Patents by Inventor James Borthwick

James Borthwick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220260399
    Abstract: A vaporizer (20) is shaped to define a flow channel (120) that is open to an environment external to the vaporizer at first and second ends of the flow channel. At the first end of the flow channel is a mouthpiece (112) of the vaporizer. A flow sensor (114) includes (a) a nanoscale resistive element (200) disposed at least partially within the flow channel and (b) sensing circuitry (115) configured to measure a change in the nanoscale resistive element due to airflow within the flow channel. Other applications are also described.
    Type: Application
    Filed: July 16, 2020
    Publication date: August 18, 2022
    Applicant: INSTRUMEMS INC.
    Inventors: Gilad ARWATZ, James BORTHWICK, Jeffrey DIAMENT
  • Patent number: 11402348
    Abstract: Numerous embodiments of a bubble detection apparatus and method are disclosed. In one embodiment, a bubble detection module is placed into a liquid to be monitored. The module comprises a physical structure housing a nanowire sensing element. The liquid flows through the physical structure. An electric bias is placed across the nanowire sensing element, and the resistance of the nanowire sensing element changes when a bubble is in contact with the element. A change in voltage or current of the bias signal can be measured to identify the exact instances when a bubble is in contact with the nanowire sensing element.
    Type: Grant
    Filed: June 16, 2020
    Date of Patent: August 2, 2022
    Assignee: INSTRUMEMS, INC.
    Inventors: Gilad Arwatz, Jeffrey Diament, James Borthwick
  • Patent number: 11054444
    Abstract: A voltage limiting circuit for limiting the voltage developed across a current sensing circuit and a method are disclosed. The voltage limiting circuit includes an input terminal configured to receive an input signal from the current sensing circuit, and an output terminal configured to receive an output signal from the current sensing circuit. A voltage sense circuit is connected to the input terminal and output terminal to detect that a predefined threshold voltage is developed between the input terminal and output terminal. An activation circuit receives a signal from the voltage sense circuit to activate the voltage limiting circuit, and a level shifting circuit interfaces the voltage sense circuitry to the activation circuitry and other circuits by level shifting signals to required levels.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: July 6, 2021
    Assignee: QualiTau, Inc.
    Inventor: James Borthwick
  • Publication number: 20200393396
    Abstract: Numerous embodiments of a bubble detection apparatus and method are disclosed. In one embodiment, a bubble detection module is placed into a liquid to be monitored. The module comprises a physical structure housing a nanowire sensing element. The liquid flows through the physical structure. An electric bias is placed across the nanowire sensing element, and the resistance of the nanowire sensing element changes when a bubble is in contact with the element. A change in voltage or current of the bias signal can be measured to identify the exact instances when a bubble is in contact with the nanowire sensing element.
    Type: Application
    Filed: June 16, 2020
    Publication date: December 17, 2020
    Inventors: Gilad ARWATZ, Jeffrey DIAMENT, James BORTHWICK
  • Patent number: 10690715
    Abstract: A signal distribution apparatus for distributing a stress signal to a plurality of devices under test (DUTs) is disclosed. The distribution apparatus includes a single input that receives the stress voltage signal to be distributed, a plurality of outputs that distribute the stress voltage signal to the plurality of DUTs, and a plurality of integrated current limiter and switch circuits. Each integrated current limiter and switch circuit connects a DUT of the plurality of DUTs to the single input through one of the plurality of outputs, and includes at least one combined switching and current limiting element.
    Type: Grant
    Filed: May 2, 2018
    Date of Patent: June 23, 2020
    Assignee: QualiTau, Inc.
    Inventor: James Borthwick
  • Publication number: 20180321300
    Abstract: A signal distribution apparatus for distributing a stress signal to a plurality of devices under test (DUTs) is disclosed. The distribution apparatus includes a single input that receives the stress voltage signal to be distributed, a plurality of outputs that distribute the stress voltage signal to the plurality of DUTs, and a plurality of integrated current limiter and switch circuits. Each integrated current limiter and switch circuit connects a DUT of the plurality of DUTs to the single input through one of the plurality of outputs, and includes at least one combined switching and current limiting element.
