Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to identify statistical outliers in test data for components, including local outliers representing outliers within subsets of larger data populations.

Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.

Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.

Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.

Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.

Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.

Abstract: Methods and apparatus for automatic test equipment enhance performance of automatic test equipment and provide test engineering tools. Various aspects of the present invention provide improved test times and other performance characteristics for ATE. In addition, a test system according to various aspects of the invention may include test tools to assist personnel in test processes.

Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to identify statistical outliers in test data for components, including local outliers representing outliers within subsets of larger data populations.

Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.

Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.

Abstract: A method and apparatus for enhancing a test process according to various aspects of the present invention includes analyzing test data and generating recommendations for enhancing the test process. Generally, an exemplary test system comprises an analyzing system for analyzing test data generated by the test process and a recommendation system for recommending enhancements to the test process based on the analysis. The exemplary system is configured to generate characteristic values, such as process control statistics, based on raw test data. The method and apparatus may also analyze test data that has been filtered to remove selected types of data, such as outliers, failures, and/or missing data. Further, the analysis may classify the various tests according to the characteristic values. In addition, the analysis may identify correlations between various tests based on at least one of the raw test data and the filtered test data.

Abstract: Methods and apparatus for statistical process control of test according to various aspects of the present invention optimize the wait period between applying input signals and collecting output test signal data. In one embodiment, a tester identifies one or more acceptable systems, circuit boards, or components and performs testing to establish baseline test data. The systems, circuit boards, or components are then tested using a series of different waiting periods to generate wait time optimization data. The wait time optimization data and the baseline data are then statistically analyzed, for example using statistical process control techniques, to identify a wait period for which the test process is out of control. An optimized wait period is then selected that is suitable to maintain the test process under control.