Patents by Inventor Iain Baikie

Iain Baikie has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement apparatus
    Patent number: 8866505
    Abstract: A measurement apparatus for surface analysis carried out in a gaseous environment such as air comprises a measurement device capable of measuring a contact potential difference between a probe and a surface, and a light source that triggers photoelectric emission from a sample. The apparatus may operate in “dual” photoemission and contact potential difference (CPD) measurement modes.
    Type: Grant
    Filed: February 21, 2013
    Date of Patent: October 21, 2014
    Assignee: KP Technology Ltd.
    Inventor: Iain Baikie
  • MEASUREMENT APPARATUS
    Publication number: 20140084902
    Abstract: A measurement apparatus for surface analysis carried out in a gaseous environment such as air comprises a measurement device capable of measuring a contact potential difference between a probe and a surface, and a light source that triggers photoelectric emission from a sample. The apparatus may operate in “dual” photoemission and contact potential difference (CPD) measurement modes.
    Type: Application
    Filed: February 21, 2013
    Publication date: March 27, 2014
    Inventor: Iain Baikie