Patents by Inventor Jaehyl Ko

Jaehyl Ko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6590646
    Abstract: Particles in a fluid are counted as the fluid flows through an examination area of a particle analyzer. Parameters based upon the particle count are calculated. It is determined whether the at least one calculated parameter is within an allowable range for the parameter. Based on this determination, an indication is provided of uniformity of the fluid sample in the examination area.
    Type: Grant
    Filed: May 20, 2002
    Date of Patent: July 8, 2003
    Assignee: International Remote Imaging Systems, Inc.
    Inventors: Harvey Kasdan, Jaehyl Ko
  • Publication number: 20030002037
    Abstract: Particles in a fluid are counted as the fluid flows through an examination area of a particle analyzer. Parameters based upon the particle count are calculated. It is determined whether the at least one calculated parameter is within an allowable range for the parameter. Based on this determination, an indication is provided of uniformity of the fluid sample in the examination area.
    Type: Application
    Filed: May 20, 2002
    Publication date: January 2, 2003
    Inventors: Harvey Kasdan, Jaehyl Ko
  • Patent number: 6424415
    Abstract: Particles in a fluid are counted as the fluid flows through an examination area of a particle analyzer. Parameters based upon the particle count are calculated. It is determined whether the at least one calculated parameter is within an allowable range for the parameter. Based on this determination, an indication is provided of uniformity of the fluid sample in the examination area.
    Type: Grant
    Filed: August 2, 2000
    Date of Patent: July 23, 2002
    Assignee: International Remote Imaging Systems, Inc.
    Inventors: Harvey Kasdan, Jaehyl Ko
  • Patent number: 6184978
    Abstract: Particles in a fluid are counted as the fluid flows through an examination area of a particle analyzer. Parameters based upon the particle count are calculated. It is determined whether the at least one calculated parameter is within an allowable range for the parameter. Based on this determination, an indication is provided of uniformity of the fluid sample in the examination area.
    Type: Grant
    Filed: May 7, 1997
    Date of Patent: February 6, 2001
    Assignee: International Remote Imaging Systems, Inc.
    Inventors: Harvey Kasdan, Jaehyl Ko