Patents by Inventor Ippei Takahashi

Ippei Takahashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11651864
    Abstract: A drug inspection apparatus inspects drugs that are prepared based on prescription information and are packaged in a prescription bag. A drug database includes drug images of drugs that can be prepared. A comparison target selection section acquires drug images of drugs, which are prepared according to the prescription, and drugs similar thereto from the drug database. A first drug determination section compares captured images of prepared drugs with the drug images acquired from the drug database, and determines drugs present in the captured images and the number thereof. An inspection result determination section determines whether or not the prepared drugs and the number thereof match the prescription information based on the prescription information.
    Type: Grant
    Filed: November 30, 2020
    Date of Patent: May 16, 2023
    Assignee: FUJIFILM TOYAMA CHEMICAL CO., LTD.
    Inventors: Makoto Yonaha, Tetsuya Takamori, Ippei Takahashi, Seigo Sugimoto
  • Publication number: 20220260713
    Abstract: An obstacle detection apparatus that detects an obstacle existing around a vehicle is provided to include an ultrasonic sensor and a controller. The ultrasonic sensor is provided in the vehicle at a position having a predetermined height from a road surface. The ultrasonic sensor includes a plurality of ultrasonic elements configured to transmit an exploration wave toward outside of the vehicle, and receive a reflected wave reflected by an obstacle as a reception wave. The controller is configured to derive (i) an obstacle distance and (ii) an obstacle height based on an intensity of the reception wave received by each of the plurality of ultrasonic elements and a phase difference in the reception wave received by each of the plurality of ultrasonic elements.
    Type: Application
    Filed: April 19, 2022
    Publication date: August 18, 2022
    Inventors: Tomoki TANEMURA, Nobuaki MATSUDAIRA, Ippei TAKAHASHI
  • Patent number: 11348844
    Abstract: A semiconductor wafer includes a silicon carbide wafer and an epitaxial layer, which is disposed at a surface of the silicon carbide wafer and made of silicon carbide. The semiconductor wafer satisfies a condition that a waviness value is equal to or smaller than 1 micrometer. The waviness value is a sum of an absolute value of a value ? and an absolute value of a value ?. A highest height among respective heights of a plurality of points with reference to a surface reference plane within a light exposure area is denoted as the value ?. A lowest height among the respective heights of the points at the epitaxial layer with reference to the surface reference plane within the light exposure area is denoted as the value ?.
    Type: Grant
    Filed: January 19, 2021
    Date of Patent: May 31, 2022
    Assignee: DENSO CORPORATION
    Inventors: Shinya Takei, Shuhei Mitani, Haruhito Ichikawa, Ippei Takahashi, Yukihiro Wakasugi
  • Publication number: 20210143070
    Abstract: A semiconductor wafer includes a silicon carbide wafer and an epitaxial layer, which is disposed at a surface of the silicon carbide wafer and made of silicon carbide. The semiconductor wafer satisfies a condition that a waviness value is equal to or smaller than 1 micrometer. The waviness value is a sum of an absolute value of a value ? and an absolute value of a value ?. A highest height among respective heights of a plurality of points with reference to a surface reference plane within a light exposure area is denoted as the value ?. A lowest height among the respective heights of the points at the epitaxial layer with reference to the surface reference plane within the light exposure area is denoted as the value ?.
    Type: Application
    Filed: January 19, 2021
    Publication date: May 13, 2021
    Inventors: Shinya TAKEI, Shuhei MITANI, Haruhito ICHIKAWA, Ippei TAKAHASHI, Yukihiro WAKASUGI
  • Publication number: 20210082584
    Abstract: A drug inspection apparatus inspects drugs that are prepared based on prescription information and are packaged in a prescription bag. A drug database includes drug images of drugs that can be prepared. A comparison target selection section acquires drug images of drugs, which are prepared according to the prescription, and drugs similar thereto from the drug database. A first drug determination section compares captured images of prepared drugs with the drug images acquired from the drug database, and determines drugs present in the captured images and the number thereof. An inspection result determination section determines whether or not the prepared drugs and the number thereof match the prescription information based on the prescription information.
    Type: Application
    Filed: November 30, 2020
    Publication date: March 18, 2021
    Applicant: FUJIFILM TOYAMA CHEMICAL CO., LTD.
