Patents by Inventor Hui Jin LEE

Hui Jin LEE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11955081
    Abstract: A pixel includes: a storage capacitor connected between a first power supply voltage and a gate node; a first transistor including a gate electrode connected to the gate node; a second transistor to transfer a data signal to a source of the first transistor in response to a scan signal; a third transistor to diode-connect the first transistor in response to the scan signal, and including first and second sub-transistors serially connected between the gate node and a drain of the first transistor; a fourth transistor to transfer an initialization voltage to the gate node in response to an initialization signal, and including third and fourth sub-transistors serially connected between the gate node and the initialization voltage; and an organic light emitting diode including a cathode connected to a second power supply voltage. At least one of the second and fourth sub-transistors includes a bottom electrode.
    Type: Grant
    Filed: August 8, 2020
    Date of Patent: April 9, 2024
    Assignee: Samsung Display Co., Ltd.
    Inventors: Hyo Jin Lee, Joon-Chul Goh, Sangan Kwon, Hong Soo Kim, Hui Nam, Jin Young Roh, Sehyuk Park
  • Patent number: 10181086
    Abstract: An image analysis method for extracting features of an image and an apparatus for the same are disclosed. An image analysis method performed in an image analysis apparatus may comprise extracting a plurality of features for a plurality of sample images through a pre-learned model to extract features from the plurality of sample images; determining a plurality of target features representing final features to be extracted through the image analysis apparatus; encoding the plurality of features based on a probability distribution of the plurality of target features for the plurality of features; and analyzing a plurality of analysis target images based on the plurality of encoded features when the plurality of analysis target images are received.
    Type: Grant
    Filed: February 24, 2017
    Date of Patent: January 15, 2019
    Assignee: POSTECH ACADEMY-INDUSTRY FOUNDATION
    Inventors: Seung Yong Lee, Hui Jin Lee
  • Publication number: 20180197032
    Abstract: An image analysis method for extracting features of an image and an apparatus for the same are disclosed. An image analysis method performed in an image analysis apparatus may comprise extracting a plurality of features for a plurality of sample images through a pre-learned model to extract features from the plurality of sample images; determining a plurality of target features representing final features to be extracted through the image analysis apparatus; encoding the plurality of features based on a probability distribution of the plurality of target features for the plurality of features; and analyzing a plurality of analysis target images based on the plurality of encoded features when the plurality of analysis target images are received.
    Type: Application
    Filed: February 24, 2017
    Publication date: July 12, 2018
    Inventors: Seung Yong LEE, Hui Jin LEE