    Type: Application
    Filed: May 2, 2018
    Publication date: November 8, 2018
    Inventor: James BORTHWICK
  • Publication number: 20180172734
    Abstract: A voltage limiting circuit for limiting the voltage developed across a current sensing circuit and a method are disclosed. The voltage limiting circuit includes an input terminal configured to receive an input signal from the current sensing circuit, and an output terminal configured to receive an output signal from the current sensing circuit. A voltage sense circuit is connected to the input terminal and output terminal to detect that a predefined threshold voltage is developed between the input terminal and output terminal. An activation circuit receives a signal from the voltage sense circuit to activate the voltage limiting circuit, and a level shifting circuit interfaces the voltage sense circuitry to the activation circuitry and other circuits by level shifting signals to required levels.
    Type: Application
    Filed: December 19, 2017
    Publication date: June 21, 2018
    Inventor: James Borthwick
  • Patent number: 9772351
    Abstract: Pulsed current circuitry for electromigration testing of semiconductor integrated circuits and components. The circuit includes a multiplexer that outputs analog voltage pulses, and is capable of generating both bipolar and unipolar voltage pulses. At least one operational amplifier and resistor receive the voltage pulses from the multiplexer and convert the voltage pulses to current pulses. A charge booster circuit is provided for minimizing overshoots and undershoots during transitions between current levels in the test circuit.
    Type: Grant
    Filed: November 7, 2016
    Date of Patent: September 26, 2017
    Assignee: QualiTau, Inc.
    Inventors: Jens Ullmann, Gedaliahoo Krieger, James Borthwick
  • Publication number: 20170131327
    Abstract: Pulsed current circuitry for electromigration testing of semiconductor integrated circuits and components. The circuit includes a multiplexer that outputs analog voltage pulses, and is capable of generating both bipolar and unipolar voltage pulses. At least one operational amplifier and resistor receive the voltage pulses from the multiplexer and convert the voltage pulses to current pulses. A charge booster circuit is provided for minimizing overshoots and undershoots during transitions between current levels in the test circuit.
    Type: Application
    Filed: November 7, 2016
    Publication date: May 11, 2017
    Inventors: Jens ULLMANN, Gedaliahoo KRIEGER, James BORTHWICK
  • Patent number: 7812589
    Abstract: A current source is provided with two resistor banks, and digital potentiometers are used to control how much each resistor bank affects the resulting output current. Furthermore, when the digital potentiometers are at a particular setting such that a particular resistor bank does not affect the resulting output current (i.e., the resistor bank is “inactive”), the resistance of that resistor bank can be switched without affecting the output current, thus minimizing or eliminating discontinuities in the output current during a current sweep operation. Thus, for example, when a resistor bank meets its threshold and becomes inactive, the resistance of the inactive resistor bank may be switched, and then the digital potentiometer setting may be changed to facilitate smoothly reactivating that resistor bank, with the new resistance.
    Type: Grant
    Filed: August 28, 2008
    Date of Patent: October 12, 2010
    Assignee: QualiTau, Inc.
    Inventors: James Borthwick, Peter P. Cuevas, Tal Raichman
  • Publication number: 20100052633
    Abstract: A current source is provided with two resistor banks, and digital potentiometers are used to control how much each resistor bank affects the resulting output current. Furthermore, when the digital potentiometers are at a particular setting such that a particular resistor bank does not affect the resulting output current (i.e., the resistor bank is “inactive”), the resistance of that resistor bank can be switched without affecting the output current, thus minimizing or eliminating discontinuities in the output current during a current sweep operation. Thus, for example, when a resistor bank meets its threshold and becomes inactive, the resistance of the inactive resistor bank may be switched, and then the digital potentiometer setting may be changed to facilitate smoothly reactivating that resistor bank, with the new resistance.
