Patents by Inventor Ivan K. Schuller

Ivan K. Schuller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9965586
    Abstract: Methods, systems, and devices are disclosed for processing macromolecule sequencing data with substantial noise reduction. In one aspect, a method for reducing noise in a sequential measurement of a macromolecule comprising serial subunits includes cross-correlating multiple measured signals of a physical property of subunits of interest of the macromolecule, the multiple measured signals including the time data associated with the measurement of the signal, to remove or at least reduce signal noise that is not in the same frequency and in phase with the systematic signal contribution of the measured signals.
    Type: Grant
    Filed: March 20, 2015
    Date of Patent: May 8, 2018
    Assignees: The Regents of the University of California, Los Alamos National Laboratory
    Inventors: Ivan K. Schuller, Massimiliano Di Ventra, Alexander Balatsky
  • Patent number: 9419209
    Abstract: Methods, systems, and devices are disclosed for controlling the magnetic and electrical properties of materials. In one aspect, a multi-layer structure includes a first layer comprising a ferromagnetic or ferrimagnetic material, and a second layer positioned within the multi-layer structure such that a first surface of the first layer is in direct physical contact with a second surface of the second layer. The second layer includes a material that undergoes structural phase transitions and metal-insulator transitions upon experiencing a change in temperature. One or both of the first and second layers are structured to allow a structural phase change associated with the second layer cause a change magnetic properties of the first layer.
    Type: Grant
    Filed: December 15, 2014
    Date of Patent: August 16, 2016
    Assignee: The Regents Of The University Of California
    Inventors: Ivan K. Schuller, Jose de La Venta Granda, Siming Wang, Gabriel Ramirez, Mikhail Erekhinskiy, Amos Sharoni
  • Publication number: 20150347675
    Abstract: Methods, systems, and devices are disclosed for processing macromolecule sequencing data with substantial noise reduction. In one aspect, a method for reducing noise in a sequential measurement of a macromolecule comprising serial subunits includes cross-correlating multiple measured signals of a physical property of subunits of interest of the macromolecule, the multiple measured signals including the time data associated with the measurement of the signal, to remove or at least reduce signal noise that is not in the same frequency and in phase with the systematic signal contribution of the measured signals.
    Type: Application
    Filed: March 20, 2015
    Publication date: December 3, 2015
    Inventors: Ivan K. Schuller, Massimiliano Di Ventra, Alexander Balatsky
  • Publication number: 20150207060
    Abstract: Methods, systems, and devices are disclosed for controlling the magnetic and electrical properties of materials. In one aspect, a multi-layer structure includes a first layer comprising a ferromagnetic or ferrimagnetic material, and a second layer positioned within the multi-layer structure such that a first surface of the first layer is in direct physical contact with a second surface of the second layer. The second layer includes a material that undergoes structural phase transitions and metal-insulator transitions upon experiencing a change in temperature. One or both of the first and second layers are structured to allow a structural phase change associated with the second layer cause a change magnetic properties of the first layer.
    Type: Application
    Filed: December 15, 2014
    Publication date: July 23, 2015
    Inventors: Ivan K. Schuller, Jose de La Venta Granda, Siming Wang, Gabriel Ramirez, Mikhail Erekhinskiy, Amos Sharoni
  • Patent number: 7764454
    Abstract: Magnetic materials and methods for using ferromagnetic and antiferromagnetic coupling and exchange bias for binary and multistate magnetic memory device.
    Type: Grant
    Filed: July 13, 2005
    Date of Patent: July 27, 2010
    Assignee: The Regents of the University of California
    Inventors: Igor V. Roshchin, Oleg Petracic, Rafael Morales, Zhi-Pan Li, Xavier Batlle, Ivan K. Schuller
  • Publication number: 20080084627
    Abstract: Magnetic materials and methods for using ferromagnetic and antiferromagnetic coupling and exchange bias for binary and multistate magnetic memory device.
    Type: Application
    Filed: July 13, 2005
    Publication date: April 10, 2008
    Inventors: Igor V. Roshchin, Oleg Petracic, Rafael Morales, Zhi-Pan Li, Xavier Batlle, Ivan K. Schuller
  • Patent number: 5432149
    Abstract: A weak link is patterned from a high-temperature superconducting film using standard lithographic techniques. Once the area in which the weak link is to be located is defined, the remainder of the film is covered with an oxygen-impermeable material. The oxygen is then removed in the weak link area by placing the sample in a vacuum furnace at a sufficient temperature to drive out the oxygen. Once the oxygen is removed, the weak link becomes non-superconducting. A high power solid state laser is placed in front of the weak link, and superconductivity is restored in the weak link area, in situ. The process is performed in a liquid nitrogen environment.
