Patents by Inventor Huey W. Huang

Huey W. Huang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Time resolved extended X-ray absorption fine structure spectrometer
    Patent number: 4612660
    Abstract: The present invention relates to an X-ray spectrometer for obtaining EXAFS data from a target material. The target material is exposed to incident pulsed synchrotron/X-ray radiation having a selected range of continuous spectrum and intensity suitable for obtaining EXAFS data from the material. The transmitted or fluorescence X-rays is detected and integrated over a period of time. The integrator is controlled by a gate synchronous with the pulsed radiation. The integration time of the integrator can be varied. A xenon flash is provided for exciting appropriate materials and is controlled by a gating device which is also synchronized with the radiation pulses.
    Type: Grant
    Filed: May 17, 1985
    Date of Patent: September 16, 1986
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventor: Huey W. Huang