Patents by Inventor Huchen Xie

Huchen Xie has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for simulating a two-dimensional radiation intensity distribution of photon or electron beams
    Patent number: 5526395
    Abstract: To simulate radiation intensity distribution of a radiation beam having a field region, a penumbra region, and a scatter tail region changes in radiation intensity distribution of a reference radiation beam in the penumbra region at a reference distance from the radiation source are determined. Next, radiation intensity distribution, at the reference distance, of a radiation beam of arbitrary shape, in the field and tail regions is determined. The radiation intensity distribution of the radiation beam of arbitrary shape is simulated by superimposing the changes in radiation intensity of the reference radiation beam in the penumbra region on to the radiation intensity of the radiation beam of arbitrary shape in the field region and the tail region.
    Type: Grant
    Filed: January 6, 1995
    Date of Patent: June 11, 1996
    Assignee: The United States of America as represented by the Secretary of the Department of Health and Human Services
    Inventors: Johannes van de Geijn, Huchen Xie