Abstract: The device for testing or processing small electrical component parts having end face contacts includes an endless conveyor belt having a plurality of holes therein that are sized to fit the electrical components. The belt also includes a second parallel row of positioning holes. A component container maneuvers a single component into a complementary hole in the belt. A measurement and/or processing station includes a swing arm which extends across and above the belt and which moves towards the belt. On the swing arm is a pin-like positioning element that depends vertically from the swing arm and has a conical or spherical point. The diameter of the pin is slightly greater than the diameter of the positioning hole on the belt thereby providing an air cushioning effect when the pin approaches the belt. The swing arm also includes a contact element that contacts the end face contacts of the electrical component located in the component hole.