Abstract: One or more processors determine a predicted sorting bin of a semiconductor device, based on measurement and test data performed on the semiconductor device subsequent to a current metallization layer. A current predicted sorting bin and a target sorting bin are determined by a machine learning model for the semiconductor device; the target bin include higher performance semiconductor devices than the predicted sorting bin. The model determines a performance level improvement attainable by adjustments made to process parameters of subsequent metallization layers of the semiconductor device. Adjustments to process parameters are generated, based on measurement and test data of the current metallization layer of semiconductor device, and the adjustment outputs for the process parameters of the subsequent metallization layers of the semiconductor device are made available to the one or more subsequent metallization layer processes by a feed-forward mechanism.

Abstract: A simple, versatile tool and accessory caddy, temporarily attachable to a wall, rollable across a floor and securely providing easy access to a tile installer of all needed tile installation tools and accessories.

Abstract: Taught here is a small frangible fastener hole restoration device for repairing stripped or damaged holes for reinsertion of a screw or nail while reusing and maintaining the original properties of the fastener and capable of immediate use with minimal preparation.

Abstract: An individual beverage bottle, with added convenience features making the bottle easy to open, and provides features to customize, personalize, and/or share in a very hygienic manner and providing a mechanism to secure a cup to the bottle such that an otherwise ordinary cup adapts and screws onto existing beverage containers that can be used to share the beverage or just be able to drink from a cup rather than directly from the bottle wherein, existing bottles can be utilized with very little, if any, extra footprint and minimal retooling. A proprietary labeling system is adapted to the bottle and cup.

Abstract: A simple, versatile tool and accessory caddy, temporarily attachable to a wall, rollable across a floor and securely providing easy access to a tile installer of all needed tile installation tools and accessories.

Abstract: A simple, hand-held tool for applying drywall compound or other spackle type cement or adhesive substance into a tight space through the entire length and height of the space, such as in a corner next to molding or other obstruction. The device as described may be fashioned in various widths at its applicator end to accommodate various widths of such spaces.

Abstract: An individual beverage bottle, with added convenience features making the bottle easy to open, and provides features to customize, personalize, and/or share in a very hygienic manner and providing a mechanism to secure a cup to the bottle such that an otherwise ordinary cup adapts and screws onto existing beverage containers that can be used to share the beverage or just be able to drink from a cup rather than directly from the bottle wherein, existing bottles can be utilized with very little, if any, extra footprint and minimal retooling. A proprietary labeling system is adapted to the bottle and cup.

Abstract: Methods and systems of detecting chip degradation are described. A processor may execute a test on a device at a first time, where the test includes executable instructions for the device to execute a task under specific conditions relating to a performance attribute. The processor may receive performance data indicating a set of outcomes from the task executed by the device during the test. The processor may determine a first value of a parameter of the performance attribute based on the identified subset. The processor may compare the first value with a second value of the parameter of the performance attribute. The second value is based on an execution of the test on the device at a second time. The processor may determine a degradation status of the device based on the comparison of the first value with the second value.

Abstract: One or more processors determine a predicted sorting bin of a semiconductor device, based on measurement and test data performed on the semiconductor device subsequent to a current metallization layer. A current predicted sorting bin and a target sorting bin are determined by a machine learning model for the semiconductor device; the target bin include higher performance semiconductor devices than the predicted sorting bin. The model determines a performance level improvement attainable by adjustments made to process parameters of subsequent metallization layers of the semiconductor device. Adjustments to process parameters are generated, based on measurement and test data of the current metallization layer of semiconductor device, and the adjustment outputs for the process parameters of the subsequent metallization layers of the semiconductor device are made available to the one or more subsequent metallization layer processes by a feed-forward mechanism.

Abstract: A simple, hand-held tool for applying drywall compound or other spackle type cement or adhesive substance into a tight space through the entire length and height of the space, such as in a corner next to molding or other obstruction. The device as described may be fashioned in various widths at its applicator end to accommodate various widths of such spaces.

Abstract: A simple, hand-held tool for installing dry wall corner bead to obtain a consistent, square, smooth surface and enabling an installer to apply spackle evenly through the entire length and height of the corner without any bumps or protrusions. With an optional angle adjuster, corners of other than ninety degrees can be similarly installed.

Abstract: A simple, versatile tool and accessory caddy, temporarily attachable to a wall, rollable across a floor and securely providing easy access to a tile installer of all needed tile installation tools and accessories.