    Inventors: Makoto YONAHA, Tetsuya TAKAMORI, Ippei TAKAHASHI, Seigo SUGIMOTO
  • Patent number: 10896764
    Abstract: A drug inspection apparatus inspects drugs that are prepared based on prescription information and are packaged in a prescription bag. A drug database includes drug images of drugs that can be prepared. A comparison target selection section acquires drug images of drugs, which are prepared according to the prescription, and drugs similar thereto from the drug database. A first drug determination section compares captured images of prepared drugs with the drug images acquired from the drug database, and determines drugs present in the captured images and the number thereof. An inspection result determination section determines whether or not the prepared drugs and the number thereof match the prescription information based on the prescription information.
    Type: Grant
    Filed: February 27, 2015
    Date of Patent: January 19, 2021
    Assignee: FUJIFILM TOYAMA CHEMICAL CO., LTD.
    Inventors: Makoto Yonaha, Tetsuya Takamori, Ippei Takahashi, Seigo Sugimoto
  • Patent number: 10565545
    Abstract: A drug inspection support apparatus inspects drugs that are prepared based on prescription information and are packaged in a prescription bag. A drug database stores drug master images of drugs that can be prepared. A first drug determination section compares drug master images from the drug database with a captured image obtained by capturing an image of prepared drugs, and determines drugs present in the captured image and the number of drugs. A list creation section creates a list displaying drug master images of drugs, which are prepared according to a prescription, and drug area images, which are determined to be respective drugs in a captured image, so that the positions thereof are aligned with one another.
    Type: Grant
    Filed: February 27, 2015
    Date of Patent: February 18, 2020
    Assignee: FUJIFILM TOYAMA CHEMICAL CO., LTD.
    Inventors: Makoto Yonaha, Tetsuya Takamori, Ippei Takahashi, Seigo Sugimoto
  • Patent number: 10007993
    Abstract: An inspection device 1 includes an inspection table 2 on which an inspection target T which is a set of a plurality of solid drugs O is placed, a vibration unit 3 that vibrates the inspection table 2, an imaging unit 4 that acquires an image of the inspection target T, which is placed on the inspection table 2, in a first direction along the inspection table 2, and a control unit 5 that determines whether the solid drugs O in the inspection target T overlap each other, based on inspection target information including appearance information of each of the drugs forming the inspection target T and the image of the inspection target T in the first direction, and operates the vibration unit 3 in a case in which it is determined that the solid drugs O overlap each other.
    Type: Grant
    Filed: August 25, 2016
    Date of Patent: June 26, 2018
    Assignee: FUJIFILM Corporation
    Inventor: Ippei Takahashi
  • Publication number: 20180151364
    Abstract: A method of manufacturing a semiconductor device is provided. The method includes: grinding a surface of an SiC wafer so that a crushed layer having a thickness of 5 nm or more is formed in a range exposed on the surface; forming a metal layer covering the crushed layer; and making the metal layer and the crushed layer react with each other by heating so as to form a silicide layer in ohmic contact with the SiC wafer. At least a part of the crushed layer covered with the metal layer transforms to the silicide layer over its entire depth.
    Type: Application
    Filed: October 20, 2017
    Publication date: May 31, 2018
    Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Hiroyuki YOSHIDA, Ippei TAKAHASHI, Yasushi URAKAMI
  • Patent number: 9922419
    Abstract: A row of V-shaped grooves is formed in the bottom of each of imaging trays which temporarily hold a dose of drug. After drugs are inserted into the imaging tray, the imaging tray is vibrated to remove the overlap between the drugs corresponding to a dose and to correct the posture of the drugs using a first inclined surface and a second inclined surface of the V-shaped groove. Two cameras are provided so as to face the first inclined surface and the second inclined surface of the V-shaped groove, respectively, and capture the images of the drugs which have stable postures that have been corrected on the V-shaped grooves, in two directions. The first and second images of the drugs captured in two directions are processed to accurately acquire drug information including at least outward appearance information of the drugs.
