Patents by Inventor Ik-Keun PARK

Ik-Keun PARK has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11959886
    Abstract: The present invention relates to a scanner having a flexible probe which is an apparatus capable of being utilized for an inspection on a weld zone of a general ferrite material and a stainless material and allowing an inspection to be performed on a fitting weld zone where it is difficult for a general phased array ultrasonic testing (PAUT) probe to approach.
    Type: Grant
    Filed: November 18, 2020
    Date of Patent: April 16, 2024
    Assignees: Foundation for Research and Business, Seoul National University of Science and Technology, Korea Inspection Eng.Co., Ltd
    Inventors: Ik Keun Park, Yu Min Choi, Seong Jin Lim, In Gon Jung, Hye Jin Park
  • Patent number: 11885768
    Abstract: The present invention relates to a semi-automatic scanner for ultrasonic inspection of a branch pipe weld that has a small size and is able to perform an inspection while moving in a state of being attached to a test object by a magnetic force, thereby being applied to fittings having various shapes, such as a branch pipe and an elbow.
    Type: Grant
    Filed: December 3, 2019
    Date of Patent: January 30, 2024
    Assignees: Korea Inspection Eng. Co., Ltd, Foundation for Research and Business, Seoul National University of Science and Technology
    Inventors: Seong Jin Lim, In Gon Jung, Min Jung Park, Ik Keun Park, Tae Sung Park
  • Publication number: 20220317093
    Abstract: The present invention relates to a scanner having a flexible probe which is an apparatus capable of being utilized for an inspection on a weld zone of a general ferrite material and a stainless material and allowing an inspection to be performed on a fitting weld zone where it is difficult for a general phased array ultrasonic testing (PAUT) probe to approach.
    Type: Application
    Filed: November 18, 2020
    Publication date: October 6, 2022
    Applicants: Foundation for Research and Business, Seoul National University of Science and Technology, Korea Inspection Eng.Co.,Ltd
    Inventors: Ik Keun PARK, Yu Min CHOI, Seong Jin LIM, In Gon JUNG, Hye Jin PARK
  • Patent number: 11353432
    Abstract: Disclosed are a method for measuring the adhesive strength of a thin film using surface waves, and a computer-readable recording medium having a program for performing same recorded thereon. The method for measuring the adhesive strength of a thin film measures the adhesive strength between a substrate and a thin film by means of an electronic calculator, using sound waves measured from a thin film structure having a thin film formed on a substrate.
    Type: Grant
    Filed: September 14, 2018
    Date of Patent: June 7, 2022
    Assignee: Seoul National University of Technology Center for Industry Collaboration
    Inventors: Ik Keun Park, Tae Sung Park, Yu Min Choi, Dong Ryul Kwak
  • Publication number: 20210364475
    Abstract: The present invention relates to a semi-automatic scanner for ultrasonic inspection of a branch pipe weld that has a small size and is able to perform an inspection while moving in a state of being attached to a test object by a magnetic force, thereby being applied to fittings having various shapes, such as a branch pipe and an elbow.
    Type: Application
    Filed: December 3, 2019
    Publication date: November 25, 2021
    Applicants: Korea Inspection Eng.Co.,Ltd, Foundation for Research and Business, Seoul National University of Science and Technology
    Inventors: Seong Jin LIM, In Gon JUNG, Min Jung PARK, Ik Keun PARK, Tae Sung PARK
  • Publication number: 20200217820
    Abstract: Disclosed are a method for measuring the adhesive strength of a thin film using surface waves, and a computer-readable recording medium having a program for performing same recorded thereon. The method for measuring the adhesive strength of a thin film measures the adhesive strength between a substrate and a thin film by means of an electronic calculator, using sound waves measured from a thin film structure having a thin film formed on a substrate.
    Type: Application
    Filed: September 14, 2018
    Publication date: July 9, 2020
    Applicant: Seoul National University of Technology Center for Industry Cllaboration
    Inventors: Ik Keun PARK, Tae Sung PARK, Yu Min CHOI, Dong Ryul KWAK
  • Patent number: 9739592
    Abstract: A multiple beam path laser optical system using a multiple beam reflector. The multiple beam path laser optical system includes a light source part to generate a laser beam to be irradiated to a specimen, the multiple beam reflector to split a laser beam incident thereto from the light source part and to provide a plurality of optical paths, a main beam splitter to irradiate the laser beam split by the multiple beam reflector to the specimen, a transducer to excite the specimen for signal detection of the laser beam irradiated to the specimen, and a control part to analyze an interference pattern of a laser beam reflected from the specimen and recombined in the main beam splitter.
    Type: Grant
    Filed: October 30, 2015
    Date of Patent: August 22, 2017
    Assignee: Foundation for Research and Business, Seoul National University of Science and Technology
    Inventors: Ik-Keun Park, Hae-Sung Park, Tae-Sung Park, Dong-Ryul Kwak
  • Publication number: 20160123717
    Abstract: A multiple beam path laser optical system using a multiple beam reflector. The multiple beam path laser optical system includes a light source part to generate a laser beam to be irradiated to a specimen, the multiple beam reflector to split a laser beam incident thereto from the light source part and to provide a plurality of optical paths, a main beam splitter to irradiate the laser beam split by the multiple beam reflector to the specimen, a transducer to excite the specimen for signal detection of the laser beam irradiated to the specimen, and a control part to analyze an interference pattern of a laser beam reflected from the specimen and recombined in the main beam splitter.
    Type: Application
    Filed: October 30, 2015
    Publication date: May 5, 2016
    Inventors: Ik-Keun PARK, Hae-Sung PARK, Tae-Sung PARK, Dong-Ryul KWAK