Abstract: A method and system for improving the performance of a computer in identifying and mitigating electromigration violations of a semiconductor device. A set of library gates is obtained and parasitic layout extraction is performed for each gate in the set of library gates to generate an extracted netlist. One or more passes of an electromigration analysis of the extracted netlist are performed to characterize each gate over a set of input parameters and to generate a maximum slew rate (MAX_SLEW) table and a maximum capacitance (MAX_CAP) table.

Abstract: A method and system for improving the performance of a computer in identifying and mitigating electromigration violations of a semiconductor device. A set of library gates is obtained and parasitic layout extraction is performed for each gate in the set of library gates to generate an extracted netlist. One or more passes of an electromigration analysis of the extracted netlist are performed to characterize each gate over a set of input parameters and to generate a maximum slew rate (MAX_SLEW) table and a maximum capacitance (MAX_CAP) table.

Abstract: Techniques for determining the quality of a clock signal are provided. In one example, a method can comprise comparing, by a sensory circuitry of a system, a first output of a first sensor and a second output of a second sensor. The first output and the second output can be based on a parameter of a clock signal. Further, in some embodiments, the first sensor and the second sensor can be local clock buffers. The method can also comprise determining, by a controller of the system, a quality of the clock signal based on the comparing of the first output and the second output.

Abstract: Techniques for determining the quality of a clock signal are provided. In one example, a method can comprise comparing, by a sensory circuitry of a system, a first output of a first sensor and a second output of a second sensor. The first output and the second output can be based on a parameter of a clock signal. Further, in some embodiments, the first sensor and the second sensor can be local clock buffers. The method can also comprise determining, by a controller of the system, a quality of the clock signal based on the comparing of the first output and the second output.

Abstract: Techniques for determining the quality of a clock signal are provided. In one example, a method can comprise comparing, by a sensory circuitry of a system, a first output of a first sensor and a second output of a second sensor. The first output and the second output can be based on a parameter of a clock signal. Further, in some embodiments, the first sensor and the second sensor can be local clock buffers. The method can also comprise determining, by a controller of the system, a quality of the clock signal based on the comparing of the first output and the second output.

Abstract: Techniques for determining the quality of a clock signal are provided. In one example, a method can comprise comparing, by a sensory circuitry of a system, a first output of a first sensor and a second output of a second sensor. The first output and the second output can be based on a parameter of a clock signal. Further, in some embodiments, the first sensor and the second sensor can be local clock buffers. The method can also comprise determining, by a controller of the system, a quality of the clock signal based on the comparing of the first output and the second output.

Abstract: A method, system and program are provided for generating level sensitive scan design (LSSD) clock signals from a general scan design (GSD) clock buffer using an intermediate clock signal and one or more first mode control signals to generate a plurality of LSSD clock signals from an output section of the GSD clock buffer that receives the intermediate clock signal and the first mode control signal(s), where the GSD clock buffer is also configured to generate a plurality of GSD clock signals in response to receiving a GSD mode, generating an intermediate clock signal from the input section of the GSD clock buffer in response receiving a GSD mode signal.

Abstract: An apparatus, a method and a computer program product are provided for conserving energy during functional mode of a processor by disabling the scan chain. By inserting logic gating into the scan chain it is possible to disable the scan chain during the processor's functional mode. During functional mode the scan out port of the latch bit in a scan chain toggles, which leads to unnecessary energy consumption. By gating scan control signals and the scan out port of a latch bit, the scan chain segment between latch bits can be disconnected. Therefore, the scan control signals can disable the scan chain during functional mode.

Abstract: A system and method for generating a clock signal is disclosed. In various embodiments of the invention disclosed herein, a global clock signal is generated and provided as an input to local clock circuitry operable to generate a local clock signal therefrom. The local clock circuitry comprises logic components that are susceptible to negative bias thermal instability (NBTI) effects resulting in degradation of the local clock signal. Clock propagation adjustment circuitry is used to modify the duty cycle of the global clock signal to compensate for the degradation resulting from NBTI effects thereby providing an optimized local clock signal.

Abstract: A system and method for maintaining circuit delay characteristics during power management mode. The method for maintaining circuit delay characteristics during power management mode continually toggles the clock distribution circuits at a frequency sufficiently low that it does not significantly impact chip power dissipation. The clock frequency used to toggle the clock distribution circuits is high enough to minimize the asymmetrical stress on the clock buffer transistors so that both P and N device characteristics equally change over time.

Abstract: The present invention provides for determining arrival times in a circuit. An arrival time for a main signal is assigned. An arrival time for a secondary signal is assigned. It is determined whether a test is for an early arrival or for a later arrival. If the test type is for a late arrival, it is determined whether the arrival time for the secondary signal is later than for the first signal. If the test type is for an early arrival, it is determined whether the arrival time for the secondary signal is earlier than for the first signal. If the test type is for the late arrival and the arrival time for the secondary signal is later than for the first signal, assume maximum interference between the signals. If the test type is for the late arrival and the arrival time for the secondary signal is not later than for the first signal, calculate the actual interference between the signals.

