Patents by Inventor J. D. Hwang

J. D. Hwang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5670414
    Abstract: The present invention relates to a graded-gap process for forming a SiC/Si heterojunction electrical element and includes steps of a) provide a Si substrate; b) introduce a hydrogen containing gas stream to the Si substrate; c) introduce a silane-containing gas stream of a constant flow rate to the Si substrate for reacting with the hydrogen-containing gas stream for a first period of time; d) introduce an alkanes-containing gas stream of a gradually changing flow rate to the Si substrate for reacting with the hydrogen- containing gas stream and the silane-containing gas stream to grow a SiC layer on the Si substrate for a second period of time; and e) introduce the alkanes-containing gas stream at a constant flow rate for reacting with the hydrogen-containing gas stream and the silane-containing gas stream for a third period of time. Such process can grow an excellent graded band-gap SiC/Si heterojunction diode with low cost.
    Type: Grant
    Filed: February 6, 1996
    Date of Patent: September 23, 1997
    Assignee: National Science Council
    Inventors: Y. K. Fang, J. D. Hwang