Patents by Inventor Hyun-Kwon Jung

Hyun-Kwon Jung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220339988
    Abstract: Disclosed is a vehicle air conditioner capable of increasing the aft flow effective region of an inner flow path by reducing the space occupied by support parts of doors for opening/closing a plurality of regions. The vehicle air conditioner comprises: an air-conditioning case in which an air flow path is formed; and a cooling heat exchanger and a heating heat exchanger provided in the air flow path of the air-conditioning case, wherein the air flow path is partitioned and divided into a plurality of regions, and has a plurality of doors for opening/closing each region and a shaft for driving the doors, and the distance between one door and the shaft is different from the distance between another door and the shaft.
    Type: Application
    Filed: November 25, 2020
    Publication date: October 27, 2022
    Inventors: Chan Joo MAENG, Young Keun KIM, Ki Man JEON, Hyun Kwon JUNG, Gyu Ik HAN
  • Patent number: 11215442
    Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.
    Type: Grant
    Filed: May 20, 2020
    Date of Patent: January 4, 2022
    Assignee: Hexagon Metrology, Inc.
    Inventors: Paul Ferrari, Hyun Kwon Jung
  • Publication number: 20200386536
    Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.
    Type: Application
    Filed: May 20, 2020
    Publication date: December 10, 2020
    Inventors: Paul Ferrari, Hyun Kwon Jung
  • Patent number: 10663284
    Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.
    Type: Grant
    Filed: July 5, 2018
    Date of Patent: May 26, 2020
    Assignee: Hexagon Metrology, Inc.
    Inventors: Paul Ferrari, Hyun Kwon Jung
  • Patent number: 10317186
    Abstract: An articulating probe for use with a coordinate measuring machine comprises an attachment portion, a measuring portion, and at least one articulating joint. The attachment portion can be configured for attachment to a coordinate measuring machine. The measuring portion can be configured to contact an object to be measured by the coordinate measuring machine. The at least one articulating joint can be configured to allow rotation between the attachment portion and the measuring portion. Further, the articulating joint can comprise an angular sensor configured to measure an angle of the joint.
    Type: Grant
    Filed: August 8, 2017
    Date of Patent: June 11, 2019
    Assignee: HEXAGON METROLOGY, INC.
    Inventors: Paul Ferrari, Hyun Kwon Jung, James F. McKnight
  • Publication number: 20190033055
    Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.
    Type: Application
    Filed: July 5, 2018
    Publication date: January 31, 2019
    Inventors: Paul Ferrari, Hyun Kwon Jung
  • Patent number: 10036627
    Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.
    Type: Grant
    Filed: September 17, 2015
    Date of Patent: July 31, 2018
    Assignee: Hexagon Metrology, Inc.
    Inventors: Paul Ferrari, Hyun Kwon Jung
  • Publication number: 20180073850
    Abstract: An articulating probe for use with a coordinate measuring machine comprises an attachment portion, a measuring portion, and at least one articulating joint. The attachment portion can be configured for attachment to a coordinate measuring machine. The measuring portion can be configured to contact an object to be measured by the coordinate measuring machine. The at least one articulating joint can be configured to allow rotation between the attachment portion and the measuring portion. Further, the articulating joint can comprise an angular sensor configured to measure an angle of the joint.
    Type: Application
    Filed: August 8, 2017
    Publication date: March 15, 2018
    Inventors: Paul Ferrari, Hyun Kwon Jung, James F. McKnight
  • Patent number: 9759540
    Abstract: An articulating probe for use with a coordinate measuring machine comprises an attachment portion, a measuring portion, and at least one articulating joint. The attachment portion can be configured for attachment to a coordinate measuring machine. The measuring portion can be configured to contact an object to be measured by the coordinate measuring machine. The at least one articulating joint can be configured to allow rotation between the attachment portion and the measuring portion. Further, the articulating joint can comprise an angular sensor configured to measure an angle of the joint.
    Type: Grant
    Filed: June 8, 2015
    Date of Patent: September 12, 2017
    Assignee: Hexagon Metrology, Inc.
    Inventors: Paul Ferrari, Hyun Kwon Jung, James F. McKnight
  • Publication number: 20160084633
    Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.
    Type: Application
    Filed: September 17, 2015
    Publication date: March 24, 2016
    Inventors: Paul Ferrari, Hyun Kwon Jung
  • Patent number: 9250214
    Abstract: A flaw detection system includes a CMM having a base and one or more transfer members, one or more articulation members connecting the one or more transfer members to the base, and a flaw detection sensor at a distal end, the CMM being configured to measure a location of the flaw detection sensor, and a processor configured to correlate the location of the flaw detection sensor as measured by the CMM with data detected by the flaw detection sensor.
    Type: Grant
    Filed: March 12, 2013
    Date of Patent: February 2, 2016
    Assignee: Hexagon Metrology, Inc.
    Inventors: Paul Ferrari, Hyun Kwon Jung, Hogar Tait
  • Publication number: 20150362305
    Abstract: An articulating probe for use with a coordinate measuring machine comprises an attachment portion, a measuring portion, and at least one articulating joint. The attachment portion can be configured for attachment to a coordinate measuring machine. The measuring portion can be configured to contact an object to be measured by the coordinate measuring machine. The at least one articulating joint can be configured to allow rotation between the attachment portion and the measuring portion. Further, the articulating joint can comprise an angular sensor configured to measure an angle of the joint.