    Type: Grant
    Filed: December 18, 2015
    Date of Patent: March 20, 2018
    Assignee: FUJIFILM Corporation
    Inventor: Ippei Takahashi
  • Publication number: 20160364868
    Abstract: An inspection device 1 includes an inspection table 2 on which an inspection target T which is a set of a plurality of solid drugs O is placed, a vibration unit 3 that vibrates the inspection table 2, an imaging unit 4 that acquires an image of the inspection target T, which is placed on the inspection table 2, in a first direction along the inspection table 2, and a control unit 5 that determines whether the solid drugs O in the inspection target T overlap each other, based on inspection target information including appearance information of each of the drugs forming the inspection target T and the image of the inspection target T in the first direction, and operates the vibration unit 3 in a case in which it is determined that the solid drugs O overlap each other.
    Type: Application
    Filed: August 25, 2016
    Publication date: December 15, 2016
    Applicant: FUJIFILM Corporation
    Inventor: Ippei TAKAHASHI
  • Publication number: 20160104282
    Abstract: A row of V-shaped grooves is formed in the bottom of each of imaging trays 110A and 110B which temporarily hold a dose of drug. After drugs are inserted into the imaging tray, the imaging tray is vibrated to remove the overlap between the drugs corresponding to a dose and to correct the posture of the drugs using a first inclined surface 112A and a second inclined surface 112B of the V-shaped groove. Two cameras 130A and 130B are provided so as to face the first inclined surface 112A and the second inclined surface 112B of the V-shaped groove 112, respectively, and capture the images of the drugs which have stable postures that have been corrected on the V-shaped grooves, in two directions. The first and second images of the drugs captured in two directions are processed to accurately acquire drug information including at least outward appearance information of the drugs.
    Type: Application
    Filed: December 18, 2015
    Publication date: April 14, 2016
    Applicant: FUJIFILM Corporation
    Inventor: Ippei TAKAHASHI
  • Publication number: 20150178674
    Abstract: A drug inspection support apparatus inspects drugs that are prepared based on prescription information and are packaged in a prescription bag. A drug database stores drug master images of drugs that can be prepared. A first drug determination section compares drug master images from the drug database with a captured image obtained by capturing an image of prepared drugs, and determines drugs present in the captured image and the number of drugs. A list creation section creates a list displaying drug master images of drugs, which are prepared according to a prescription, and drug area images, which are determined to be respective drugs in a captured image, so that the positions thereof are aligned with one another.
    Type: Application
    Filed: February 27, 2015
    Publication date: June 25, 2015
    Applicant: FUJIFILM CORPORATION
    Inventors: Makoto YONAHA, Tetsuya TAKAMORI, Ippei TAKAHASHI, Seigo SUGIMOTO
  • Publication number: 20150170373
    Abstract: A drug inspection apparatus inspects drugs that are prepared based on prescription information and are packaged in a prescription bag. A drug database includes drug images of drugs that can be prepared. A comparison target selection section acquires drug images of drugs, which are prepared according to the prescription, and drugs similar thereto from the drug database. A first drug determination section compares captured images of prepared drugs with the drug images acquired from the drug database, and determines drugs present in the captured images and the number thereof. An inspection result determination section determines whether or not the prepared drugs and the number thereof match the prescription information based on the prescription information.
    Type: Application
    Filed: February 27, 2015
    Publication date: June 18, 2015
    Applicant: FUJIFILM CORPORATION
    Inventors: Makoto YONAHA, Tetsuya TAKAMORI, Ippei TAKAHASHI, Seigo SUGIMOTO
  • Patent number: 8654333
    Abstract: A surface inspection apparatus includes a light source for applying a detection laser beam to a film sample. A light receiver has plural photomultiplier tubes arranged in a width direction of the film sample, for receiving output light reflected by the film sample. A defect detector detects a defect on the film sample according to an output signal output by each of the photomultiplier tubes. A sensitivity corrector sets sensitivity of the photomultiplier tubes to process an output of the light receiver for output noise suppression. Specifically, the sensitivity corrector determines a set sensitivity of the photomultiplier tubes by correcting a sensitivity characteristic thereof for abnormality detection, to keep a sensitivity difference between the photomultiplier tubes as small as a predetermined value or less. Furthermore, plural light valves upstream from the light receivers are controlled by the sensitivity corrector for their transmittance.
