Abstract: Methods and systems for determining one or more ion components. The method may include disposing a fluid sampling tool into a wellbore wherein the fluid sampling tool includes at least one probe to fluidly connect the fluid sampling tool to a formation in the wellbore, and at least one passageway that passes through the at least one probe and into the fluid sampling tool. The method may further comprise drawing a formation fluid, as a fluid sample, through the at least one probe and through the at least one passageway, and analyzing the fluid sample in the fluid sampling tool for one or more ion components.

Abstract: A method and system for identifying scale. The method may include disposing a fluid sampling tool into a wellbore. The fluid sampling tool may comprise at least one probe configured to fluidly connect the fluid sampling tool to a formation in the wellbore and at least one passageway that passes through the at least one probe and into the fluid sampling tool. The method may further comprise drawing a formation fluid, as a fluid sample, through the at least one probe and through the at least one passageway, perturbing the formation fluid, and analyzing the fluid sample in the fluid sampling tool for one or more indications of scale.

Abstract: A coating system for coating an interior surface of a housing comprising: first and second closures engaging first and second ends, respectively, of the housing to provide an enclosed volume; first and second flow lines coupled to the first and second closures, respectively, the first flow line and/or the second flow line connected to an inert gas source; a reactant gas source(s) comprising a reactant gas and coupled to the first and/or second flow line; and a controller in electronic communication with the reactant gas and inert gas sources, and configured to control flow of inert gas into the enclosed volume, and counter current injection of reactant gas from the reactant gas source(s) into the enclosed volume whereby introduction of pulse(s) of the reactant gas into the enclosed volume are separated by introduction of inert gas into the enclosed volume, and coating layer(s) are deposited on the interior surface.

Abstract: A coating system for coating, with a surface coating process, an interior surface of a housing defining an interior volume, having: a first closure and a second closure to sealingly engage with the housing; one or more first flow lines and second flow lines fluidically coupled to the first and second closure, respectively; a pressurized cell comprising a pressurized gas comprising at least one reactant and at a pressure of greater than a pressure within the housing, wherein the pressurized cell is fluidically coupled to a pressurized cell line comprising one of the first flow lines or second flow lines; and a controller in electronic communication with the pressurized cell and configured to control injection of a pulse of the pressurized gas into a flow of inert gas in the pressurized cell line, whereby the pulse is introduced into the interior volume, coating the interior surface with a coating layer.

Abstract: Methods and systems for implementing and utilizing radiometric characterization in combination with reference material characterization of an optical sensor to more accurately and efficiently measure material properties are disclosed. In some embodiments, a method for for optically measuring material properties includes an optical sensor being radiometrically characterized based on measured optical responses. A model is generated and includes model components of the optical sensor. A parameterized model is generated by fitting n variable parameters of the model components using the optical responses. The optical sensor is utilized to measure an optical response to a reference material and a re-parameterized model is generated by re-fitting m of the n variable parameters of the model components based, at least in part, on the measured optical response to the reference material, wherein m is less than n.

Abstract: Systems and methods for beam profile imaging by emitting a ray into one or more media; receiving a first signal corresponding to the ray at a first point; encoding a first matrix based at least in part on one or more of a location of the first point, a direction of the ray at the first point, and a first perturbation effect; receiving a second signal corresponding to the ray at a second point; encoding a second matrix based at least in part on one or more of a location of the second point, a direction of the ray at the second point, and a second perturbation effect; and calculating the value of the acoustic property of one or more media based at least in part on a comparison between the first matrix and the second matrix.

Abstract: A method may comprise positioning a downhole fluid sampling tool into a wellbore; performing a pressure test operation within the wellbore; performing a pumpout operation within the wellbore; identifying one or more formation parameters at least in part from the at least one pressure test operation or the at least one pumpout operation; building a correlation model that relates a pumpout trend to the one or more formation parameters; determining a time when the downhole fluid sampling tool takes a clean fluid sample utilizing at least the correlation model; and acquiring the clean fluid sample with the downhole fluid sampling tool from the wellbore. Additionally, a system may comprise a downhole fluid sampling tool configured to: perform a pressure test operation within a wellbore; and perform a pumpout operation within the wellbore.

Abstract: A model is used to generate corrections to mitigate ideal condition artifacts in acoustic property values of an annular material in a cased wellbore. A mathematical model that generates acoustic property values at ideal conditions introduces artifacts into the acoustic property values. Acoustic measurements of an annular material are used to generate features that represent wellbore conditions and are not accounted for in the mathematical model that generates acoustic property values. A model will generate corrections for acoustic property values of an annular material with the features to yield a more accurate acoustic property profile for the annular material of a cased hole.

Abstract: A method may comprise positioning a downhole fluid sampling tool into a wellbore; performing a pressure test operation within the wellbore; performing a pumpout operation within the wellbore; identifying one or more formation parameters at least in part from the at least one pressure test operation or the at least one pumpout operation; building a correlation model that relates a pumpout trend to the one or more formation parameters; determining a time when the downhole fluid sampling tool takes a clean fluid sample utilizing at least the correlation model; and acquiring the clean fluid sample with the downhole fluid sampling tool from the wellbore. Additionally, a system may comprise a downhole fluid sampling tool configured to: perform a pressure test operation within a wellbore; and perform a pumpout operation within the wellbore; and.

