Abstract: Epitaxial source/drain structures for enhancing performance of multigate devices, such as fin-like field-effect transistors (FETs) or gate-all-around (GAA) FETs, and methods of fabricating the epitaxial source/drain structures, are disclosed herein. An exemplary device includes a dielectric substrate. The device further includes a channel layer, a gate disposed over the channel layer, and an epitaxial source/drain structure disposed adjacent to the channel layer. The channel layer, the gate, and the epitaxial source/drain structure are disposed over the dielectric substrate. The epitaxial source/drain structure includes an inner portion having a first dopant concentration and an outer portion having a second dopant concentration that is less than the first dopant concentration. The inner portion physically contacts the dielectric substrate, and the outer portion is disposed between the inner portion and the channel layer. In some embodiments, the outer portion physically contacts the dielectric substrate.

Abstract: An automated building monitoring system for monitoring a plurality of apparatuses in a building, includes: a plurality of controllers for controlling the plurality of apparatuses; a controlling platform for providing control-setting information; and a controlling server connected to the controllers and the controlling platform for receiving and storing the control-setting information provided by the controlling platform, and obtaining real-time data of the controllers or real-time data of the apparatuses via the controllers, the controlling server controlling the controllers to control the apparatuses based on the control-setting information and the real-time data of the controllers or the apparatuses. When the controlling platform is abnormal or is abnormally connected to the controlling server, the controlling server continuously monitors the apparatuses in the building based on the stored real-time data of the controllers or the apparatuses.

Abstract: An automated building monitoring system for monitoring a plurality of apparatuses in a building, includes: a plurality of controllers for controlling the plurality of apparatuses; a controlling platform for providing control-setting information; and a controlling server connected to the controllers and the controlling platform for receiving and storing the control-setting information provided by the controlling platform, and obtaining real-time data of the controllers or real-time data of the apparatuses via the controllers, the controlling server controlling the controllers to control the apparatuses based on the control-setting information and the real-time data of the controllers or the apparatuses. When the controlling platform is abnormal or is abnormally connected to the controlling server, the controlling server continuously monitors the apparatuses in the building based on the stored real-time data of the controllers or the apparatuses.