    Type: Grant
    Filed: March 24, 2011
    Date of Patent: February 18, 2014
    Assignee: Fujifilm Corporation
    Inventors: Bungo Shigeta, Ippei Takahashi
  • Publication number: 20110242537
    Abstract: A surface inspection apparatus includes a light source for applying a detection laser beam to a film sample. A light receiver has plural photomultiplier tubes arranged in a width direction of the film sample, for receiving output light reflected by the film sample. A defect detector detects a defect on the film sample according to an output signal output by each of the photomultiplier tubes. A sensitivity corrector sets sensitivity of the photomultiplier tubes to process an output of the light receiver for output noise suppression. Specifically, the sensitivity corrector determines a set sensitivity of the photomultiplier tubes by correcting a sensitivity characteristic thereof for abnormality detection, to keep a sensitivity difference between the photomultiplier tubes as small as a predetermined value or less. Furthermore, plural light valves upstream from the light receivers are controlled by the sensitivity corrector for their transmittance.
    Type: Application
    Filed: March 24, 2011
    Publication date: October 6, 2011
    Applicant: FUJIFILM CORPORATION
    Inventors: BUNGO SHIGETA, IPPEI TAKAHASHI
  • Patent number: 6670627
    Abstract: A surface examining apparatus irradiates an examinatorial light from a projector on a examined body that runs in a Z-direction. The projector is arranged at a distance from the surface of the examined body in a Y-direction orthogonal to the surface thereof and arranged inwardly of outer ends of the examined body in the width direction thereof in the X-direction orthogonal to the Z-direction and the Y-direction, and which detects the light that has passed through the examined body thereby to examine surface defects of the examined body. A light shielding unit is provided, which includes a light shielding member arranged between the projector and the examined body and shields the examinatorial light that is going to travel outwards from the outer end in the width direction of the examined body, and a moving unit that moves the light shielding member in the X-direction and in the Y-direction.
    Type: Grant
    Filed: April 12, 2002
    Date of Patent: December 30, 2003
    Assignee: Fuji Photo Film Co., Ltd.
    Inventors: Ippei Takahashi, Hiroshi Tsuzaki
  • Publication number: 20020148985
    Abstract: A surface examining apparatus irradiates an examinatorial light from a projector on a examined body that runs in a Z-direction. The projector is arranged at a distance from the surface of the examined body in a Y-direction orthogonal to the surface thereof and arranged inwardly of outer ends of the examined body in the width direction thereof in the X-direction orthogonal to the Z-direction and the Y-direction, and which detects the light that has passed through the examined body thereby to examine surface defects of the examined body. A light shielding unit is provided, which includes a light shielding member arranged between the projector and the examined body and shields the examinatorial light that is going to travel outwards from the outer end in the width direction of the examined body, and a moving unit that moves the light shielding member in the X-direction and in the Y-direction.
    Type: Application
    Filed: April 12, 2002
    Publication date: October 17, 2002
    Applicant: FUJI PHOTO FILM CO., LTD.
    Inventors: Ippei Takahashi, Hiroshi Tsuzaki
  • Patent number: 5166535
    Abstract: A surface inspecting apparatus generates an inspecting width gate signal by in a procedure wherein when the subject matter is subjected to the scanning via the light beam, a counting means digitizes the detected position of both the front and rear ends of the subject and then an operating means calculates values which indicate the positions included within the range between both of the ends, thus generating the inspecting width gate signal. Consequently, it is possible to inspect any subject matter without manually resetting the effective inspecting range whenever a subject matter changes in width.
    Type: Grant
    Filed: October 17, 1990
    Date of Patent: November 24, 1992
    Assignee: Fuji Photo Film Co., Ltd.
    Inventor: Ippei Takahashi
  • Patent number: 4982105
    Abstract: An apparatus for inspecting the surface of a web material moving lengthwise at a constant speed by scanning the surface in the direction of the width of the surface with a light beam. The scanned beam modulated by the surface is received and converted into an electric signal which is divided into division signals representing lengthwise areas of the surface. At least one of the lengthwise areas or lanes into which the surface is divided is specified to be subjected to surface inspection. Surface signals of the specified lengthwise areas or lanes are separated from the other surface signals and evaluated for qualifying the surface of the web material.
    Type: Grant
    Filed: March 20, 1989
    Date of Patent: January 1, 1991
    Assignee: Fuji Photo Film Co., Ltd.
    Inventor: Ippei Takahashi