Abstract: An apparatus, a method and a computer program product are provided for conserving energy during functional mode of a processor by disabling the scan chain. By inserting logic gating into the scan chain it is possible to disable the scan chain during the processor's functional mode. During functional mode the scan out port of the latch bit in a scan chain toggles, which leads to unnecessary energy consumption. By gating scan control signals and the scan out port of a latch bit, the scan chain segment between latch bits can be disconnected. Therefore, the scan control signals can disable the scan chain during functional mode.

Abstract: A local clock signal generation system is disclosed including multiple local clock buffers each receiving a global clock signal and producing a version of one or more local clock signals derived from the global clock signal. Each local clock buffer includes an input section and an output section. The input sections are substantially identical such that timing differences between the versions of the one or more local clock signals are reduced. An electronic circuit is described including the local clock signal generation system and a latch (e.g., a master latch of a flip-flop). A local clock buffer produces a gating signal and a local clock signal received by the latch. When the gating signal is a certain logic value, the local clock signal is a steady logic value, and the latch produces an input data signal as an output signal. An integrated circuit including the electronic circuit is disclosed.

Abstract: A method and apparatus for reducing power consumption of a clocked circuit containing a plurality of latches is provided. A first latch, within the plurality of latches, is located which has more than a predetermined slack. The possibility of substituting an available second latch, that requires less power to operate, is then determined, subject to the constraint that the slack after substitution should still be positive, although it may be less than the predetermined number mentioned above. Where such a possibility is determined to exist, the first latch is then replaced with the available second latch.

Abstract: A device for fault testing in a microprocessor chip provides a LBIST circuit which has a first reference signature. A loading unit is further provided for receiving and outputting a set of masking data. A file unit connected to the loading unit is yet further provided for receiving the masking data. A masking unit connected to the file unit is yet further provided for generating a second reference signature based on the masking data from the file unit and a scanning data from a scan string in the chip. And, a signature logic connected to the output of the masking unit is yet further provided for compressing the second reference signature and inputting the compressed second reference signature to the LBIST circuit, wherein the compressed second reference signature replaces the first reference signature.

Abstract: A local clock signal generation system is disclosed including multiple local clock buffers each receiving a global clock signal and producing a version of one or more local clock signals derived from the global clock signal. Each local clock buffer includes an input section and an output section. The input sections are substantially identical such that timing differences between the versions of the one or more local clock signals are reduced. An electronic circuit is described including the local clock signal generation system and a latch (e.g., a master latch of a flip-flop). A local clock buffer produces a gating signal and a local clock signal received by the latch. When the gating signal is a certain logic value, the local clock signal is a steady logic value, and the latch produces an input data signal as an output signal. An integrated circuit including the electronic circuit is disclosed.

Abstract: Several local clock buffers are disclosed, each including an input section and an output section. The input sections are substantially identical, and include control logic and gating logic. The control logic produces a gating signal dependent upon multiple control signals and a time-delayed global clock signal. The gating logic produces an intermediate clock signal dependent upon the global clock signal and the gating signal. The output section produces at least one local clock signal dependent upon the intermediate clock signal. In one embodiment, the output section produces a first local clock signal dependent upon the intermediate clock signal and a second local clock signal dependent upon the first local clock signal. In another embodiment, the gating logic produces the intermediate clock signal dependent upon the global clock and gating signals and a feedback signal. The output section produces the feedback signal and one or more local clock signals.

Abstract: Several local clock buffers are disclosed, each including an input section and an output section. The input sections are substantially identical, and include control logic and gating logic. The control logic produces a gating signal dependent upon multiple control signals and a time-delayed global clock signal. The gating logic produces an intermediate clock signal dependent upon the global clock signal and the gating signal. The output section produces at least one local clock signal dependent upon the intermediate clock signal. In one embodiment, the output section produces a first local clock signal dependent upon the intermediate clock signal and a second local clock signal dependent upon the first local clock signal. In another embodiment, the gating logic produces the intermediate clock signal dependent upon the global clock and gating signals and a feedback signal. The output section produces the feedback signal and one or more local clock signals.

Abstract: A latching dynamic logic structure is disclosed including a static logic interface, a dynamic logic gate, and a static latch. The static logic interface receives a data signal, a select signal, and a clock signal, and produces a first intermediate signal such that when the select signal is active, the first intermediate signal is dependent upon the data signal for a period of time following a clock signal transition. The dynamic logic gate discharges a dynamic node following the clock signal transition dependent upon the first intermediate signal. The static latch produces an output signal assuming one of two logic levels following the clock signal transition, and assuming the other logic level in the event the dynamic node is discharged. A scan-testing-enabled version of the latching dynamic logic structure is described, as is an integrated circuit including the latching dynamic logic structure.

Abstract: A device for fault testing in a microprocessor chip provides a LBIST circuit which has a first reference signature. A loading unit is further provided for receiving and outputting a set of masking data. A file unit connected to the loading unit is yet further provided for receiving the masking data. A masking unit connected to the file unit is yet further provided for generating a second reference signature based on the masking data from the file unit and a scanning data from a scan string in the chip. And, a signature logic connected to the output of the masking unit is yet further provided for compressing the second reference signature and inputting the compressed second reference signature to the LBIST circuit, wherein the compressed second reference signature replaces the first reference signature.