    Type: Application
    Filed: August 28, 2008
    Publication date: March 4, 2010
    Applicant: QUALITAU, INC.
    Inventors: James BORTHWICK, Peter P. CUEVAS, Tal RAICHMAN
  • Patent number: 7151389
    Abstract: A dual channel source measurement unit for reliability testing of electrical devices provides a voltage stress stimulus to a device under test and monitors degradation to the device under test caused by the stress simulator. The dual channel source measurement unit decouples the stress and monitor portions of the unit so that the requirements of each can be optimized. Deglitching and current clamp switches can be incorporated in the dual channel source measurement unit to prevent glitches in the switching circuitry and to limit or clamp current flow to or from the monitor and stress sources.
    Type: Grant
    Filed: March 2, 2005
    Date of Patent: December 19, 2006
    Assignee: Qualitau, Inc.
    Inventors: Tal Raichman, Peter P. Cuevas, James Borthwick, Michael A. Casolo
  • Patent number: 7098648
    Abstract: In an electrical circuit for testing electrical current using a plurality of precision resistors connected in parallel or in series, a range finder for receiving the current to be measured with the voltage drop across the range finder being indicative of a current sub-range for measurement. In a preferred embodiment, a range finder has a first bipolar transistor and a second bipolar transistor connected in parallel and in opposite polarity with the emitter and base of each transistor connected together whereby each transistor functions as an emitter-base diode.
    Type: Grant
    Filed: June 14, 2004
    Date of Patent: August 29, 2006
    Assignee: Qualitau, Inc.
    Inventors: Gedaliahoo Krieger, Peter P. Cuevas, James Borthwick
  • Publication number: 20050206367
    Abstract: In an electrical for testing electrical current using a plurality of precision resistors connected in parallel or in series, a range finder for receiving the current to be measured with the voltage drop across the range finder being indicative of a current sub-range for measurement. In a preferred embodiment, a range finder comprises a first bipolar transistor and a second bipolar transistor connected in parallel and in opposite polarity with the emitter and base of each transistor connected together whereby each transistor functions as an emitter-base diode.
    Type: Application
    Filed: June 14, 2004
    Publication date: September 22, 2005
    Applicant: QualiTau, Inc.
    Inventors: Gedaliahoo Krieger, Peter Cuevas, James Borthwick
  • Publication number: 20050194963
    Abstract: A dual channel source measurement unit for reliability testing of electrical devices provides a voltage stress stimulus to a device under test and monitors degradation to the device under test caused by the stress simulator. The dual channel source measurement unit decouples the stress and monitor portions of the unit so that the requirements of each can be optimized. Deglitching and current clamp switches can be incorporated in the dual channel source measurement unit to prevent glitches in the switching circuitry and to limit or clamp current flow to or from the monitor and stress sources.
    Type: Application
    Filed: March 2, 2005
    Publication date: September 8, 2005
    Applicant: QualiTau, Inc.
    Inventors: Tal Raichman, Peter Cuevas, James Borthwick, Michael Casolo
  • Patent number: 4033359
    Abstract: Tobacco based smoking mixture containing a minimum amount of tobacco and a maximum amount of harmless inorganic filler, the composition of the filler having been selected so as to impart a commercially acceptable burning rate to the mixture.
    Type: Grant
    Filed: March 5, 1974
    Date of Patent: July 5, 1977
    Assignee: Imperial Chemical Industries Limited
    Inventors: James Borthwick, James Forrester Morman
  • Patent number: 4008723
    Abstract: Tobacco substitute based smoking mixture containing a minimum amount of organic combustible material and a maximum amount of harmless inorganic filler, the composition of the filler having been selected so as to impart a commercially acceptable burning rate to the mixture.
    Type: Grant
    Filed: March 11, 1975
    Date of Patent: February 22, 1977
    Assignee: Imperial Chemical Industries Limited
    Inventors: James Borthwick, James Forrester Morman