Patents by Inventor Ilan Sela

Ilan Sela has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230332097
    Abstract: A bacterial culture is disclosed which comprises Rhizobium bacteria having a nucleic acid sequence at least 99% identical to the nucleic acid sequence as set forth in SEQ ID NO: 1. Uses thereof are also disclosed.
    Type: Application
    Filed: February 25, 2021
    Publication date: October 19, 2023
    Applicant: Hinoman Ltd.
    Inventors: Miri LAPIDOT, Ilan SELA, Monica COLT
  • Patent number: 10801028
    Abstract: An isolated nucleic acid agent is disclosed comprising a nucleic acid sequence which downregulates expression of a gene product of a Varroa destructor mite. Compositions comprising same and uses thereof are also disclosed.
    Type: Grant
    Filed: April 26, 2017
    Date of Patent: October 13, 2020
    Assignees: BEEOLOGICS INC., YISSUM RESEARCH DEVELOPMENT COMPANY OF THE HEBREW UNIVERSITY OF JERUSALEM LTD.
    Inventors: Ilan Sela, Sharoni Shafir, Eyal Maori, Yael Garbian, Eyal Ben-Chanoch, Gal Yarden, Haim Kalev
  • Patent number: 10533940
    Abstract: Angle-resolved reflectometers and reflectometry methods are provided, which comprise a coherent light source, an optical system arranged to scan a test pattern using a spot of coherent light from the light source to yield realizations of the light distribution in the collected pupil, wherein the spot covers a part of the test pattern and the scanning is carried out optically or mechanically according to a scanning pattern, and a processing unit arranged to generate a composite image of the collected pupil distribution by combining the pupil images. Metrology systems and methods are provided, which reduce diffraction errors by estimating, quantitatively, a functional dependency of measurement parameters on aperture sizes and deriving, from identified diffraction components of the functional dependency which relate to the aperture sizes, correction terms for the measurement parameters with respect to the measurement conditions.
    Type: Grant
    Filed: November 12, 2018
    Date of Patent: January 14, 2020
    Assignee: KLA-Tencor Corporation
    Inventors: Amnon Manassen, Andrew V. Hill, Daniel Kandel, Ilan Sela, Ohad Bachar, Barak Bringoltz
  • Publication number: 20190094142
    Abstract: Angle-resolved reflectometers and reflectometry methods are provided, which comprise a coherent light source, an optical system arranged to scan a test pattern using a spot of coherent light from the light source to yield realizations of the light distribution in the collected pupil, wherein the spot covers a part of the test pattern and the scanning is carried out optically or mechanically according to a scanning pattern, and a processing unit arranged to generate a composite image of the collected pupil distribution by combining the pupil images. Metrology systems and methods are provided, which reduce diffraction errors by estimating, quantitatively, a functional dependency of measurement parameters on aperture sizes and deriving, from identified diffraction components of the functional dependency which relate to the aperture sizes, correction terms for the measurement parameters with respect to the measurement conditions.
    Type: Application
    Filed: November 12, 2018
    Publication date: March 28, 2019
    Inventors: Amnon Manassen, Andrew V. Hill, Daniel Kandel, Ilan Sela, Ohad Bachar, Barak Bringoltz
  • Patent number: 10203247
    Abstract: A system for providing illumination to a measurement head for optical metrology is configured to combine illumination beams from a plurality of illumination sources to deliver illumination at one or more selected wavelengths to the measurement head. The intensity and/or spatial coherence of illumination delivered to the measurement head is controlled. Illumination at one or more selected wavelengths is delivered from a broadband illumination source configured for providing illumination at a continuous range of wavelengths.
