Patents by Inventor Huan-Chau Lin

Huan-Chau Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for use in inspecting a CPU and method thereof
    Patent number: 8489927
    Abstract: A device for use in inspecting a CPU and a method thereof are provided. The device comprises a receiving interface and a processor. The receiving interface receives a first data stream from the CPU when the CPU executes a reference hardware inspection program in a first time interval, and receives a second data stream from the CPU when the CPU executes the reference hardware inspection program in a second time interval. The processor sets the first data stream as a good log, and sets the second data stream as an erroneous log. The processor compares the good log and the erroneous log to determine a segment of the erroneous log as an erroneous range, and determine a defect of the CPU according to the erroneous range.
    Type: Grant
    Filed: December 15, 2010
    Date of Patent: July 16, 2013
    Assignee: RDC Semiconductor Co., Ltd.
    Inventors: Chun-Jieh Huang, Huan-Chau Lin, Chang Cheng Yap
  • DEVICE FOR USE IN INSPECTING A CPU AND METHOD THEREOF
    Publication number: 20110246838
    Abstract: A device for use in inspecting a CPU and a method thereof are provided. The device comprises a receiving interface and a processor. The receiving interface receives a first data stream from the CPU when the CPU executes a reference hardware inspection program in a first time interval, and receives a second data stream from the CPU when the CPU executes the reference hardware inspection program in a second time interval. The processor sets the first data stream as a good log, and sets the second data stream as an erroneous log. The processor compares the good log and the erroneous log to determine a segment of the erroneous log as an erroneous range, and determine a defect of the CPU according to the erroneous range.
    Type: Application
    Filed: December 15, 2010
    Publication date: October 6, 2011
    Inventors: Chun-Jieh Huang, Huan-Chau Lin, Chang Cheng Yap