Patents by Inventor James F. Plusquellic

James F. Plusquellic has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7622942
    Abstract: A test structure for statistical characterization of local device mismatches contains densely populated SRAM devices arranged in a row/column addressable array that enables resource sharing of many devices. The test structure includes a built-in sensing mechanism to calibrate or null out sources of error, and current steering to avoid negative effects of current leakage along spurious paths. The gate and drain lines of each column are driven from both the top and bottom to minimizes parasitic effects. The system can handle a large number of devices while still providing high spatial resolution of current measurements.
    Type: Grant
    Filed: June 26, 2008
    Date of Patent: November 24, 2009
    Assignee: International Business Machines Corporation
    Inventors: Kanak B. Agarwal, Ying Liu, Chandler T. McDowell, Sani R. Nassif, James F. Plusquellic, Jayakumaran Sivagnaname
  • Publication number: 20080258752
    Abstract: A test structure for statistical characterization of local device mismatches contains densely populated SRAM devices arranged in a row/column addressable array that enables resource sharing of many devices. The test structure includes a built-in sensing mechanism to calibrate or null out sources of error, and current steering to avoid negative effects of current leakage along spurious paths. The gate and drain lines of each column are driven from both the top and bottom to minimizes parasitic effects. The system can handle a large number of devices while still providing high spatial resolution of current measurements.
    Type: Application
    Filed: June 26, 2008
    Publication date: October 23, 2008
    Inventors: Kanak B. Agarwal, Ying Liu, Chandler T. McDowell, Sani R. Nassif, James F. Plusquellic, Jayakumaran Sivagnaname
  • Patent number: 7408372
    Abstract: A test structure for statistical characterization of local device mismatches contains densely populated SRAM devices arranged in a row/column addressable array that enables resource sharing of many devices. The test structure includes a built-in sensing mechanism to calibrate or null out sources of error, and current steering to avoid negative effects of current leakage along spurious paths. The gate and drain lines of each column are driven from both the top and bottom to minimizes parasitic effects. The system can handle a large number of devices while still providing high spatial resolution of current measurements.
    Type: Grant
    Filed: June 8, 2006
    Date of Patent: August 5, 2008
    Assignee: International Business Machines Corporation
    Inventors: Kanak B. Agarwal, Ying Liu, Chandler T. McDowell, Sani R. Nassif, James F. Plusquellic, Jayakumaran Sivagnaname
  • Publication number: 20070296442
    Abstract: A test structure for statistical characterization of local device mismatches contains densely populated SRAM devices arranged in a row/column addressable array that enables resource sharing of many devices. The test structure includes a built-in sensing mechanism to calibrate or null out sources of error, and current steering to avoid negative effects of current leakage along spurious paths. The gate and drain lines of each column are driven from both the top and bottom to minimizes parasitic effects. The system can handle a large number of devices while still providing high spatial resolution of current measurements.
    Type: Application
    Filed: June 8, 2006
    Publication date: December 27, 2007
    Inventors: Kanak B. Agarwal, Ying Liu, Chandler T. McDowell, Sani R. Nassif, James F. Plusquellic, Jayakumaran Sivagnaname