    Type: Grant
    Filed: December 5, 2016
    Date of Patent: February 12, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Gregory R. Brady, Andrei V. Shchegrov, Lawrence D. Rotter, Derrick A. Shaughnessy, Anatoly Shchemelinin, Ilya Bezel, Muzammil A. Arain, Anatoly A. Vasiliev, James Andrew Allen, Oleg Shulepov, Andrew V. Hill, Ohad Bachar, Moshe Markowitz, Yaron Ish-Shalom, Ilan Sela, Amnon Manassen, Alexander Svizher, Maxim Khokhlov, Avi Abramov, Oleg Tsibulevsky, Daniel Kandel, Mark Ghinovker
  • Patent number: 10126238
    Abstract: Angle-resolved reflectometers and reflectometry methods are provided, which comprise a coherent light source, an optical system arranged to scan a test pattern using a spot of coherent light from the light source to yield realizations of the light distribution in the collected pupil, wherein the spot covers a part of the test pattern and the scanning is carried out optically or mechanically according to a scanning pattern, and a processing unit arranged to generate a composite image of the collected pupil distribution by combining the pupil images. Metrology systems and methods are provided, which reduce diffraction errors by estimating, quantitatively, a functional dependency of measurement parameters on aperture sizes and deriving, from identified diffraction components of the functional dependency which relate to the aperture sizes, correction terms for the measurement parameters with respect to the measurement conditions.
    Type: Grant
    Filed: December 13, 2017
    Date of Patent: November 13, 2018
    Assignee: KLA-Tencor Corporation
    Inventors: Amnon Manassen, Andrew Hill, Daniel Kandel, Ilan Sela, Ohad Bachar, Barak Bringoltz
  • Patent number: 9958385
    Abstract: Angle-resolved reflectometers and reflectometry methods are provided, which comprise a coherent light source, an optical system arranged to scan a test pattern using a spot of coherent light from the light source to yield realizations of the light distribution in the collected pupil, wherein the spot covers a part of the test pattern and the scanning is carried out optically or mechanically according to a scanning pattern, and a processing unit arranged to generate a composite image of the collected pupil distribution by combining the pupil images. Metrology systems and methods are provided, which reduce diffraction errors by estimating, quantitatively, a functional dependency of measurement parameters on aperture sizes and deriving, from identified diffraction components of the functional dependency which relate to the aperture sizes, correction terms for the measurement parameters with respect to the measurement conditions.
    Type: Grant
    Filed: December 23, 2014
    Date of Patent: May 1, 2018
    Assignee: KLA-Tencor Corporation
    Inventors: Amnon Manassen, Andrew Hill, Daniel Kandel, Ilan Sela, Ohad Bachar, Barak Bringoltz
  • Publication number: 20180106723
    Abstract: Angle-resolved reflectometers and reflectometry methods are provided, which comprise a coherent light source, an optical system arranged to scan a test pattern using a spot of coherent light from the light source to yield realizations of the light distribution in the collected pupil, wherein the spot covers a part of the test pattern and the scanning is carried out optically or mechanically according to a scanning pattern, and a processing unit arranged to generate a composite image of the collected pupil distribution by combining the pupil images. Metrology systems and methods are provided, which reduce diffraction errors by estimating, quantitatively, a functional dependency of measurement parameters on aperture sizes and deriving, from identified diffraction components of the functional dependency which relate to the aperture sizes, correction terms for the measurement parameters with respect to the measurement conditions.
    Type: Application
    Filed: December 13, 2017
    Publication date: April 19, 2018
    Inventors: Amnon Manassen, Andrew Hill, Daniel Kandel, Ilan Sela, Ohad Bachar, Barak Bringoltz
  • Publication number: 20170233743
    Abstract: An isolated nucleic acid agent is disclosed comprising a nucleic acid sequence which downregulates expression of a gene product of a Varroa destructor mite. Compositions comprising same and uses thereof are also disclosed.
    Type: Application
    Filed: April 26, 2017
    Publication date: August 17, 2017
    Inventors: Ilan SELA, Sharoni SHAFIR, Eyal MAORI, Yael GARBIAN, Eyal BEN-CHANOCH, Gal YARDEN, Haim KALEV
  • Patent number: 9662348
    Abstract: An isolated nucleic acid agent is disclosed comprising a nucleic acid sequence which downregulates expression of a gene product of a Varroa destructor mite. Compositions comprising same and uses thereof are also disclosed.
    Type: Grant
    Filed: January 27, 2015
    Date of Patent: May 30, 2017
    Assignees: Yissum Research Development Company of the Hebrew University of Jerusalem Ltd., Beeologics Inc.
