Abstract: A method includes determining, by a first component of a memory sub-system controller, a first temperature value of the memory subsystem controller. The method can further include determining, by a second component of a non-volatile memory device, a second temperature value of the non-volatile memory device coupled to the memory sub-system controller. The method can further include modifying a data parameter in response to at least one of the first temperature value or the second temperature value exceeding a threshold temperature value.

Abstract: A controller of a non-volatile, dual, in-line memory modules (NVDIMM). A NVDIMM is configured to predict thermal events associated with save and restore operations prior to starting the save or restore operation. The controller of the NVDIMM includes a thermal event prediction circuit to predict whether a thermal event will occur in response to a request to perform a save or restore operation, and to cause the controller to perform an action in response to a determination that a thermal event is likely to occur. To predict the thermal event, the controller may be configured to predict a peak temperature of the save or restore operation based on a predicted temperature increase from an initial or starting temperature. The predicted temperature increase may be based on a rate of temperature change during the save or restore operation and a duration of the save or restore operation.

Abstract: Methods, apparatuses, and systems related to a memory device are described. A controller may be configured to predict a temperature of a memory based on a real-time temperature of the controller. Based on the predicted temperature of the memory, the controller may execute a remedial action to reduce an actual temperature of the memory for executing an upcoming operation.

Abstract: A controller of a non-volatile, dual, in-line memory modules (NVDIMM). A NVDIMM is configured to predict thermal events associated with save and restore operations prior to starting the save or restore operation. The controller of the NVDIMM includes a thermal event prediction circuit to predict whether a thermal event will occur in response to a request to perform a save or restore operation, and to cause the controller to perform an action in response to a determination that a thermal event is likely to occur. To predict the thermal event, the controller may be configured to predict a peak temperature of the save or restore operation based on a predicted temperature increase from an initial or starting temperature. The predicted temperature increase may be based on a rate of temperature change during the save or restore operation and a duration of the save or restore operation.

Abstract: Methods, apparatuses, and systems related to a memory device are described. A controller may be configured to predict a temperature of a memory based on a real-time temperature of the controller. Based on the predicted temperature of the memory, the controller may execute a remedial action to reduce an actual temperature of the memory for executing an upcoming operation.

Abstract: A method includes determining, by a first component of a memory sub-system controller, a first temperature value of the memory subsystem controller. The method can further include determining, by a second component of a non-volatile memory device, a second temperature value of the non-volatile memory device coupled to the memory sub-system controller. The method can further include modifying a data parameter in response to at least one of the first temperature value or the second temperature value exceeding a threshold temperature value.

Abstract: Methods, apparatuses, and systems related to a memory device are described. The memory device may include a non-volatile (NV) memory and a controller. The controller may be configured to predict a temperature of the NV memory based on a real-time temperature of the controller. Based on the predicted temperature of the NV memory, the controller may execute a remedial action to reduce an actual temperature of the NV memory for executing an upcoming operation.

Abstract: Methods, apparatuses, and systems related to a memory device are described. The memory device may include a non-volatile (NV) memory and a controller. The controller may be configured to predict a temperature of the NV memory based on a real-time temperature of the controller. Based on the predicted temperature of the NV memory, the controller may execute a remedial action to reduce an actual temperature of the NV memory for executing an upcoming operation.

Abstract: A method includes receiving, by a memory sub-system and responsive to initiation of an operation, a bit string containing information corresponding to initiation of the operation. The operation can be initiated by circuitry external to the memory sub-system and the bit string can be generated by circuitry external to the memory sub-system. The method can further include storing, responsive to receipt of the bit string, the bit string in a first portion of a plurality of storage locations resident on the memory sub-system.

Abstract: A method includes determining, by a first component of a memory sub-system controller, a first temperature value of the memory subsystem controller. The method can further include determining, by a second component of a non-volatile memory device, a second temperature value of the non-volatile memory device coupled to the memory sub-system controller. The method can further include modifying a data parameter in response to at least one of the first temperature value or the second temperature value exceeding a threshold temperature value.

Abstract: A method includes determining, by a first component of a memory sub-system controller, a first temperature value of the memory subsystem controller. The method can further include determining, by a second component of a non-volatile memory device, a second temperature value of the non-volatile memory device coupled to the memory sub-system controller. The method can further include modifying a data parameter in response to at least one of the first temperature value or the second temperature value exceeding a threshold temperature value.