Patents by Inventor Hui-Wen Lin
Hui-Wen Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11987566Abstract: The present invention provides a novel compound for effectively preventing nerve damage and protecting nerves, and a preparation method thereof. Besides, the present invention also provides a pharmaceutical composition comprising the novel compound, and a use of the novel compound for preventing nerve damage and protecting nerves.Type: GrantFiled: January 28, 2022Date of Patent: May 21, 2024Assignee: GENHEALTH PHARMA CO., LTD.Inventors: Lain-Tze Lee, Hui-Ping Tsai, Yi-Wen Lin, Shu-Fen Huang, Shih-Hung Liu, Chin-Wei Liu, Pi-Tsan Huang, Mei-Hui Chen
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Publication number: 20240163768Abstract: A packet transmission method is provided. The packet transmission method may be applied to an apparatus. The packet transmission method may include the following steps. A path engine circuit of the apparatus may receive a packet from a modem circuit of the apparatus or from a Wi-Fi chip of the apparatus. Then, the path engine circuit may transmit the packet from the modem circuit to the Wi-Fi chip, or transmit the packet from the Wi-Fi chip to the modem circuit or a central processing unit (CPU) of the apparatus.Type: ApplicationFiled: November 8, 2023Publication date: May 16, 2024Inventors: Yen-Hsiung TSENG, Wei-Wen LIN, Chi-Fu KOH, Jyh-Ding HU, Hui-Ping TSENG
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Publication number: 20240163947Abstract: A method for multi-link operation (MLO) is provided. The method for MLO may be applied to an apparatus. The method for MLO may include the following steps. A multi-chip controller of the apparatus may assign different data to a plurality of chips of the apparatus, wherein each chip corresponds to one link of multi-links. Each chip may determine whether transmission of the assigned data has failed. A first chip of the chips may transmit the assigned data to an access point (AP) in response to the first chip determining that the transmission of the assigned data has not failed.Type: ApplicationFiled: November 8, 2023Publication date: May 16, 2024Inventors: Cheng-Ying WU, Wei-Wen LIN, Shu-Min CHENG, Hui-Ping TSENG, Chi-Han HUANG, Chih-Chun KUO, Yang-Hung PENG, Hao-Hua KANG
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Patent number: 11963969Abstract: Provided is a pharmaceutical composition including gastrodin and a use thereof for the prevention or the treatment of amyotrophic lateral sclerosis. The pharmaceutical composition is effective in reducing neuronal axon degeneration and neurofibromin accumulation, improving symptoms of amyotrophic lateral sclerosis and extending life of patients of amyotrophic lateral sclerosis.Type: GrantFiled: September 16, 2022Date of Patent: April 23, 2024Assignee: BUDDHIST TZU CHI MEDICAL FOUNDATIONInventors: Chia-Yu Chang, Shinn-Zong Lin, Hsiao-Chien Ting, Hui-I Yang, Horng-Jyh Harn, Hong-Lin Su, Ching-Ann Liu, Yu-Shuan Chen, Tzyy-Wen Chiou, Tsung-Jung Ho
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Patent number: 11966077Abstract: A light emission apparatus includes a laser diode configured to emit a light; a laser driver electrically coupled to the laser diode, the laser driver being configured to drive the laser diode to generate the light; and an optical module arranged to receive the light emitted by the laser diode, the optical module comprising at least one optical element and being configured to adjust the light and emits a transmitting light; wherein the transmitting light emits from the optical module with an illumination angle and the optical module adjusts the light to vary the illumination angle.Type: GrantFiled: July 8, 2019Date of Patent: April 23, 2024Assignee: Artilux, Inc.Inventors: Yun-Chung Na, Chien-Lung Chen, Chieh-Ting Lin, Yu-Yi Hsu, Hui-Wen Chen, Bo-Jiun Chen, Shih-Tai Chuang
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Patent number: 11894443Abstract: A method of making a semiconductor device includes depositing a TiN layer over a substrate. The method further includes doping a first portion of the TiN layer using an oxygen-containing plasma treatment. The method further includes doping a second portion of the TiN layer using a nitrogen-containing plasma treatment, wherein the second portion of the TiN layer directly contacts the first portion of the TiN layer. The method further includes forming a first metal gate electrode over the first portion of the TiN layer. The method further includes forming a second metal gate electrode over the second portion of the TiN layer, wherein the first metal gate electrode has a different work function from the second metal gate electrode, and the second metal gate electrode directly contacts the first metal gate electrode.Type: GrantFiled: June 16, 2022Date of Patent: February 6, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Ming Zhu, Hui-Wen Lin, Harry Hak-Lay Chuang, Bao-Ru Young, Yuan-Sheng Huang, Ryan Chia-Jen Chen, Chao-Cheng Chen, Kuo-Cheng Ching, Ting-Hua Hsieh, Carlos H. Diaz
