Patents by Inventor Hyun-Kwon Jung
Hyun-Kwon Jung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20220339988Abstract: Disclosed is a vehicle air conditioner capable of increasing the aft flow effective region of an inner flow path by reducing the space occupied by support parts of doors for opening/closing a plurality of regions. The vehicle air conditioner comprises: an air-conditioning case in which an air flow path is formed; and a cooling heat exchanger and a heating heat exchanger provided in the air flow path of the air-conditioning case, wherein the air flow path is partitioned and divided into a plurality of regions, and has a plurality of doors for opening/closing each region and a shaft for driving the doors, and the distance between one door and the shaft is different from the distance between another door and the shaft.Type: ApplicationFiled: November 25, 2020Publication date: October 27, 2022Inventors: Chan Joo MAENG, Young Keun KIM, Ki Man JEON, Hyun Kwon JUNG, Gyu Ik HAN
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Patent number: 11215442Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.Type: GrantFiled: May 20, 2020Date of Patent: January 4, 2022Assignee: Hexagon Metrology, Inc.Inventors: Paul Ferrari, Hyun Kwon Jung
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Publication number: 20200386536Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.Type: ApplicationFiled: May 20, 2020Publication date: December 10, 2020Inventors: Paul Ferrari, Hyun Kwon Jung
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Patent number: 10663284Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.Type: GrantFiled: July 5, 2018Date of Patent: May 26, 2020Assignee: Hexagon Metrology, Inc.Inventors: Paul Ferrari, Hyun Kwon Jung
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Patent number: 10317186Abstract: An articulating probe for use with a coordinate measuring machine comprises an attachment portion, a measuring portion, and at least one articulating joint. The attachment portion can be configured for attachment to a coordinate measuring machine. The measuring portion can be configured to contact an object to be measured by the coordinate measuring machine. The at least one articulating joint can be configured to allow rotation between the attachment portion and the measuring portion. Further, the articulating joint can comprise an angular sensor configured to measure an angle of the joint.Type: GrantFiled: August 8, 2017Date of Patent: June 11, 2019Assignee: HEXAGON METROLOGY, INC.Inventors: Paul Ferrari, Hyun Kwon Jung, James F. McKnight
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Publication number: 20190033055Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.Type: ApplicationFiled: July 5, 2018Publication date: January 31, 2019Inventors: Paul Ferrari, Hyun Kwon Jung
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Patent number: 10036627Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.Type: GrantFiled: September 17, 2015Date of Patent: July 31, 2018Assignee: Hexagon Metrology, Inc.Inventors: Paul Ferrari, Hyun Kwon Jung
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Publication number: 20180073850Abstract: An articulating probe for use with a coordinate measuring machine comprises an attachment portion, a measuring portion, and at least one articulating joint. The attachment portion can be configured for attachment to a coordinate measuring machine. The measuring portion can be configured to contact an object to be measured by the coordinate measuring machine. The at least one articulating joint can be configured to allow rotation between the attachment portion and the measuring portion. Further, the articulating joint can comprise an angular sensor configured to measure an angle of the joint.Type: ApplicationFiled: August 8, 2017Publication date: March 15, 2018Inventors: Paul Ferrari, Hyun Kwon Jung, James F. McKnight
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Patent number: 9759540Abstract: An articulating probe for use with a coordinate measuring machine comprises an attachment portion, a measuring portion, and at least one articulating joint. The attachment portion can be configured for attachment to a coordinate measuring machine. The measuring portion can be configured to contact an object to be measured by the coordinate measuring machine. The at least one articulating joint can be configured to allow rotation between the attachment portion and the measuring portion. Further, the articulating joint can comprise an angular sensor configured to measure an angle of the joint.Type: GrantFiled: June 8, 2015Date of Patent: September 12, 2017Assignee: Hexagon Metrology, Inc.Inventors: Paul Ferrari, Hyun Kwon Jung, James F. McKnight
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Publication number: 20160084633Abstract: A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.Type: ApplicationFiled: September 17, 2015Publication date: March 24, 2016Inventors: Paul Ferrari, Hyun Kwon Jung
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Patent number: 9250214Abstract: A flaw detection system includes a CMM having a base and one or more transfer members, one or more articulation members connecting the one or more transfer members to the base, and a flaw detection sensor at a distal end, the CMM being configured to measure a location of the flaw detection sensor, and a processor configured to correlate the location of the flaw detection sensor as measured by the CMM with data detected by the flaw detection sensor.Type: GrantFiled: March 12, 2013Date of Patent: February 2, 2016Assignee: Hexagon Metrology, Inc.Inventors: Paul Ferrari, Hyun Kwon Jung, Hogar Tait