    Inventors: Ilan Sela, Sharoni Shafir, Eyal Maori, Yael Garbian, Eyal Ben-Chanoch, Gal Yarden, Haim Kalev
  • Publication number: 20170146399
    Abstract: A system for providing illumination to a measurement head for optical metrology is configured to combine illumination beams from a plurality of illumination sources to deliver illumination at one or more selected wavelengths to the measurement head. The intensity and/or spatial coherence of illumination delivered to the measurement head is controlled. Illumination at one or more selected wavelengths is delivered from a broadband illumination source configured for providing illumination at a continuous range of wavelengths.
    Type: Application
    Filed: December 5, 2016
    Publication date: May 25, 2017
    Inventors: Gregory R. Brady, Andrei V. Shchegrov, Lawrence D. Rotter, Derrick A. Shaughnessy, Anatoly Shchemelinin, Ilya Bezel, Muzammil A. Arain, Anatoly A. Vasiliev, James Andrew Allen, Oleg Shulepov, Andrew V. Hill, Ohad Bachar, Moshe Markowitz, Yaron Ish-Shalom, Ilan Sela, Amnon Manassen, Alexander Svizher, Maxim Khokhlov, Avi Abramov, Oleg Tsibulevsky, Daniel Kandel, Mark Ghinovker
  • Patent number: 9512985
    Abstract: The disclosure is directed to systems for providing illumination to a measurement head for optical metrology. In some embodiments of the disclosure, illumination beams from a plurality of illumination sources are combined to deliver illumination at one or more selected wavelengths to the measurement head. In some embodiments of the disclosure, intensity and/or spatial coherence of illumination delivered to the measurement head is controlled. In some embodiments of the disclosure, illumination at one or more selected wavelengths is delivered from a broadband illumination source configured for providing illumination at a continuous range of wavelengths.
    Type: Grant
    Filed: February 22, 2013
    Date of Patent: December 6, 2016
    Assignee: KLA-Tencor Corporation
    Inventors: Gregory R. Brady, Andrei V. Shchegrov, Lawrence D. Rotter, Derrick Shaughnessy, Anatoly Shchemelinin, Ilya Bezel, Muzammil A. Arain, Anatoly A. Vasiliev, James Andrew Allen, Oleg Shulepov, Andrew V. Hill, Ohad Bachar, Moshe Markowitz, Yaron Ish-Shalom, Ilan Sela, Amnon Manassen, Alexander Svizher, Maxim Khokhlov, Avi Abramov, Oleg Tsibulevsky, Daniel Kandel, Mark Ghinovker
  • Patent number: 9315818
    Abstract: A Geminivirus based expression construct being capable of systemic symptomeless spread in a plant host is provided as well as methods of utilizing same for plant gene expression, gene silencing and plant protection.
    Type: Grant
    Filed: June 7, 2007
    Date of Patent: April 19, 2016
    Assignees: Yissum Research Development Company of the Hebrew University of Jerusalem, Morflora Israel Ltd.
    Inventors: Ilan Sela, Rita Mozes-Koch, Yuval Peretz, Herve Huet
  • Publication number: 20150232875
    Abstract: The present invention provides means and methods for simple and efficient introduction of foreign genetic material into the plant cell. Particularly, the present invention combines seed priming and virus-based DNA constructs for efficient introduction of heterologous DNA into plants.
    Type: Application
    Filed: March 8, 2015
    Publication date: August 20, 2015
    Applicant: Yissum Research Development Company of the Hebrew University of Jerusalem Ltd.
    Inventors: Ilan SELA, Haim David Rabinowitch, Ofer Gover
  • Patent number: 9080971
    Abstract: Various metrology systems and methods are provided. One metrology system includes a light source configured to produce a diffraction-limited light beam, an apodizer configured to shape the light beam in the entrance pupil of illumination optics, and optical elements configured to direct the diffraction-limited light beam from the apodizer to an illumination spot on a grating target on a wafer and to collect scattered light from the grating target. The metrology system further includes a field stop and a detector configured to detect the scattered light that passes through the field stop. In addition, the metrology system includes a computer system configured to determine a characteristic of the grating target using output of the detector.