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Publication number: 20230317529Abstract: Disclosed herein are integrated circuit (IC) structures and methods for fabricating and testing such IC structures prior to dicing from a semiconductor wafer on which the IC structures are formed. In one example, a method for fabricating an IC structure includes contacting a first plurality of test pads of the IC structure with one or more test probes. The first plurality of test pads are disposed within or on a first dielectric layer within a scribe lane, i.e., a test region. A first metal layer is formed over the first plurality of test pads if a predefined test criteria is met as determined using information obtained through first plurality of test pads using the one or more test probes. The first metal layer is a layer formed in a die region of an IC die that is being fabricated in the wafer.Type: ApplicationFiled: April 1, 2022Publication date: October 5, 2023Inventors: Yan WANG, I-Ru CHEN, Nui CHONG, Hui-Wen LIN
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Publication number: 20220320314Abstract: A method of making a semiconductor device includes depositing a TiN layer over a substrate. The method further includes doping a first portion of the TiN layer using an oxygen-containing plasma treatment. The method further includes doping a second portion of the TiN layer using a nitrogen-containing plasma treatment, wherein the second portion of the TiN layer directly contacts the first portion of the TiN layer. The method further includes forming a first metal gate electrode over the first portion of the TiN layer. The method further includes forming a second metal gate electrode over the second portion of the TiN layer, wherein the first metal gate electrode has a different work function from the second metal gate electrode, and the second metal gate electrode directly contacts the first metal gate electrode.Type: ApplicationFiled: June 16, 2022Publication date: October 6, 2022Inventors: Ming ZHU, Hui-Wen LIN, Harry Hak-Lay CHUANG, Bao-Ru YOUNG, Yuan-Sheng HUANG, Ryan Chia-Jen CHEN, Chao-Cheng CHEN, Kuo-Cheng CHING, Ting-Hua HSIEH, Carlos H. DIAZ
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Patent number: 11380775Abstract: A complementary metal-oxide-semiconductor (CMOS) semiconductor device includes a substrate. The CMOS semiconductor device further includes an isolation region in the substrate. The CMOS semiconductor device further includes a P-metal gate electrode extending over the isolation region, wherein the P-metal gate electrode includes a first function metal and a TiN layer doped with a first material. The CMOS semiconductor device further includes an N-metal gate electrode extending over the isolation region, wherein the N-metal gate electrode includes a second function metal and a TiN layer doped with a second material different from the first material, a portion of the P-metal gate electrode is between a portion of the N-metal gate electrode and the substrate, and a portion of the TiN layer doped with the second material is between the portion of the P-metal gate electrode and the substrate.Type: GrantFiled: January 31, 2020Date of Patent: July 5, 2022Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Ming Zhu, Hui-Wen Lin, Harry Hak-Lay Chuang, Bao-Ru Young, Yuan-Sheng Huang, Ryan Chia-Jen Chen, Chao-Cheng Chen, Kuo-Cheng Ching, Ting-Hua Hsieh, Carlos H. Diaz
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Patent number: 11164749Abstract: Examples described herein provide a method for reducing warpage when stacking semiconductor substrates. In an example, a first substrate is bonded with a second substrate to form a stack. The first substrate comprises a first semiconductor substrate, and the second substrate comprises a second semiconductor substrate. The second semiconductor substrate is thinned, and a first trench is etched into a backside of the thinned second semiconductor substrate. A first stressed material is deposited into the first trench.Type: GrantFiled: September 16, 2019Date of Patent: November 2, 2021Assignee: XILINX, INC.Inventors: Nui Chong, Hui-Wen Lin
