent number: 10139500
    Abstract: Disclosed herein is a method to measure an intensity distribution of X-ray using an X-ray detector, the method comprising: determining values of dark current at at least three locations on the X-ray detector, wherein the three locations are not on a straight line; determining a spatial variation of absorptance of the X-ray using the values of the dark current; measuring an apparent intensity distribution of the X-ray; determining the intensity distribution by removing a contribution of the spatial variation the absorptance from the apparent intensity distribution.
    Type: Grant
    Filed: October 14, 2015
    Date of Patent: November 27, 2018
    Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
    Inventors: Peiyan Cao, Huabin Cheng
  • Publication number: 20180210097
    Abstract: Disclosed herein is a method to measure an intensity distribution of X-ray using an X-ray detector, the method comprising: determining values of dark current at at least three locations on the X-ray detector, wherein the three locations are not on a straight line; determining a spatial variation of absorptance of the X-ray using the values of the dark current; measuring an apparent intensity distribution of the X-ray; determining the intensity distribution by removing a contribution of the spatial variation the absorptance from the apparent intensity distribution.
    Type: Application
    Filed: October 14, 2015
    Publication date: July 26, 2018
    Inventors: Peiyan CAO, Huabin CHENG