Patents by Inventor Jae Hyun Ju

Jae Hyun Ju has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • MODULAR PIM ANALYZER AND METHOD USING THE SAME
    Publication number: 20180219651
    Abstract: A modular PIM analyzer includes: a first signal amplification module provided with a first signal generator for generating a first frequency signal under control of a first MCU, and a first power amplifier for generating a first amplified frequency signal through the amplification of the first frequency signal under control of a first ALC circuit; a second signal amplification module provided with a second signal generator for generating a second frequency signal under control of a second MCU, and a second power amplifier for generating a second amplified frequency signal through the amplification of the second frequency signal under control of a second ALC circuit; and a triplexer module for extracting a test frequency signal using the first amplified frequency signal and the second amplified frequency signal, transmitting the test frequency signal to a device under test, and receiving a PIM signal being reflected from the device under test
    Type: Application
    Filed: March 16, 2017
    Publication date: August 2, 2018
    Applicant: INNERTRON, INC.
    Inventors: Jae Hyun JU, Jun Ho KANG, Hak Rae CHO, Moon Bong KO
  • Modular PIM analyzer and method using the same
    Patent number: 10038522
    Abstract: A modular PIM analyzer includes: a first signal amplification module provided with a first signal generator for generating a first frequency signal under control of a first MCU, and a first power amplifier for generating a first amplified frequency signal through the amplification of the first frequency signal under control of a first ALC circuit; a second signal amplification module provided with a second signal generator for generating a second frequency signal under control of a second MCU, and a second power amplifier for generating a second amplified frequency signal through the amplification of the second frequency signal under control of a second ALC circuit; and a triplexer module for extracting a test frequency signal using the first amplified frequency signal and the second amplified frequency signal, transmitting the test frequency signal to a device under test, and receiving a PIM signal being reflected from the device under test.
    Type: Grant
    Filed: March 16, 2017
    Date of Patent: July 31, 2018
    Assignee: INNERTRON, INC.
    Inventors: Jae Hyun Ju, Jun Ho Kang, Hak Rae Cho, Moon Bong Ko