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Patent number: 11119146Abstract: Examples described herein generally relate to testing of bonded wafers and structures implemented for such testing. In an example method, power is applied to a first pad on a stack of bonded wafers. A wafer of the stack includes a process control monitor (PCM) region that includes structure regions. Each structure region is a device under test region, dummy region, and/or chain interconnect region (CIR). The stack includes a serpentine chain test structure (SCTS) electrically connected between first and second metal features in the wafer in first and second CIRs, respectively, in the PCM region. The SCTS includes segments, one or more of which are disposed between neighboring structure regions in the PCM region that are not the first and second CIRs. A signal is detected from a second pad on the stack. The first and second pads are electrically connected to the first and second metal features, respectively.Type: GrantFiled: August 19, 2020Date of Patent: September 14, 2021Assignee: XILINX, INC.Inventors: Nui Chong, Yan Wang, Hui-Wen Lin
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Patent number: 11114344Abstract: Integrated circuit (IC) dies and method for manufacturing the same are described herein that mitigate pattern loading effects during manufacture. In one example, the IC includes a die body having a first circuit block separated from an adjacent second circuit block by a buffer zone. The first and second circuit blocks have first and second transistors that are at least partially fabricated from a gate metal layer and disposed immediately adjacent the buffer zone. A dummy structure is formed in the buffer zone and is also at least partially fabricated from the gate metal layer. An amount of gate metal layer material in the dummy structure is selected to mitigate differences in the amount of gate metal layer material in regions of first and second circuit blocks that neighbor each other across the buffer zone.Type: GrantFiled: February 28, 2020Date of Patent: September 7, 2021Assignee: XILINX, INC.Inventors: Hui-Wen Lin, Nui Chong, Myongseob Kim, Henley Liu, Ping-Chin Yeh, Cheang-whang Chang
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Patent number: 11094545Abstract: A method forming a gate dielectric over a substrate, and forming a metal gate structure over the semiconductor substrate and the gate dielectric. The metal gate structure includes a first metal material. The method further includes forming a seal on sidewalls of the metal gate structure. The method further includes forming a dielectric film on the metal gate structure, the dielectric film including a first metal oxynitride comprising the first metal material and directly on the metal gate structure without extending over the seal formed on sidewalls of the metal gate structure.Type: GrantFiled: July 16, 2019Date of Patent: August 17, 2021Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Jin-Aun Ng, Bao-Ru Young, Harry-Hak-Lay Chuang, Maxi Chang, Chih-Tang Peng, Chih-Yang Yeh, Ta-Wei Lin, Huan-Just Lin, Hui-Wen Lin, Jen-Sheng Yang, Pei-Ren Jeng, Jung-Hui Kao, Shih-Hao Lo, Yuan-Tien Tu
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Patent number: 10720377Abstract: Examples described herein provide for an electronic device apparatus with multiple thermally conductive paths for heat dissipation. In an example, an electronic device apparatus includes a package comprising a die attached to a package substrate. The electronic device apparatus further includes a ring stiffener disposed around the die and on the package substrate, a heat sink disposed on the package, and a wedge disposed between the heat sink and the ring stiffener.Type: GrantFiled: November 9, 2018Date of Patent: July 21, 2020Assignee: XILINX, INC.Inventors: Gamal Refai-Ahmed, Ho Hyung Lee, Hui-Wen Lin, Henley Liu, Suresh Ramalingam
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Publication number: 20200168721Abstract: A complementary metal-oxide-semiconductor (CMOS) semiconductor device includes a substrate. The CMOS semiconductor device further includes an isolation region in the substrate. The CMOS semiconductor device further includes a P-metal gate electrode extending over the isolation region, wherein the P-metal gate electrode includes a first function metal and a TiN layer doped with a first material. The CMOS semiconductor device further includes an N-metal gate electrode extending over the isolation region, wherein the N-metal gate electrode includes a second function metal and a TiN layer doped with a second material different from the first material, a portion of the P-metal gate electrode is between a portion of the N-metal gate electrode and the substrate, and a portion of the TiN layer doped with the second material is between the portion of the P-metal gate electrode and the substrate.Type: ApplicationFiled: January 31, 2020Publication date: May 28, 2020Inventors: Ming ZHU, Hui-Wen LIN, Harry Hak-Lay CHUANG, Bao-Ru YOUNG, Yuan-Sheng HUANG, Ryan Chia-Jen CHEN, Chao-Cheng CHEN, Kuo-Cheng CHING, Ting-Hua HSIEH, Carlos H. DIAZ
