Abstract: A contacting unit (30) for a test handler (100) for carrying out functional tests on semiconductor elements having a surface, in particular on ICs (200), has a contacting module (60).

Abstract: A contacting unit (30) for a test handler (100) for carrying out functional tests on semiconductor elements having a surface, in particular on ICs (200), has a contacting module (60).

Abstract: A device for picking up, transporting and sorting electronic components in particular integrated circuits includes at least one loading device, one transport device, and one unloading device. The transport device has at least one transport wheel which is rotatable around a rotation axis and which has a peripheral face. The transport device also has at least one pick-up module which is arranged at the peripheral face and is suitable for accommodating components. In addition, the transport device is provided with a pressure source which is connected to the pick-up module. The pick-up module has at least one pick-up space for one individual component which extends along the peripheral face and can be moved between an initial position and an end position. The pressure source enables a prescribed pressure to be exerted at the pick-up space by means of which the component can be retained at the pick-up space or can be ejected from the pick-up space.

Abstract: A handling device for positioning a test head, in particular at a test station, is provided with a positioning means enabling the test head to be positioned with respect to three dimensions. The handling device also has a mounting on which the test head can be attached and which is connected to the positioning means. The handling device is also provided with a fastening plate which is movably mounted and a compliance module by means of which the fastening plate can be moved between a starting position (I) and an end position (II, III) against the effect of a return force. The compliance module includes a housing, a spindle, a first sliding bushing and a second sliding bushing which are arranged in a movable manner on the spindle between a first stop and a second stop, and a spring element arranged between the sliding bushings and which impinges on the sliding bushings. The sliding bushings are movable relative to the housing. The compliance module permits bi-directional compliance of the test head.

Abstract: A manipulator for positioning a test head is provided with a positioning means by which the test head is three-dimensionally positionable and with a cradle to which the test head is securable and which is connected to the positioning means. The manipulator includes a compensator which can be loaded by the mass of the test head. The positioning means includes a column and at least one lead screw extending in the vertical direction. The compensator is connected to the cradle and can be moved by the lead screw in the vertical direction. The compensator includes a driver cooperating with the lead screw and is guided in the vertical direction on the column. The compensator has a spring element which is biased and supported by the driver.

Abstract: A manipulator for positioning a test head is provided with a positioning means by which the test head is three-dimensionally positionable and with a cradle to which the test head is securable and which is connected to the positioning means. The manipulator includes a compensator which can be loaded by the mass of the test head. The positioning means includes a column and at least one lead screw extending in the vertical direction. The compensator is connected to the cradle and can be moved by the lead screw in the vertical direction. The compensator includes a driver cooperating with the lead screw and is guided in the vertical direction on the column. The compensator has a spring element which is biased and supported by the driver.

Abstract: A handling device for positioning a test head, in particular at a test station, is provided with positioning means enabling the test head to be positioned with respect to three dimensions. The handling device also has a mounting on which the test head can be attached and which is connected to the positioning means. The handling device is also provided with a fastening plate which is movably mounted and a compliance module by means of which the fastening plate can be moved between a starting position (I) and an end position (II, III) against the effect of a return force. The compliance module comprises a housing, a spindle, a first sliding bushing and a second sliding bushing which are arranged in a movable manner on the spindle between a first stop and a second stop, and a spring element arranged between the sliding bushings and which impinges on the sliding bushings. The sliding bushings are movable relative to the housing. The compliance module permits bi-directional compliance of the test head.

Abstract: A manipulator for positioning a test head, particularly at a tester is provided with a positioner for positioning the test head three-dimensionally and forming a mount. The manipulator comprises furthermore a cradle to which the test head can be secured and which is connected to the positioner. The cradle is connected to a plate comprising at least one first supporting point. The plate is pivotally mounted at the first supporting point about a first axis. To achieve, on the one hand, precise adjustment and, on the other, a certain compliance, the first supporting point is movable between a starting position and an end position relative to the mount in overcoming the effect of a return force.

Abstract: A device for picking up, transporting and sorting electronic components in particular integrated circuits includes at least one loading device, one transport device, and one unloading device. The transport device has at least one transport wheel which is rotatable around a rotation axis and which has a peripheral face. The transport device also has at least one pick-up module which is arranged at the peripheral face and is suitable for accommodating components. In addition, the transport device is provided with a pressure source which is connected to the pick-up module. The pick-up module has at least one pick-up space for one individual component which extends along the peripheral face and can be moved between an initial position and an end position. The pressure source enables a prescribed pressure to be exerted at the pick-up space by means of which the component can be retained at the pick-up space or can be ejected from the pick-up space.

Abstract: A manipulator for positioning a test head, particularly at a tester is provided with positioning means for positioning the test head three-dimensionally and forming a mount. The manipulator comprises furthermore a cradle to which the test head can be secured and which is connected to the positioning means. The cradle is connected to a plate comprising at least one first supporting point. The plate is pivotally mounted at the first supporting point about a first axis. To achieve, on the one hand, precise adjustment and, on the other, a certain compliance, the first supporting point is movable between a starting position and an end position relative to the mount in overcoming the effect of a return force.

Abstract: Disclosed is a handling device, especially for positioning a test head on a testing device, including a holder for a test head and a column. Positioning apparatus adjustable in a vertical direction is connected to the test head on the column. The handling device advantageously has a simple and compact structure and an exactly reproducible, smooth movement of the test head, because the positioning apparatus has at least one pair of interspaced articulated arms in which one end thereof is respectively articulated on the holder and the other end thereof is articulated on a carriage which can be displaced in a horizontal direction. The articulated arms can be pivotably arranged around a vertical axis. The carriages can move independently from each other.

Abstract: The invention relates to a handling device, especially for positioning a test head (40) on a testing device, comprising a holder (30) for a test head (30) and a column (10). Positioning means (20) which are adjustable in a vertical direction are connected to the test head (40) on said column (10). The inventive handling device has a simple and compact structure and is characterized by an exactly reproducible, smooth movement of the test head (40), the reason therefor being that the positioning means (20) are provided with at least one pair of interspaced articulated arms (21a, 22a, 22b) whereby one end thereof is respectively articulated on the holder (30) and the other end thereof is articulated on a carriage which can be displaced in a horizontal direction. The a arms (21a, 22a, 22b) can be pivotably arranged around a vertical axis. The carriages (23a, 23b) can move independently from each other.