    Type: Grant
    Filed: October 16, 2014
    Date of Patent: July 14, 2015
    Assignee: KLA-Tencor Corp.
    Inventors: Daniel Kandel, Vladimir Levinski, Alexander Svizher, Joel Seligson, Andrew Hill, Ohad Bachar, Amnon Manassen, Yung-Ho Alex Chuang, Ilan Sela, Moshe Markowitz, Daria Negri, Efraim Rotem
  • Publication number: 20150133532
    Abstract: An isolated nucleic acid agent is disclosed comprising a nucleic acid sequence which downregulates expression of a gene product of a Varroa destructor mite. Compositions comprising same and uses thereof are also disclosed.
    Type: Application
    Filed: January 27, 2015
    Publication date: May 14, 2015
    Inventors: Ilan Sela, Sharoni Shafir, Eyal Maori, Yael Garbian, Eyal Ben-Chanoch, Gal Yarden, Haim Kalev
  • Publication number: 20150116717
    Abstract: Angle-resolved reflectometers and reflectometry methods are provided, which comprise a coherent light source, an optical system arranged to scan a test pattern using a spot of coherent light from the light source to yield realizations of the light distribution in the collected pupil, wherein the spot covers a part of the test pattern and the scanning is carried out optically or mechanically according to a scanning pattern, and a processing unit arranged to generate a composite image of the collected pupil distribution by combining the pupil images. Metrology systems and methods are provided, which reduce diffraction errors by estimating, quantitatively, a functional dependency of measurement parameters on aperture sizes and deriving, from identified diffraction components of the functional dependency which relate to the aperture sizes, correction terms for the measurement parameters with respect to the measurement conditions.
    Type: Application
    Filed: December 23, 2014
    Publication date: April 30, 2015
    Inventors: Amnon MANASSEN, Andrew HILL, Daniel KANDEL, Ilan SELA, Ohad BACHAR, Barak BRINGOLTZ
  • Patent number: 8975470
    Abstract: The present invention provides means and methods for simple and efficient introduction of foreign genetic material into the plant cell. Particularly, the present invention combines seed priming and virus-based DNA constructs for efficient introduction of heterologous DNA into plants.
    Type: Grant
    Filed: June 30, 2010
    Date of Patent: March 10, 2015
    Assignee: Yissum Research Development Company of the Hebrew University of Jerusalem Ltd.
    Inventors: Ilan Sela, Haim David Rabinowitch, Ofer Gover
  • Patent number: 8962584
    Abstract: An isolated nucleic acid agent is disclosed comprising a nucleic acid sequence which downregulates expression of a gene product of a Varroa destructor mite. Compositions comprising same and uses thereof are also disclosed.
    Type: Grant
    Filed: April 13, 2012
    Date of Patent: February 24, 2015
    Assignees: Yissum Research Development Company of the Hebrew University of Jerusalem, Ltd., Beeologics Inc.
    Inventors: Ilan Sela, Sharoni Shafir, Eyal Maori, Yael Garbian, Eyal Ben-Chanoch, Gal Yarden, Haim Kalev
  • Publication number: 20150036142
    Abstract: Various metrology systems and methods are provided. One metrology system includes a light source configured to produce a diffraction-limited light beam, an apodizer configured to shape the light beam in the entrance pupil of illumination optics, and optical elements configured to direct the diffraction-limited light beam from the apodizer to an illumination spot on a grating target on a wafer and to collect scattered light from the grating target. The metrology system further includes a field stop and a detector configured to detect the scattered light that passes through the field stop. In addition, the metrology system includes a computer system configured to determine a characteristic of the grating target using output of the detector.
    Type: Application
    Filed: October 16, 2014
    Publication date: February 5, 2015
    Inventors: Daniel Kandel, Vladimir Levinski, Alexander Svizher, Joel Seligson, Andrew Hill, Ohad Bachar, Amnon Manassen, Yung-Ho Alex Chuang, Ilan Sela, Moshe Markowitz, Daria Negri, Efraim Rotem