Abstract: A RAMO4 substrate includes a single crystal represented by a formula of RAMO4 (in the formula, R indicates one or a plurality of trivalent elements selected from a group consisting of Sc, In, Y, and a lanthanoid element, A indicates one or a plurality of trivalent elements selected from a group consisting of Fe(III), Ga, and Al, and M indicates one or a plurality of bivalent elements selected from a group consisting of Mg, Mn, Fe(II), Co, Cu, Zn, and Cd). An epitaxially-grown surface is provided on one surface of the RAMO4 substrate, a satin-finish surface is provided on another surface. The satin-finish surface has surface roughness which is larger than that of the epitaxially-grown surface.

Abstract: A RAMO4 substrate is formed from single crystal represented by a formula of RAMO4 (in the formula, R indicates one or a plurality of trivalent elements selected from a group consisting of Sc, In, Y, and a lanthanoid element, A indicates one or a plurality of trivalent elements selected from a group consisting of Fe(III), Ga, and Al, and M indicates one or a plurality of bivalent elements selected form a group consisting of Hg, Mn, Fe(II), Co, Cu, Zn, and Cd). An epitaxially-grown surface is provided on at least one surface of the RAMO4 substrate. The epitaxially-grown surface includes a plurality of cleavage surfaces which are regularly distributed, and are separated from each other.

Abstract: A GaN substrate that comprises a GaN single crystal having a Ga face and a N face on surfaces thereof, wherein the Ga face includes: a flat face portion; and a curved face portion that surrounds a circumference of the flat face portion, and wherein an off-angle distribution of the N face is larger than an off-angle distribution of the Ga face.

Abstract: A RAMO4 substrate containing an RAMO4 base material part containing a single crystal represented by the general formula RAMO4 (wherein R represents one or a plurality of trivalent elements selected from a group of elements including: Sc, In, Y, and a lanthanoid element, A represents one or a plurality of trivalent elements selected from a group of elements including: Fe(III), Ga, and Al, and M represents one or a plurality of divalent elements selected from a group of elements including: Mg, Mn, Fe(II), Co, Cu, Zn, and Cd), the RAMO4 base material part having a beveled portion at an edge portion thereof.

Abstract: A processing apparatus includes a rotary table that causes a workpiece to rotate around a rotary axis, a roller-shaped member that rotates on an axis orthogonal to the rotary axis of the rotary table, a vertical driving section that is driven in a direction of the rotary axis of the rotary table so as to bring the roller-shaped member and the workpiece into contact with each other, an ultraviolet ray irradiation source that irradiates a portion between the roller-shaped member and the workpiece with an ultraviolet ray, a polishing material that is supplied to the portion between the roller-shaped member and the workpiece, and a light scattering medium that is supplied to the portion between the roller-shaped member and the workpiece and scatters an ultraviolet ray from the ultraviolet ray irradiation source.

Abstract: A RAMO4 substrate containing an RAMO4 base material part containing a single crystal represented by the general formula RAMO4 (wherein R represents one or a plurality of trivalent elements selected from a group of elements including: Sc, In, Y, and a lanthanoid element, A represents one or a plurality of trivalent elements selected from a group of elements including: Fe(III), Ga, and Al, and M represents one or a plurality of divalent elements selected from a group of elements including: Mg, Mn, Fe(II), Co, Cu, Zn, and Cd), the RAMO4 base material part having a beveled portion at an edge portion thereof.

Abstract: A method for producing a Group III nitride crystal, includes: preparing an RAMO4 substrate containing a single crystal represented by the general formula RAMO4 (wherein R represents one or a plurality of trivalent elements selected from a group consisting of Sc, In, Y, and a lanthanoid element, A represents one or a plurality of trivalent elements selected from a group consisting of Fe(III), Ga, and Al, and M represents one or a plurality of divalent elements selected from a group consisting of Mg, Mn, Fe(II), Co, Cu, Zn, and Cd) and having a notch on a side portion thereof; growing a Group III nitride crystal on the RAMO4 substrate; and cleaving the RAMO4 substrate from the notch.

Abstract: A RAMO4 substrate includes a single crystal represented by a formula of RAMO4 (in the formula, R indicates one or a plurality of trivalent elements selected from a group consisting of Sc, In, Y, and a lanthanoid element, A indicates one or a plurality of trivalent elements selected from a group consisting of Fe(III), Ga, and Al, and M indicates one or a plurality of bivalent elements selected from a group consisting of Mg, Mn, Fe(II), Co, Cu, Zn, and Cd). An epitaxially-grown surface is provided on at least one surface of the RAMO4 substrate. An unevenness having a height of 500 nm or more is not provided on the epitaxially-grown surface.

Abstract: A RAMO4 substrate includes a single crystal represented by a formula of RAMO4 (in the formula, R indicates one or a plurality of trivalent elements selected from a group consisting of Sc, In, Y, and a lanthanoid element, A indicates one or a plurality of trivalent elements selected from a group consisting of Fe(III), Ga, and Al, and M indicates one or a plurality of bivalent elements selected from a group consisting of Mg, Mn, Fe(II), Co, Cu, Zn, and Cd). An epitaxially-grown surface is provided on one surface of the RAMO4 substrate, a satin-finish surface is provided on another surface. The satin-finish surface has surface roughness which is larger than that of the epitaxially-grown surface.

Abstract: A RAMO4 substrate is formed from single crystal represented by a formula of RAMO4 (in the formula, R indicates one or a plurality of trivalent elements selected from a group consisting of Sc, In, Y, and a lanthanoid element, A indicates one or a plurality of trivalent elements selected from a group consisting of Fe(III), Ga, and Al, and M indicates one or a plurality of bivalent elements selected form a group consisting of Hg, Mn, Fe(II), Co, Cu, Zn, and Cd). An epitaxially-grown surface is provided on at least one surface of the RAMO4 substrate. The epitaxially-grown surface includes a plurality of cleavage surfaces which are regularly distributed, and are separated from each other.