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Publication number: 20150362305Abstract: An articulating probe for use with a coordinate measuring machine comprises an attachment portion, a measuring portion, and at least one articulating joint. The attachment portion can be configured for attachment to a coordinate measuring machine. The measuring portion can be configured to contact an object to be measured by the coordinate measuring machine. The at least one articulating joint can be configured to allow rotation between the attachment portion and the measuring portion. Further, the articulating joint can comprise an angular sensor configured to measure an angle of the joint.Type: ApplicationFiled: June 8, 2015Publication date: December 17, 2015Inventors: Paul Ferrari, Hyun Kwon Jung, James F. McKnight
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Publication number: 20140260627Abstract: A flaw detection system includes a CMM having a base and one or more transfer members, one or more articulation members connecting the one or more transfer members to the base, and a flaw detection sensor at a distal end, the CMM being configured to measure a location of the flaw detection sensor, and a processor configured to correlate the location of the flaw detection sensor as measured by the CMM with data detected by the flaw detection sensor.Type: ApplicationFiled: March 12, 2013Publication date: September 18, 2014Inventors: Paul Ferrari, Hyun Kwon Jung, Hogar Tait
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Publication number: 20030007595Abstract: A method of reconstructing a tomogram of an X-ray apparatus. The tomogram reconstructing method includes obtaining model information and a transmission image of a subject. A tomogram is reconstructed from the transmission image using the model information. The reconstructed tomogram obtained is then displayed.Type: ApplicationFiled: January 24, 2002Publication date: January 9, 2003Inventors: Hyeong-Cheol Kim, Won Choi, Jae-Hyun Jung, Yong-Won Kim, Hyoung-Jo Jeon, Seung-Hwan Choi, Hyun-Kwon Jung, Kwang-Jun Yoon, Jun-Bo Kim, Kyoung-Mu Lee
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Patent number: 6501823Abstract: A method of reconstructing a tomogram of an X-ray apparatus. The tomogram reconstructing method includes obtaining model information and a transmission image of a subject. A tomogram is reconstructed from the transmission image using the model information. The reconstructed tomogram obtained is then displayed.Type: GrantFiled: January 24, 2002Date of Patent: December 31, 2002Assignee: Samsung Electronics Co., Ltd.Inventors: Hyeong-Cheol Kim, Won Choi, Jae-Hyun Jung, Yong-Won Kim, Hyoung-Jo Jeon, Seung-Hwan Choi, Hyun-Kwon Jung, Kwang-Jun Yoon, Jun-Bo Kim, Kyoung-Mu Lee
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Publication number: 20020166802Abstract: Disclosed herein is a battery inspection system. The battery inspection system includes a battery feeding conveyor for feeding batteries to be inspected. One or more transfer robots are positioned near the rear end of the battery feeding conveyor for transferring batteries fed through the battery feeding conveyor to inspection and discharge positions. An X-ray generator is positioned under the transfer robots for applying X-rays to batteries transferred by the transfer robots. A satisfactory battery discharging conveyor is positioned near the transfer robots for discharging satisfactory battery moved by the transfer robots and having been inspected. A defective battery discharging robot is positioned near the front end of the satisfactory battery discharging conveyor for removing defective batteries from batteries moving along the satisfactory battery discharging conveyor and having been inspected.Type: ApplicationFiled: October 1, 2001Publication date: November 14, 2002Inventors: Jae-Hyun Jung, Kwang-Jun Yoon, Hyeong-Cheol Kim, Yong-Won Kim, Won Choi, Hyoung-Jo Jeon, Hyun-Kwon Jung
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Patent number: 6480002Abstract: Disclosed herein is a battery inspection system. The battery inspection system includes a battery feeding conveyor for feeding batteries to be inspected. One or more transfer robots are positioned near the rear end of the battery feeding conveyor for transferring batteries fed through the battery feeding conveyor to inspection and discharge positions. An X-ray generator is positioned under the transfer robots for applying X-rays to batteries transferred by the transfer robots. A satisfactory battery discharging conveyor is positioned near the transfer robots for discharging satisfactory battery moved by the transfer robots and having been inspected. A defective battery discharging robot is positioned near the front end of the satisfactory battery discharging conveyor for removing defective batteries from batteries moving along the satisfactory battery discharging conveyor and having been inspected.Type: GrantFiled: October 1, 2001Date of Patent: November 12, 2002Assignee: Samsung Electronics Co., Ltd.Inventors: Jae-Hyun Jung, Kwang-Jun Yoon, Hyeong-Cheol Kim, Yong-Won Kim, Won Choi, Hyoung-Jo Jeon, Hyun-Kwon Jung
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Patent number: 6415014Abstract: Disclosed herein is a three-dimensional image constructing method using an X-ray apparatus. In the three-dimensional image constructing method, a construction space of a subject and information for the construction space are set. Thereafter, a plurality of transmission images of the subject are obtained. The data of the construction space are calculated on the basis of the information for the construction space set at the setting step and the transmission images obtained at the image obtaining step. The construction space is constructed on the basis of the data calculated at the image processing step.Type: GrantFiled: October 1, 2001Date of Patent: July 2, 2002Assignee: Samsung Electronics Co., Ltd.Inventors: Hyeong-Cheol Kim, Hyoung-Jo Jeon, Jae-Hyun Jung, Yong-Won Kim, Won Choi, Kwang-Jun Yoon, Hyun-Kwon Jung, Jun-Bo Kim, Jae-Wan Kim, Young-Jun Roh, Hyung-Suck Cho