Patents by Inventor I-Jan Chen

I-Jan Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Radio-frequency reflectometry scanning tunneling microscope
    Patent number: 9304146
    Abstract: An RF reflectometry scanning tunneling microscope is suitable for observing a surface of an object, and includes a probe that cooperates with the object to form a tunneling resistor therebetween, an RF resonant circuit that cooperates with the tunneling resistor to form a LCR resonant circuit including an inductor connected to a parallel connection of a capacitor, a resistor and the tunneling resistor, a directional coupler receiving an RF signal and outputting the RF signal to the LCR resonant circuit, and an RF signal measuring device that generates a scanning result associated with the surface of the object based on a reflected RF signal resulting from reflection of the RF signal by the LCR resonant circuit.
    Type: Grant
    Filed: September 19, 2014
    Date of Patent: April 5, 2016
    Assignee: NATIONAL TAIWAN UNIVERSITY
    Inventors: Woei-Wu Pai, Huan-Hsin Li, I-Jan Chen, Yen-Cheng Chao
  • RADIO-FREQUENCY REFLECTOMETRY SCANNING TUNNELING MICROSCOPE
    Publication number: 20150026847
    Abstract: An RF reflectometry scanning tunneling microscope is suitable for observing a surface of an object, and includes a probe that cooperates with the object to form a tunneling resistor therebetween, an RF resonant circuit that cooperates with the tunneling resistor to form a LCR resonant circuit including an inductor connected to a parallel connection of a capacitor, a resistor and the tunneling resistor, a directional coupler receiving an RF signal and outputting the RF signal to the LCR resonant circuit, and an RF signal measuring device that generates a scanning result associated with the surface of the object based on a reflected RF signal resulting from reflection of the RF signal by the LCR resonant circuit.
    Type: Application
    Filed: September 19, 2014
    Publication date: January 22, 2015
    Applicant: National Taiwan University
    Inventors: Woei-Wu PAI, Huan-Hsin LI, I-Jan CHEN, Yen-Cheng CHAO
  • Radio-frequency reflectometry scanning tunneling microscope
    Patent number: 8863311
    Abstract: An RF reflectometry scanning tunneling microscope is suitable for observing a surface of an object, and includes a probe that cooperates with the object to form a tunneling resistor therebetween, an RF resonant circuit that cooperates with the tunneling resistor to form a LCR resonant circuit including an inductor connected to a parallel connection of a capacitor, a resistor and the tunneling resistor, an RF signal generator that outputs an RF signal via a directional coupler to the LCR resonant circuit, and an RF signal measuring device that generates a scanning result associated with the surface of the object based on a reflected RF signal resulting from reflection of the RF signal by the LCR resonant circuit.
    Type: Grant
    Filed: September 25, 2013
    Date of Patent: October 14, 2014
    Assignee: National Taiwan University
    Inventors: Woei-Wu Pai, Huan-Hsin Li, I-Jan Chen