    Type: Application
    Filed: June 8, 2015
    Publication date: December 17, 2015
    Inventors: Paul Ferrari, Hyun Kwon Jung, James F. McKnight
  • Publication number: 20140260627
    Abstract: A flaw detection system includes a CMM having a base and one or more transfer members, one or more articulation members connecting the one or more transfer members to the base, and a flaw detection sensor at a distal end, the CMM being configured to measure a location of the flaw detection sensor, and a processor configured to correlate the location of the flaw detection sensor as measured by the CMM with data detected by the flaw detection sensor.
    Type: Application
    Filed: March 12, 2013
    Publication date: September 18, 2014
    Inventors: Paul Ferrari, Hyun Kwon Jung, Hogar Tait
  • Publication number: 20030007595
    Abstract: A method of reconstructing a tomogram of an X-ray apparatus. The tomogram reconstructing method includes obtaining model information and a transmission image of a subject. A tomogram is reconstructed from the transmission image using the model information. The reconstructed tomogram obtained is then displayed.
    Type: Application
    Filed: January 24, 2002
    Publication date: January 9, 2003
    Inventors: Hyeong-Cheol Kim, Won Choi, Jae-Hyun Jung, Yong-Won Kim, Hyoung-Jo Jeon, Seung-Hwan Choi, Hyun-Kwon Jung, Kwang-Jun Yoon, Jun-Bo Kim, Kyoung-Mu Lee
  • Patent number: 6501823
    Abstract: A method of reconstructing a tomogram of an X-ray apparatus. The tomogram reconstructing method includes obtaining model information and a transmission image of a subject. A tomogram is reconstructed from the transmission image using the model information. The reconstructed tomogram obtained is then displayed.
    Type: Grant
    Filed: January 24, 2002
    Date of Patent: December 31, 2002
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hyeong-Cheol Kim, Won Choi, Jae-Hyun Jung, Yong-Won Kim, Hyoung-Jo Jeon, Seung-Hwan Choi, Hyun-Kwon Jung, Kwang-Jun Yoon, Jun-Bo Kim, Kyoung-Mu Lee
  • Publication number: 20020166802
    Abstract: Disclosed herein is a battery inspection system. The battery inspection system includes a battery feeding conveyor for feeding batteries to be inspected. One or more transfer robots are positioned near the rear end of the battery feeding conveyor for transferring batteries fed through the battery feeding conveyor to inspection and discharge positions. An X-ray generator is positioned under the transfer robots for applying X-rays to batteries transferred by the transfer robots. A satisfactory battery discharging conveyor is positioned near the transfer robots for discharging satisfactory battery moved by the transfer robots and having been inspected. A defective battery discharging robot is positioned near the front end of the satisfactory battery discharging conveyor for removing defective batteries from batteries moving along the satisfactory battery discharging conveyor and having been inspected.
    Type: Application
    Filed: October 1, 2001
    Publication date: November 14, 2002
    Inventors: Jae-Hyun Jung, Kwang-Jun Yoon, Hyeong-Cheol Kim, Yong-Won Kim, Won Choi, Hyoung-Jo Jeon, Hyun-Kwon Jung
  • Patent number: 6480002
    Abstract: Disclosed herein is a battery inspection system. The battery inspection system includes a battery feeding conveyor for feeding batteries to be inspected. One or more transfer robots are positioned near the rear end of the battery feeding conveyor for transferring batteries fed through the battery feeding conveyor to inspection and discharge positions. An X-ray generator is positioned under the transfer robots for applying X-rays to batteries transferred by the transfer robots. A satisfactory battery discharging conveyor is positioned near the transfer robots for discharging satisfactory battery moved by the transfer robots and having been inspected. A defective battery discharging robot is positioned near the front end of the satisfactory battery discharging conveyor for removing defective batteries from batteries moving along the satisfactory battery discharging conveyor and having been inspected.
    Type: Grant
    Filed: October 1, 2001
    Date of Patent: November 12, 2002
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jae-Hyun Jung, Kwang-Jun Yoon, Hyeong-Cheol Kim, Yong-Won Kim, Won Choi, Hyoung-Jo Jeon, Hyun-Kwon Jung
  • Patent number: 6415014
    Abstract: Disclosed herein is a three-dimensional image constructing method using an X-ray apparatus. In the three-dimensional image constructing method, a construction space of a subject and information for the construction space are set. Thereafter, a plurality of transmission images of the subject are obtained. The data of the construction space are calculated on the basis of the information for the construction space set at the setting step and the transmission images obtained at the image obtaining step. The construction space is constructed on the basis of the data calculated at the image processing step.
    Type: Grant
    Filed: October 1, 2001
    Date of Patent: July 2, 2002
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hyeong-Cheol Kim, Hyoung-Jo Jeon, Jae-Hyun Jung, Yong-Won Kim, Won Choi, Kwang-Jun Yoon, Hyun-Kwon Jung, Jun-Bo Kim, Jae-Wan Kim, Young-Jun Roh, Hyung-Suck Cho