Patents by Inventor Jack J. Wagner

Jack J. Wagner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5247558
    Abstract: An x-ray sedimentation particle size analyzer in which data is taken only at particular positions along the sedimentation cell, and each such position is individually calibrated. Presentation of the data in the form of a particle size distribution curve can be accomplished very accurately using interpolation techniques. The sedimentation cell design is free of the effects of undesirable density gradients, capable of detecting and removing bubbles, capable of attaining a highly uniform dispersion of sample prior to sedimentation, and including a safety interlock device for blocking x-ray projection when the cell is being accessed.
    Type: Grant
    Filed: October 26, 1988
    Date of Patent: September 21, 1993
    Assignee: Micromeritics Instrument Corporation
    Inventors: Warren P. Hendrix, James P. Olivier, Jack J. Wagner, Clyde Orr, Jr.
  • Patent number: 4920550
    Abstract: An x-ray sedimentation particle size analyzer in which data is taken only at particular positions along the sedimentation cell, and each such position is individually calibrated. Presentation of the data in the form of a particle size distribution curve can be accomplished very accurately using interpolation techniques. The sedimentation cell design is free of the effects of undesirable density gradients, capable of detecting and removing bubbles, capable of attaining a highly uniform dispersion of sample prior to sedimentation, and including a safety interlock device for blocking x-ray projection when the cell is being accessed.
    Type: Grant
    Filed: November 25, 1987
    Date of Patent: April 24, 1990
    Assignee: Micromeritics Instrument Corporation
    Inventors: James P. Olivier, Mary F. Kane, Clyde Orr, Jr., Charles L. Laughinghouse, Jack J. Wagner, Samuel V. Tidwell
  • Patent number: 4853551
    Abstract: An x-ray sedimentation particle size analyzer in which data is taken only at particular positions along the sedimentation cell, and each such position is individually calibrated. Presentation of the data in the form of a particle size distribution curve can be accomplished very accurately using interpolation techniques. The sedimentation cell design is free of the effects of undesirable density gradients, capable of detecting and removing bubbles, capable of attaining a highly uniform dispersion of sample prior to sedimentation, and including a safety interlock device for blocking x-ray projection when the cell is being accessed.
    Type: Grant
    Filed: October 30, 1987
    Date of Patent: August 1, 1989
    Assignee: Micromeritics Instrument Corporation
    Inventors: Jack J. Wagner, Samuel V. Tidwell