Patents by Inventor Ja-Hwan KU

Ja-Hwan KU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test chamber and test apparatus having the same
    Patent number: 11193970
    Abstract: Disclosed are a test chamber and a test apparatus having the same. The test chamber includes a test compartment configured to support a plurality of test boards, each being configured to secure a test object. The test chamber applies a test signal to the test object. The test chamber includes an inlet side and a discharge side, and a supply duct vertically extending along a height of the test compartment. The supply duct supplies the inlet side of the test compartment with the test fluid. The test chamber includes a fluid controller to uniformly control a distribution of a test fluid in the supply duct and uniformly supply the test compartment with the test fluid. The disclosed test chamber and test apparatus provide a uniform test temperature and thereby improve a test reliability of a test object such as a semiconductor or semiconductor package.
    Type: Grant
    Filed: September 5, 2019
    Date of Patent: December 7, 2021
    Assignees: SAMSUNG ELECTRONICS CO., LTD., KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Seon-Mi Lee, Sung Jin Kim, Ja-Hwan Ku, Jae-Hyun Kim, Gilho Lee, Dahm Yu, Jonghyun Lim
  • TEST CHAMBER AND TEST APPARATUS HAVING THE SAME
    Publication number: 20200271715
    Abstract: Disclosed are a test chamber and a test apparatus having the same. The test chamber includes a test compartment configured to support a plurality of test boards, each being configured to secure a test object. The test chamber applies a test signal to the test object. The test chamber includes an inlet side and a discharge side, and a supply duct vertically extending along a height of the test compartment. The supply duct supplies the inlet side of the test compartment with the test fluid. The test chamber includes a fluid controller to uniformly control a distribution of a test fluid in the supply duct and uniformly supply the test compartment with the test fluid. The disclosed test chamber and test apparatus provide a uniform test temperature and thereby improve a test reliability of a test object such as a semiconductor or semiconductor package.
    Type: Application
    Filed: September 5, 2019
    Publication date: August 27, 2020
    Applicant: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Seon-Mi LEE, Sung Jin KIM, Ja-Hwan KU, Jae-Hyun KIM, Gilho LEE, Dahm YU, Jonghyun LIM