Abstract: One or more processors determine a predicted sorting bin of a semiconductor device, based on measurement and test data performed on the semiconductor device subsequent to a current metallization layer. A current predicted sorting bin and a target soring bin are determined by a machine learning model for the semiconductor device; the target bin include higher performance semiconductor devices than the predicted sorting bin. The model determines a performance level improvement attainable by adjustments made to process parameters of subsequent metallization layers of the semiconductor device. Adjustments to process parameters are generated, based on measurement and test data of the current metallization layer of semiconductor device, and the adjustment outputs for the process parameters of the subsequent metallization layers of the semiconductor device are made available to the one or more subsequent metallization layer processes by a feed-forward mechanism.

Abstract: A simple, belt clip—mudpan combination to attach a joint compound, spackle, or mastic holding pan to a user's belt for free hand use of such pan, keeping the mudpan secure, stable, and at the ready for the user.

Abstract: A semiconductor device includes a device magnetic tunnel junction (MTJ) and sensor MTJs. A spin polarization of a free layer of the device MTJ is configurable based at least in part on electrical energy supplied to the device MTJ. A spin polarization of a corresponding free layer of each sensor MTJ is configurable based at least in part on a magnetic field created by the spin polarization of the free layer of the device MTJ. A circuit disposed is in electrical communication with the plurality of sensor MTJs and configured to determine the corresponding free layer spin polarizations of each of the sensor MTJs based at least in part on electrical energy supplied to the sensor MTJs by the circuit. The circuit is configured to determine a magnetoresistance of the device MTJ based at least in part on the determined corresponding free layer spin polarizations of the sensor MTJ.

Abstract: An electrical device structure including a magnetic tunnel junction structure having a first tunnel junction dielectric layer positioned between a free magnetization layer and a fixed magnetization layer. A magnetization enhancement stack present on the magnetic tunnel junction structure. The magnetization enhancement stack includes a second tunnel junction layer that is in contact with the free magnetization layer of the magnetic tunnel junction structure, a metal contact layer present on the second tunnel junction layer, and a metal electrode layer present on the metal contact layer. A metallic ring on a sidewall of the magnetic enhancement stack, wherein a base of the metallic ring may be in contact with the free magnetization layer of the magnetic tunnel junction structure.

Abstract: Methods and systems of detecting chip degradation are described. A processor may execute a test on a device at a first time, where the test includes executable instructions for the device to execute a task under specific conditions relating to a performance attribute. The processor may receive performance data indicating a set of outcomes from the task executed by the device during the test. The processor may determine a first value of a parameter of the performance attribute based on the identified subset. The processor may compare the first value with a second value of the parameter of the performance attribute. The second value is based on an execution of the test on the device at a second time. The processor may determine a degradation status of the device based on the comparison of the first value with the second value.

Abstract: An electrical device structure including a magnetic tunnel junction structure having a first tunnel junction dielectric layer positioned between a free magnetization layer and a fixed magnetization layer. A magnetization enhancement stack present on the magnetic tunnel junction structure. The magnetization enhancement stack includes a second tunnel junction layer that is in contact with the free magnetization layer of the magnetic tunnel junction structure, a metal contact layer present on the second tunnel junction layer, and a metal electrode layer present on the metal contact layer. A metallic ring on a sidewall of the magnetic enhancement stack, wherein a base of the metallic ring may be in contact with the free magnetization layer of the magnetic tunnel junction structure.

Abstract: One or more processors determine a predicted sorting bin of a semiconductor device, based on measurement and test data performed on the semiconductor device subsequent to a current metallization layer. A current predicted sorting bin and a target soring bin are determined by a machine learning model for the semiconductor device; the target bin include higher performance semiconductor devices than the predicted sorting bin. The model determines a performance level improvement attainable by adjustments made to process parameters of subsequent metallization layers of the semiconductor device. Adjustments to process parameters are generated, based on measurement and test data of the current metallization layer of semiconductor device, and the adjustment outputs for the process parameters of the subsequent metallization layers of the semiconductor device are made available to the one or more subsequent metallization layer processes by a feed-forward mechanism.

Abstract: Taught here is a small frangible shim with handle for fine tune leveling which is wedge shaped, and pre-scored to enable an unneeded portion to be easily removed during use. Such shims are used in the construction industry utilized for adjusting the spacing of various construction members. The shim may be fashioned from any suitable material to provide stability, ease of use, and ease of manufacture. Further, the shim contains surfaces with properties of both friction to retain the shim in place once deployed and smoothness to allow the shim to slide easily into position. The shim taught here is small compared with existing shims for use in situations where delicate, fine-tune adjustments of leveling is desired.