Abstract: A board connecting connector includes a board retaining portion and a terminal retaining portion. The board retaining portion accommodates a board, and the terminal retaining portion accommodates terminals. When the board retaining portion and the terminal retaining portions are in a state of being fit to each other, terminal portions provided on a sheet surface of the board and elastic contact portions of the terminals contact to each other. Each of the terminals includes an elastic deformation portion having a contact portion and an inspection portion, with which an inspection jig contacts to inspect the terminal. The elastic deformation portion is formed by notching on a surface of a cylindrical part that is formed by bending sheet metal. The inspection portion is provided on a different surface from the cylindrical surface, using a part of the sheet metal.

Abstract: A board connecting connector includes a board retaining portion and a terminal retaining portion. The board retaining portion accommodates a board, and the terminal retaining portion accommodates terminals. When the board retaining portion and the terminal retaining portions are in a state of being fit to each other, terminal portions provided on a sheet surface of the board and elastic contact portions of the terminals contact to each other. Each of the terminals includes an elastic deformation portion having a contact portion and an inspection portion, with which an inspection jig contacts to inspect the terminal. The elastic deformation portion is formed by notching on a surface of a cylindrical part that is formed by bending sheet metal. The inspection portion is provided on a different surface from the cylindrical surface, using a part of the sheet metal.

Abstract: A processing apparatus includes a rotary table that causes a workpiece to rotate around a rotary axis, a roller-shaped member that rotates on an axis orthogonal to the rotary axis of the rotary table, a vertical driving section that is driven in a direction of the rotary axis of the rotary table so as to bring the roller-shaped member and the workpiece into contact with each other, an ultraviolet ray irradiation source that irradiates a portion between the roller-shaped member and the workpiece with an ultraviolet ray, a polishing material that is supplied to the portion between the roller-shaped member and the workpiece, and a light scattering medium that is supplied to the portion between the roller-shaped member and the workpiece and scatters an ultraviolet ray from the ultraviolet ray irradiation source.

Abstract: To provide a structural color body that exhibits color using physical phenomena such as reflection, interference, diffraction, and scattering of light, and in which the decorative effect can be further enhanced, the present invention configures a structural color body by combining a plurality of structural color portions that structurally exhibit different colors from each other.

Abstract: A cutting device is provided which can simultaneously achieve a shorter machining time, lower machining resistance during cutting, and high-precision machining. To be specific, the cutting device of the present invention includes a three-axis tool unit including a first actuator operating in a u direction, a second actuator operating in a v direction orthogonal to the u direction, a third actuator operating in a w direction orthogonal to the u direction and the v direction, a tool holder disposed at the intersection of the u direction, the v direction, and the w direction, a tool mounted in the tool holder, and three sensors for measuring the displacements of the first, second, and third actuators, respectively and feeding back displacement signals representing the measured displacements, wherein the first, second, and third actuators of the three-axis tool unit vibrate so as to perform vibration cutting on a work material.

Abstract: A triaxial tool unit includes three actuators 3, 4, 5 which operate in three-axis directions orthogonal to one another, a tool holder 7 provided at an intersection on axial lines in operating directions of the actuators 3, 4 and 5, and sensors 8, 9 and 10 which measure displacement amounts in the operating directions of the actuators 3, 4 and 5, and has a structure in which the sensors 8, 9 and 10 are disposed so that extension lines in respective sensing directions intersect with one another at one point.

Abstract: To provide a structural color body that exhibits color using physical phenomena such as reflection, interference, diffraction, and scattering of light, and in which the decorative effect can be further enhanced, the present invention configures a structural color body by combining a plurality of structural color portions that structurally exhibit different colors from each other.

Abstract: An object of the present invention is to provide a controller of a three-axis tool unit which can compensate for mutual interference caused by the dynamic behaviors of three axes for operating a tool in three directions orthogonal to one another. The controller of the three-axis tool unit of the present invention includes a noninteracting control section which calculates, by using transfer functions, correction values for compensating for mutual interference caused by the dynamic behaviors of a first mechanism including a first actuator, a tool holder, and the tool, a second mechanism including a second actuator, the tool holder, and the tool, and a third mechanism including a third actuator, the tool holder, and the tool, and corrects the target displacements of the first, second, third actuators by using the correction values, the transfer functions indicating mutual influence of the dynamic behaviors of the first, second, and third mechanisms.

Abstract: A cutting device is provided which can simultaneously achieve a shorter machining time, lower machining resistance during cutting, and high-precision machining. To be specific, the cutting device of the present invention includes a three-axis tool unit including a first actuator operating in a u direction, a second actuator operating in a v direction orthogonal to the u direction, a third actuator operating in a w direction orthogonal to the u direction and the v direction, a tool holder disposed at the intersection of the u direction, the v direction, and the w direction, a tool mounted in the tool holder, and three sensors for measuring the displacements of the first, second, and third actuators, respectively and feeding back displacement signals representing the measured displacements, wherein the first, second, and third actuators of the three-axis tool unit vibrate so as to perform vibration cutting on a work material.

Abstract: A triaxial tool unit includes three actuators 3, 4, 5 which operate in three-axis directions orthogonal to one another, a tool holder 7 provided at an intersection on axial lines in operating directions of the actuators 3, 4 and 5, and sensors 8, 9 and 10 which measure displacement amounts in the operating directions of the actuators 3, 4 and 5, and has a structure in which the sensors 8, 9 and 10 are disposed so that extension lines in respective sensing directions intersect with one another at one point.