Patents by Inventor Igor I. Smolyaninov

Igor I. Smolyaninov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6990350
    Abstract: In a free space communication network in which different communication nodes are linked together by directed beams, a method for dynamically configuring the topology of the network allows the transmission directions of the communication nodes to be autonomously changed to communicate with a new node as dictated by the needs of the network. Moreover, the nodes can be switched from directional to broadcast and back again on an as-needed basis. The network consists of a topology that can be rapidly and physically reconfigured as required to provide multiple connectivity, a desired quality of service, or to compensate with the loss of communication links between nodes. The loss of direct communication between any two nodes in an optical network can occur because of obscuration of the atmospheric path between the two nodes. The directed beam which provides the communication channel between the two nodes can, in this situation, be steered to direct its energy towards another accessible node.
    Type: Grant
    Filed: July 9, 2003
    Date of Patent: January 24, 2006
    Assignee: University of Maryland
    Inventors: Christopher C. Davis, Stuart D. Milner, Igor I. Smolyaninov
  • Patent number: 6897436
    Abstract: A system (10) for optical processing based on light-controlled photon tunneling is provided. The system (10) includes a prism (12) having a metallic film layer (14) formed on an upper surface thereof. The metallic film layer (14) has a microscopic aperture (18) formed therethrough and the microscopic aperture (18) is covered by a layer of non-linear optical film. A first light beam (30) is projected towards aperture (18) and photons from first light beam (30) tunnel through aperture (18). A second light beam (32) is also projected towards microscopic aperture (18), with the second light beam (32) having a different wavelength than that of light beam (30). Selective actuation and modulation of light beam (32) allows for selective control over the rate and intensity of the photons which tunnel through microscopic aperture (18).
    Type: Grant
    Filed: June 6, 2003
    Date of Patent: May 24, 2005
    Assignee: University of Maryland
    Inventors: Igor I. Smolyaninov, Christopher C. Davis, Anatoly Zayats
  • Publication number: 20030227662
    Abstract: A system (10) for optical processing based on light-controlled photon tunneling is provided. The system (10) includes a prism (12) having a metallic film layer (14) formed on an upper surface thereof. The metallic film layer (14) has a microscopic aperture (18) formed therethrough and the microscopic aperture (18) is covered by a layer of non-linear optical film. A first light beam (30) is projected towards aperture (18) and photons from first light beam (30) tunnel through aperture (18). A second light beam (32) is also projected towards microscopic aperture (18), with the second light beam (32) having a different wavelength than that of light beam (30). Selective actuation and modulation of light beam (32) allows for selective control over the rate and intensity of the photons which tunnel through microscopic aperture (18).
    Type: Application
    Filed: June 6, 2003
    Publication date: December 11, 2003
    Inventors: Igor I. Smolyaninov, Christopher C. Davis, Anatoly Zayats
  • Patent number: 6633711
    Abstract: A method of forming a fiber probe having an aperture for use in near-field scanning optical microscopy. The method includes a first steps of coating an optical fiber having a tapered tip with a metal layer. Next is a step of milling the tapered tip and metal layer such that an aperture is formed through the metal layer at the tapered tip. The milling step includes focused ion-beam milling the tapered tip and metal layer. The focused ion-beam milling can be done by raster scanning the focused ion-beam in a rectangular pattern at an apex of the tapered tip. Also, the fiber probe made through the above outlined method is used in near-field scanning optical microscopy.
    Type: Grant
    Filed: June 1, 2000
    Date of Patent: October 14, 2003
    Assignee: University of Maryland
    Inventors: Saeed Pilevar, Klaus Edinger, Walid Atia, Igor I. Smolyaninov, Christopher C. Davis