Abstract: A monitor system having: a) a monitor for an electronic device with a frame and a substantially flat front wall, at which an image is projected; and b) a cover assembly with a front wall that is configured to block the flat front wall of the monitor with the cover assembly operatively engaged with the monitor. The cover assembly further has a mounting assembly that allows the cover assembly to be changed between: i) a first state wherein the cover assembly is fully separated from the monitor; and ii) a second state wherein the cover assembly is operatively engaged with the monitor. The mounting assembly has a pocket that opens in a first direction. The pocket is movable in the first direction relative to the monitor from a separated, pre-assembly position to cause a first part of the monitor to be seated in the pocket with the cover assembly in the second state.

Abstract: A monitor system having: a) a monitor for an electronic device with a frame and a substantially flat front wall, at which an image is projected; and b) a cover assembly with a front wall that is configured to block the flat front wall of the monitor with the cover assembly operatively engaged with the monitor. The cover assembly further has a mounting assembly that allows the cover assembly to be changed between: i) a first state wherein the cover assembly is fully separated from the monitor; and ii) a second state wherein the cover assembly is operatively engaged with the monitor. The mounting assembly has a pocket that opens in a first direction. The pocket is movable in the first direction relative to the monitor from a separated, pre-assembly position to cause a first part of the monitor to be seated in the pocket with the cover assembly in the second state.

Abstract: To remove and/or prevent contamination of a probe, at least a portion of the probe is positioned in a chamber having an inlet passage and an outlet passage, with a distal end of the probe extending through the outlet passage and terminating on a side thereof opposite the chamber. A gas is caused to flow through the inlet passage into the chamber and out the outlet passage, thereby modifying an environment surrounding the distal end of the probe. The gas may be heated prior to injection.