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Publication number: 20200152546Abstract: Examples described herein provide for an electronic device apparatus with multiple thermally conductive paths for heat dissipation. In an example, an electronic device apparatus includes a package comprising a die attached to a package substrate. The electronic device apparatus further includes a ring stiffener disposed around the die and on the package substrate, a heat sink disposed on the package, and a wedge disposed between the heat sink and the ring stiffener.Type: ApplicationFiled: November 9, 2018Publication date: May 14, 2020Applicant: Xilinx, Inc.Inventors: Gamal Refai-Ahmed, Ho Hyung Lee, Hui-Wen Lin, Henley Liu, Suresh Ramalingam
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Patent number: 10553699Abstract: A CMOS semiconductor device includes a substrate comprising an isolation region separating a P-active region and an N-active region. The CMOS semiconductor device further includes a P-metal gate electrode over the P-active region and extending over the isolation region, wherein the P-metal gate electrode includes a P-work function metal and a doped TiN layer between the P-work function metal and substrate. The CMOS semiconductor device further includes an N-metal gate electrode over the N-active region and extending over the isolation region, wherein the N-metal gate electrode includes an N-work function metal and a nitrogen-rich TiN layer between the N-work function metal and substrate, wherein a portion of the P-metal gate electrode is between a portion of the N-metal gate electrode and the substrate.Type: GrantFiled: May 21, 2018Date of Patent: February 4, 2020Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Ming Zhu, Hui-Wen Lin, Harry Hak-Lay Chuang, Bao-Ru Young, Yuan-Sheng Huang, Ryan Chia-jen Chen, Chao-Cheng Chen, Kuo-Cheng Ching, Ting-Hua Hsieh, Carlos H. Diaz
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Publication number: 20190341263Abstract: A method forming a gate dielectric over a substrate, and forming a metal gate structure over the semiconductor substrate and the gate dielectric. The metal gate structure includes a first metal material. The method further includes forming a seal on sidewalls of the metal gate structure. The method further includes forming a dielectric film on the metal gate structure, the dielectric film including a first metal oxynitride comprising the first metal material and directly on the metal gate structure without extending over the seal formed on sidewalls of the metal gate structure.Type: ApplicationFiled: July 16, 2019Publication date: November 7, 2019Inventors: Jin-Aun Ng, Bao-Ru Young, Harry-Hak-Lay Chuang, Maxi Chang, Chih-Tang Peng, Chih-Yang Yeh, Ta-Wei Lin, Huan-Just Lin, Hui-Wen Lin, Jen-Sheng Yang, Pei-Ren Jeng, Jung-Hui Kao, Shih-Hao Lo, Yuan-Tien Tu
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Patent number: 10388531Abstract: An integrated circuit includes a semiconductor substrate, a gate dielectric over the substrate, and a metal gate structure over the semiconductor substrate and the gate dielectric. The metal gate structure includes a first metal material. The integrated circuit further includes a seal formed on sidewalls of the metal gate structure. The integrated circuit further includes a dielectric film on the metal gate structure, the dielectric film including a first metal oxynitride comprising the first metal material and directly on the metal gate structure without extending over the seal formed on sidewalls of the metal gate structure.Type: GrantFiled: September 27, 2017Date of Patent: August 20, 2019Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Jin-Aun Ng, Bao-Ru Young, Harry-Hak-Lay Chuang, Maxi Chang, Chih-Tang Peng, Chih-Yang Yeh, Ta-Wei Lin, Huan-Just Lin, Hui-Wen Lin, Jen-Sheng Yang, Pei-Ren Jeng, Jung-Hui Kao, Shih-Hao Lo, Yuan-Tien Tu
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Publication number: 20180277654Abstract: A CMOS semiconductor device includes a substrate comprising an isolation region separating a P-active region and an N-active region. The CMOS semiconductor device further includes a P-metal gate electrode over the P-active region and extending over the isolation region, wherein the P-metal gate electrode includes a P-work function metal and a doped TiN layer between the P-work function metal and substrate. The CMOS semiconductor device further includes an N-metal gate electrode over the N-active region and extending over the isolation region, wherein the N-metal gate electrode includes an N-work function metal and a nitrogen-rich TiN layer between the N-work function metal and substrate, wherein a portion of the P-metal gate electrode is between a portion of the N-metal gate electrode and the substrate.Type: ApplicationFiled: May 21, 2018Publication date: September 27, 2018Inventors: Ming ZHU, Hui-Wen LIN, Harry Hak-Lay CHUANG, Bao-Ru YOUNG, Yuan-Sheng HUANG, Ryan Chia-Jen CHEN, Chao-Cheng CHEN, Kuo-Cheng CHING, Ting-Hua HSIEH, Carlos H. DIAZ