Abstract: A method may comprise positioning a downhole fluid sampling tool into a wellbore, performing a pressure test operation within the wellbore, performing a pumpout operation within the wellbore, identifying when a clean fluid sample may be taken by the downhole fluid sampling tool from at least the pressure test operation and the pumpout operation, and acquiring the clean fluid sample from the wellbore. A system may comprise a downhole fluid sampling tool and an information handling machine. The downhole fluid sampling tool may further comprise one or more probes attached to the downhole fluid sampling tool, one or more stabilizers attached to the downhole fluid sampling tool, and a sensor placed in the downhole fluid sampling tool configured to measure drilling fluid filtrate.

Abstract: A method may comprise positioning a downhole fluid sampling tool into a wellbore, performing a pressure test operation within the wellbore, performing a pumpout operation within the wellbore, identifying when a clean fluid sample may be taken by the downhole fluid sampling tool from at least the pressure test operation and the pumpout operation, and acquiring the clean fluid sample from the wellbore. A system may comprise a downhole fluid sampling tool and an information handling machine. The downhole fluid sampling tool may further comprise one or more probes attached to the downhole fluid sampling tool, one or more stabilizers attached to the downhole fluid sampling tool, and a sensor placed in the downhole fluid sampling tool configured to measure drilling fluid filtrate.

Abstract: Methods and systems for implementing and utilizing radiometric characterization in combination with reference material characterization of an optical sensor to more accurately and efficiently measure material properties are disclosed. In some embodiments, a method for for optically measuring material properties includes an optical sensor being radiometrically characterized based on measured optical responses. A model is generated and includes model components of the optical sensor. A parameterized model is generated by fitting n variable parameters of the model components using the optical responses. The optical sensor is utilized to measure an optical response to a reference material and a re-parameterized model is generated by re-fitting m of the n variable parameters of the model components based, at least in part, on the measured optical response to the reference material, wherein m is less than n.

Abstract: A method may comprise positioning a downhole fluid sampling tool into a wellbore, performing a pressure test operation within the wellbore, performing a pumpout operation within the wellbore, identifying when a clean fluid sample may be taken by the downhole fluid sampling tool from at least the pressure test operation and the pumpout operation, and acquiring the clean fluid sample from the wellbore. A system may comprise a downhole fluid sampling tool and an information handling machine. The downhole fluid sampling tool may further comprise one or more probes attached to the downhole fluid sampling tool, one or more stabilizers attached to the downhole fluid sampling tool, and a sensor placed in the downhole fluid sampling tool configured to measure drilling fluid filtrate.

Abstract: Methods for determining parameters of a semiconductor material, for example, non-classical substrates such as silicon-on-insulator (SOI) substrates, strained silicon-on-insulator (sSOI) substrates, silicon-germanium-on-insulator (GeOI) substrates, and strained silicon-germanium-on-insulator (sGeOI) substrates are described. The method provides steps for transforming data corresponding to the semiconductor material from real space to reciprocal space. The critical points are isolated in the reciprocal state and corresponding critical energies of the critical points are determined. The difference between the critical energies may be used to determine a thickness of a layer of the semiconductor material, in particular, a quantum confined layer.

Abstract: Methods and systems for determining a charge trap density between a semiconductor material and a dielectric material are disclosed. In one respect, spectroscopic data of the semiconductor material may be determined and used to determine a change in dielectric function. A line shape fit of the change in the dielectric function may be applied using derivative function form. The amplitude of the line shape fit may be determined and used to determine an electric field of a space charge region of the semiconductor material. By applying Poisson's equations, the scalar potential due to the electric field in the space charge region may be determined. Subsequently, using the scalar potential the charge trap density may be determined.

Abstract: Methods for determining parameters of a semiconductor material, in particular non-classical substrates such as silicon-on-insulator (SOI) substrates, strained silicon-on-insulator (sSOI) substrates, silicon-germanium-on-insulator (GOI) substrates, and strained silicon-germanium-on-insulator (sGeOI) substrates. The method provides steps for transforming data corresponding to the semiconductor material from real space to reciprocal space. The critical points are isolated in the reciprocal state and corresponding critical energies of the critical points are determined. The difference between the critical energies may be used to determine a thickness of a layer of the semiconductor material, in particular, a quantum confined layer.

Abstract: Methods for characterizing a semiconductor material using optical metrology are disclosed. In one respect, a electromagnetic radiation source may be directed in a direction substantially parallel to patterns on a semiconductor material. A polarized spectroscopic reflectivity may be obtained, and a critical point data may be determined. Using the critical point data, physical dimensions of the patterns may be determined. In other respects, using optical metrology techniques, a critical point data relating to electron mobility may be determined.

Abstract: Methods and systems for determining a charge trap density between a semiconductor material and a dielectric material are disclosed. In one respect, spectroscopic data of the semiconductor material may be determined and used to determine a change in dielectric function. A line shape fit of the change in the dielectric function may be applied using derivative function form. The amplitude of the line shape fit may be determined and used to determine an electric field of a space charge region of the semiconductor material. By applying Poisson's equations, the scalar potential due to the electric field in the space charge region may be determined. Subsequently, using the scalar potential the charge trap density may be determined.