Abstract: An integrated memory has a respective terminal for a clock signal and a data clock signal and also a data terminal. For a write operation, the memory accepts a write command on account of the clock signal and, in a manner time-delayed with respect thereto, a plurality of data at the data terminal on account of the data clock signal. An access controller serves for controlling an access to a memory cell array of the memory for the parallel writing of the accepted data to selected memory cells. The access to the memory cell array is triggered by the access controller by a phase-shifted clock signal before the clock signal has a next rising edge after the acceptance of the data. It is thus possible to increase the effective writing time from the application of the write command to the closing of a memory bank by a precharge command.

Abstract: An integrated memory has a respective terminal for a clock signal and a data clock signal and also a data terminal. For a write operation, the memory accepts a write command on account of the clock signal and, in a manner time-delayed with respect thereto, a plurality of data at the data terminal on account of the data clock signal. An access controller serves for controlling an access to a memory cell array of the memory for the parallel writing of the accepted data to selected memory cells. The access to the memory cell array is triggered by the access controller by a phase-shifted clock signal before the clock signal has a next rising edge after the acceptance of the data. It is thus possible to increase the effective writing time from the application of the write command to the closing of a memory bank by a precharge command.

Abstract: The invention creates an oscillator circuit, in particular for a refresh timer device of a dynamic semiconductor memory, having a capacitor device (C; C′) which is connected between a first node (6) and a first supply potential (P2); a current mirror circuit (T1; T2) for supplying a charging current for the capacitor device (C; C′) which is connected via a first transistor device (T4) to the first node (6) and which has a current source (SQ) for supplying a substantially temperature-independent reference current (Iref); a second transistor device (T5), which is connected between the first node (6) and the first supply potential (P2); the first and second transistor devices (T4; T5) and a control signal being configured in such a way that the capacitor device (C; C′) can be charged via the first node (6) when a potential (Vcomp) at the first node (6) is lower than the reference potential (Vref), and can be discharged via the first node (6) when the potential (Vcomp) at the first node (6) is h

Abstract: A circuit configuration for generating sense amplifier control signals for a DRAM. The circuit configuration includes, in addition to thin oxide transistors that are supplied with a normal standard supply voltage, thick oxide transistors to which an increased supply voltage is applied to compensate for voltage and technological fluctuations.

Abstract: The invention creates an oscillator circuit, in particular for a refresh timer device of a dynamic semiconductor memory, having a capacitor device (C; C′) which is connected between a first node (6) and a first supply potential (P2); a current mirror circuit (T1; T2) for supplying a charging current for the capacitor device (C; C′) which is connected via a first transistor device (T4) to the first node (6) and which has a current source (SQ) for supplying a substantially temperature-independent reference current (Iref); a second transistor device (T5), which is connected between the first node (6) and the first supply potential (P2); a comparator device (COMP) with a first and a second input (+, −) and an output (A), the first input (+) being connected to the first node (6) and the second input (−) being connected to a reference potential (Vref); and a control signal generating device (INV; L1; G1) for generating a control signal and applying the same to a control terminal on

Abstract: A circuit configuration for generating sense amplifier control signals for a DRAM. The circuit configuration includes, in addition to thin oxide transistors that are supplied with a normal standard supply voltage, thick oxide transistors to which an increased supply voltage is applied to compensate for voltage and technological fluctuations.