Abstract: A detector arrangement is disclosed for an industrial CT x-ray system which uses a three dimensional cone beam to irradiate the specimen and a large two dimensional scintillation screen to develop a light image corresponding to the energy of the attenuated radiation beams. The light image is focused by a special lens arrangement with zoom capability onto the photocathode of an intensifier. The intensified light image developed is transmitted by fiberoptics to a plurality of CCD chips, each chip developing electrical signals corresponding to a segment of the image developed in the intensifier. The chips are clocked in a predetermined manner based on a prior information developed in an initial scan to produce a high resolution image of large industrial objects in a short time.