    Type: Grant
    Filed: April 8, 1994
    Date of Patent: July 11, 1995
    Assignee: Regents of the University of California
    Inventors: Ivan K. Schuller, Gladys L. Nieva, Julio J. Guimpel, Eduardo Osquiguil, Yvan Bruynseraede
  • Patent number: 4844989
    Abstract: A superconducting structure is formed by depositing alternate layers of aluminum nitride and niobium nitride on a substrate. Deposition methods include dc magnetron reactive sputtering, rf magnetron reactive sputtering, thin-film diffusion, chemical vapor deposition, and ion-beam deposition. Structures have been built with layers of niobium nitride and aluminum nitride having thicknesses in a range of 20 to 350 Angstroms. Best results have been achieved with films of niobium nitride deposited to a thickness of approximately 70 Angstroms and aluminum nitride deposited to a thickness of approximately 20 Angstroms. Such films of niobium nitride separated by a single layer of aluminum nitride are useful in forming Josephson junctions. Structures of 30 or more alternating layers of niobium nitride and aluminum nitride are useful when deposited on fixed substrates or flexible strips to form bulk superconductors for carrying electric current. They are also adaptable as voltage-controlled microwave energy sources.
    Type: Grant
    Filed: March 19, 1987
    Date of Patent: July 4, 1989
    Assignee: The University of Chicago (Arch Development Corp.)
    Inventors: James M. Murduck, Yves J. Lepetre, Ivan K. Schuller, John B. Ketterson
  • Patent number: 4564564
    Abstract: A superconducting tape or wire with an improved critical field is formed of alternating layers of a niobium-containing superconductor such as Nb, NbTi, Nb.sub.3 Sn or Nb.sub.3 Ge with a thickness in the range of about 0.5-1.5 times its coherence length, supported and separated by layers of copper with each copper layer having a thickness in the range of about 170-600 .ANG..
    Type: Grant
    Filed: August 16, 1983
    Date of Patent: January 14, 1986
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: Ivan K. Schuller, John B. Ketterson, Indrajit Banerjee
  • Patent number: 4454495
    Abstract: A thin film resistor having a controlled temperature coefficient of resistance (TCR) ranging from negative to positive degrees kelvin and having relatively high resistivity. The resistor is a multilayer superlattice crystal containing a plurality of alternating, ultra-thin layers of two different metals. TCR is varied by controlling the thickness of the individual layers. The resistor can be readily prepared by methods compatible with thin film circuitry manufacturing techniques.
    Type: Grant
    Filed: August 31, 1982
    Date of Patent: June 12, 1984
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: Thomas R. Werner, Charles M. Falco, Ivan K. Schuller
  • Patent number: 4448854
    Abstract: A new material consisting of a multilayer crystalline structure which is coherent perpendicular to the layers and where each layer is composed of a single crystalline element. The individual layers may vary from 2.ANG. to 100.ANG. or more in thickness.
    Type: Grant
    Filed: November 15, 1982
    Date of Patent: May 15, 1984
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: Ivan K. Schuller, Charles M. Falco
  • Patent number: 4430183
    Abstract: A new material consisting of a coherent multilayer crystal of two or more elements where each layer is composed of a single element. Each layer may vary in thickness from about 2 .ANG. to 2500 .ANG.. The multilayer crystals are prepared by sputter deposition under conditions which slow the sputtered atoms to near substrate temperatures before they contact the substrate.
    Type: Grant
    Filed: September 27, 1982
    Date of Patent: February 7, 1984
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: Ivan K. Schuller, Charles M. Falco
  • Patent number: 4266008
    Abstract: An improved method of preparing thin film superconducting electrical circuits of niobium or niobium compounds in which a thin film of the niobium or niobium compound is applied to a nonconductive substrate, and covered with a layer of photosensitive material. The sensitive material is in turn covered with a circuit pattern exposed and developed to form a mask of the circuit in photoresistive material on the surface of the film. The unmasked excess niobium film is removed by contacting the substrate with an aqueous etching solution of nitric acid, sulfuric acid and hydrogen fluoride, which will rapidly etch the niobium compound without undercutting the photoresist. A modification of the etching solution will permit thin films to be lifted from the substrate without further etching.
    Type: Grant
    Filed: November 23, 1979
    Date of Patent: May 5, 1981
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: Robert T. Kampwirth, Ivan K. Schuller, Charles M. Falco