Abstract: A gable top container for storing an item is provided. The gable top container has a bottom made from at least one bottom forming panel. A side is formed from at least one side forming panel that extends from the bottom. A pair of gusset panels and a pair of gable panels extend from the side. The gable panels are arranged with respect to the gusset panels to form a gable top. Each of the gable panels has a fin that defines perforations that allow for the removal of at least a portion of the fin in order to effect opening of the container from one end of the gable panels to an opposite end of the gable panels. The container may be opened in order for a fork or spoon to be used in order to remove contents therefrom.

Abstract: A gable top container for storing an item is provided. The gable top container has a bottom made from at least one bottom forming panel. A side is formed from at least one side forming panel that extends from the bottom. A pair of gusset panels and a pair of gable panels extend from the side. The gable panels are arranged with respect to the gusset panels to form a gable top. Each of the gable panels has a fin that defines perforations that allow for the removal of at least a portion of the fin in order to effect opening of the container from one end of the gable panels to an opposite end of the gable panels. The container may be opened in order for a fork or spoon to be used in order to remove contents therefrom.

Abstract: The present disclosure relates to an apparatus for use with a probe station in the testing of semiconductor wafers. In one embodiment, an apparatus for testing semiconductor devices includes a first plate and a second plate. The first plate is configured to be mounted to and completely removable from the head stage of a probe station. The second plate is configured to be removably coupled to the first plate and has a major aperture for receiving a probe-card assembly. Docking equipment desirably is mounted to a major surface of the second plate to facilitate docking of a tester to the probe station.

Abstract: The present disclosure relates to an apparatus for use with a probe station in the testing of semiconductor wafers. In one embodiment, an apparatus for testing semiconductor devices includes a first plate and a second plate. The first plate is configured to be mounted to and completely removable from the head stage of a probe station. The second plate is configured to be removably coupled to the first plate and has a major aperture for receiving a probe-card assembly. Docking equipment desirably is mounted to a major surface of the second plate to facilitate docking of a tester to the probe station.