Abstract: A test system is provided. The test system includes a test board provided with a near filed communication chip and including an antenna; a tag holding apparatus including first and second tag holders accommodating first and second NFC tags, respectively, and a first controller configured to adjust a position of each of the first and second tag holders; and a second controller configured to: transmit a first test signal to the test board to perform a first communication test for the NFC chip and the first NFC tag; receive a result of the first communication test; and determine whether or not the NFC chip normally reads first data stored in the first NFC tag. The first controller is configured to place the first NFC tag and the antenna to be spaced apart from each other by a first distance based on a type of the first NFC tag and face each other, and rotate the first and second tag holders when the first communication test is completed.

Abstract: A test system is provided. The test system includes a teat board provided with a near filed communication chip and including an antenna; a tag holding apparatus including first and second tag holders accommodating first and second NFC tags, respectively, and a first controller configured to adjust a position of each of the first and second tag holders; and a second controller configured to: transmit a first test signal to the test board to perform a first communication test for the NFC chip and the first NFC tag; receive a result of the first communication test; and determine whether or not the NFC chip normally reads first data stored in the first NFC tag. The first controller is configured to place the first NFC tag and the antenna to be spaced apart from each other by a first distance based on a type of the first NFC tag and face each other, and rotate the first and second tag holders when the first communication test is completed.

Abstract: A method for manufacturing a microcantilever having a cantilever and a functional probe provided on the cantilever may include steps of: providing a probe mold which accommodates a liquid probe solution in which quantum dots for the functional probe are mixed, and has a groove corresponding to the shape of the functional probe; bringing a cantilever into contact with the probe mold on which the groove is formed to correspond to the location of the functional probe; forming the functional probe on the cantilever by curing the probe solution accommodated in the groove in a state where the cantilever contacts the probe mold; and separating the cantilever from the probe mold.

Abstract: A method for manufacturing a microcantilever having a cantilever and a functional probe provided on the cantilever may include steps of: providing a probe mold which accommodates a liquid probe solution in which quantum dots for the functional probe are mixed, and has a groove corresponding to the shape of the functional probe; bringing a cantilever into contact with the probe mold on which the groove is formed to correspond to the location of the functional probe; forming the functional probe on the cantilever by curing the probe solution accommodated in the groove in a state where the cantilever contacts the probe mold; and separating the cantilever from the probe mold.

Abstract: A method for removing the oscillation and reducing the position error of a load carried by an industrial crane comprising: a non-oscillation control algorithm which provides the trolley and load system with sufficient damping in order to remove the oscillations of the load by adjusting the trolley velocity in accordance with the oscillation angle of the load measured by an angle measuring device, a position control algorithm which controls the load to stop at the exact destination by generating the crane velocity proportional to the error between desired and actual positions, and a velocity paten plan algorithm which establishes the overall trolley velocity including a two-stage linear and parabolic deceleration of the trolley in accordance with the desired position and the applying time passed on the above two algorithms. These algorithms are stored in the computer memory and are sequentially applied.